Ted R. Lundquist

18 papers A 4Journal 12Unranked 2
YearRankTypeTitle / Venue / Authors
2016 J jnl
Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light.
Microelectron. Reliab.
Marius Rutkauskas, Carl Farrell, Christophe Dorrer, Kara L. Marshall, Tom Crawford, Ted R. Lundquist, P. Vedagarbha, K. Erington, D. Bodoh, Derryck Telford Reid
2015 — conf
Time-integrated photon emission as a function of temperature in 32 nm CMOS.
IRPS
Andrea Bahgat Shehata, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted R. Lundquist, Euan Ramsay
2014 J jnl
Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm.
Microelectron. Reliab.
Philipp Scholz, Norbert Herfurth, Michael Sadowski, Ted R. Lundquist, Uwe Kerst, Christian Boit
2011 J jnl
Foundry workflow for dynamic-EFA-based yield ramp.
Microelectron. Reliab.
Cathy Kardach, I. Kapilevich, Jeffrey A. Block, Ted R. Lundquist, Steven Kasapi, J. Liao, Yin S. Ng, Bruce Cory
2010 J jnl
Dynamic lock-in thermography for operation mode-dependent thermally active fault localization.
Microelectron. Reliab.
Rudolf Schlangen, Hervé Deslandes, Ted R. Lundquist, C. Schmidt, Frank Altmann, K. Yu, A. Andreasyan, S. Li
2010 J jnl
Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments.
Microelectron. Reliab.
Philipp Scholz, Christian Gallrapp, Uwe Kerst, Ted R. Lundquist, Christian Boit
2009 J jnl
Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing.
Microelectron. Reliab.
Joy Y. Liao, Tung Ton, Nathan Slattengren, Steven Kasapi, William K. Lo, Howard L. Marks, Yin S. Ng, Ted R. Lundquist
2009 J jnl
Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing.
Microelectron. Reliab.
Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Ted R. Lundquist, Peter Egger, Christian Boit
2008 J jnl
Physical Techniques for Chip-Backside IC Debug in Nanotechnologies.
IEEE Des. Test Comput.
Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted R. Lundquist
2007 A conf
Backside E-Beam Probing on Nano scale devices.
ITC
Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krüger
2007 J jnl
Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy.
Microelectron. Reliab.
Rudolf Schlangen, Uwe Kerst, Christian Boit, Tahir Malik, Rajesh Jain, Ted R. Lundquist
2005 A conf
Impact of back side circuit edit on active device performance in bulk silicon ICs.
ITC
Uwe Kerst, Rudolf Schlangen, A. Kabakow, Erwan Le Roy, Ted R. Lundquist, Siegfried Pauthner
2003 A conf
Fault Localization using Time Resolved Photon Emission and STIL Waveforms.
ITC
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah
2003 J jnl
Limitations to photon-emission microscopy when applied to "hot" devices.
Microelectron. Reliab.
Hervé Deslandes, Ted R. Lundquist
2002 J jnl
Imaging and Material Analysis from Sputter-Induced Light Emission Using Coaxial Ion-Photon Column.
Microelectron. Reliab.
Chun-Cheng Tsao, Bill Thompson, Ted R. Lundquist
2002 — conf
Subresolution placement using IR image to CAD database alignment: an algorithm for silicon-side probing.
Image Processing: Algorithms and Systems
Madhumita Sengupta, Lokesh Johri, Chun-Cheng Tsao, Mark Thompson, Ted R. Lundquist
2001 A conf
Practical, non-invasive optical probing for flip-chip devices.
ITC
G. Dajee, Norman Goldblatt, Ted R. Lundquist, Steven Kasapi, Keneth R. Wilsher
2001 J jnl
Ultra-Thinning of C4 Integrated Circuits for Backside Analysis during First Silicon Debug.
Microelectron. Reliab.
Ted R. Lundquist, E. Delenia, J. Harroun, E. LeRoy, Chun-Cheng Tsao