Theodor Hillebrand

17 papers C 4Misc 1Journal 2Unranked 10
YearRankTypeTitle / Venue / Authors
2018 C conf
A New Approach to Threshold Voltage Measurements of Transistors.
IOLTS
Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen
2018 J jnl
Design for reliability of generic sensor interface circuits.
Microelectron. Reliab.
Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
2018 — conf
LUT-Based Stochastic Modeling for Non-Normal Performance Distributions.
SMACD
Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen
2018 Misc conf
On-line monitoring and error correction in sensor interface circuits using digital calibration techniques.
VTS
Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen
2018 C conf
Reliability-Aware Multi-Vth Domain Digital Design Assessment.
DDECS
Theodor Hillebrand, Ludwig Karsthof, Steffen Paul, Dagmar Peters-Drolshagen
2018 — conf
Topology-Driven Reliability Assessment of Integrated Circuits.
MIXDES
Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen
2018 — conf
Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability.
SMACD
Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen
2017 — conf
Behavioral modeling of a sensor interface circuit including various non-idealities.
SMACD
Sascha Heinssen, Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen
2017 J jnl
Design and Verification of Analog CMOS Circuits Using the
J. Low Power Electron.
Timur Schafer, Theodor Hillebrand, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul
2017 — conf
Variation- and degradation-aware stochastic behavioral modeling of analog circuit components.
SMACD
Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen
2016 — conf
Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process.
MIXDES
Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen
2016 — conf
Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects.
PATMOS
Theodor Hillebrand, Timur Schafer, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul
2016 C conf
Online monitoring of NBTI and HCD in beta-multiplier circuits.
IOLTS
Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
2016 — conf
Parameter identification for behavioral modeling of analog components including degradation.
MIXDES
Maike Taddiken, Theodor Hillebrand, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
2016 — conf
Reliability-aware design method for CMOS circuits.
ERMAVSS@DATE
Theodor Hillebrand, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen
2016 — conf
Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits.
MIXDES
Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
2016 C conf
Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process.
IOLTS
Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen