Theo Smedes

15 papers Journal 12Unranked 3
YearRankTypeTitle / Venue / Authors
2025 — conf
Analysis of VF-TLP ESD Measurements Using Machine Learning.
ISQED
Seyed Hossein Hosseini, Mehrdad Nourani, Theo Smedes, Charvaka Duvvury
2018 — conf
An integral injector-victim current transfer model for latchup design rule optimization.
IRPS
Guido Quax, Theo Smedes
2013 J jnl
Pitfalls for CDM calibration procedures.
Microelectron. Reliab.
Theo Smedes, M. Polewski, A. van IJzerloo, Jean Luc Lefebvre, M. Dekker
2011 J jnl
On-chip system level protection of FM antenna pin with improved linearity.
Microelectron. Reliab.
Guido Notermans, Dejan M. Maksimovic, Gerd Vermont, Michiel van Maasakkers, Fredrik Pusa, Theo Smedes
2010 J jnl
ESD protection for thin gate oxides in 65 nm.
Microelectron. Reliab.
Guido Notermans, Theo Smedes, Zeljko Mrcarica, Peter C. de Jong, Ralph Stephan, Hans van Zwol, Dejan M. Maksimovic
2009 J jnl
An ESD test reduction method for complex devices.
Microelectron. Reliab.
Dejan M. Maksimovic, Fabrice Blanc, Guido Notermans, Theo Smedes, Thomas Keller
2009 J jnl
ESD robust high-voltage active clamps.
Microelectron. Reliab.
Guido Notermans, Olivier Quittard, Anco Heringa, Zeljko Mrcarica, Fabrice Blanc, Hans van Zwol, Theo Smedes, Thomas Keller, Peter C. de Jong
2009 J jnl
ESD testing of devices, ICs and systems.
Microelectron. Reliab.
Theo Smedes
2007 J jnl
Selecting an appropriate ESD protection for discrete RF power LDMOSTs.
Microelectron. Reliab.
Theo Smedes, J. de Boet, T. Rödle
2005 J jnl
A 3-D Circuit Model to evaluate CDM performance of ICs.
Microelectron. Reliab.
M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
2004 J jnl
A case study of ESD failures at random levels: analysis, explanation and solution.
Microelectron. Reliab.
T. Wu, Theo Smedes, J. P. Lokker, S.-N. Mei, J. W. Slotboom
2004 J jnl
Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current.
Microelectron. Reliab.
F. Barbier, Fabrice Blanc, A. Le Grontec, R. Colclaser, Theo Smedes, M. Johnson, Serge Bardy, Philippe Descamps
2003 — conf
A simple design methodology for increased ESD robustness of CMOS core cells.
ESSCIRC
Albert Jan Huitsing, Theo Smedes, H.-U. Schröder
2003 J jnl
Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy.
Microelectron. Reliab.
M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper
2002 J jnl
The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress.
Microelectron. Reliab.
M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper