Tao Yan

11 papers Journal 10Unranked 1
YearRankTypeTitle / Venue / Authors
2023 J jnl
Deep multisource parallel bilinear-fusion network for remaining useful life prediction of machinery.
Reliab. Eng. Syst. Saf.
Yuan Wang, Yaguo Lei, Naipeng Li, Tao Yan, Xiaosheng Si
2023 J jnl
Machinery Health Prognostics With Multimodel Fusion Degradation Modeling.
IEEE Trans. Ind. Electron.
Naipeng Li, Yaguo Lei, Xiaofei Liu, Tao Yan, Pengcheng Xu
2021 J jnl
Degradation modeling and remaining useful life prediction for dependent competing failure processes.
Reliab. Eng. Syst. Saf.
Tao Yan, Yaguo Lei, Naipeng Li, Biao Wang, Wenting Wang
2021 J jnl
Remaining useful life prediction based on a multi-sensor data fusion model.
Reliab. Eng. Syst. Saf.
Naipeng Li, Nagi Gebraeel, Yaguo Lei, Xiaolei Fang, Xiao Cai, Tao Yan
2020 J jnl
Joint maintenance and spare parts inventory optimization for multi-unit systems considering imperfect maintenance actions.
Reliab. Eng. Syst. Saf.
Tao Yan, Yaguo Lei, Biao Wang, Tianyu Han, Xiaosheng Si, Naipeng Li
2020 J jnl
Recurrent convolutional neural network: A new framework for remaining useful life prediction of machinery.
Neurocomputing
Biao Wang, Yaguo Lei, Tao Yan, Naipeng Li, Liang Guo
2019 J jnl
A Wiener-Process-Model-Based Method for Remaining Useful Life Prediction Considering Unit-to-Unit Variability.
IEEE Trans. Ind. Electron.
Naipeng Li, Yaguo Lei, Tao Yan, Ningbo Li, Tianyu Han
2019 J jnl
Deep Convolutional Transfer Learning Network: A New Method for Intelligent Fault Diagnosis of Machines With Unlabeled Data.
IEEE Trans. Ind. Electron.
Liang Guo, Yaguo Lei, Saibo Xing, Tao Yan, Naipeng Li
2018 J jnl
Machinery health indicator construction based on convolutional neural networks considering trend burr.
Neurocomputing
Liang Guo, Yaguo Lei, Naipeng Li, Tao Yan, Ningbo Li
2018 — conf
Remaining Useful Life Prediction of Machinery Subjected to Two-Phase Degradation Process.
ICPHM
Tao Yan, Yaguo Lei, Naipeng Li
2017 J jnl
Remaining Useful Life Prediction Based on a General Expression of Stochastic Process Models.
IEEE Trans. Ind. Electron.
Naipeng Li, Yaguo Lei, Liang Guo, Tao Yan, Jing Lin