Tao Yan - RankMe

11 papers Journal 10Unranked 1

Year	Rank	Type	Title / Venue / Authors
2023	J	`jnl`	Deep multisource parallel bilinear-fusion network for remaining useful life prediction of machinery. Reliab. Eng. Syst. Saf. Yuan Wang, Yaguo Lei, Naipeng Li, Tao Yan, Xiaosheng Si
2023	J	`jnl`	Machinery Health Prognostics With Multimodel Fusion Degradation Modeling. IEEE Trans. Ind. Electron. Naipeng Li, Yaguo Lei, Xiaofei Liu, Tao Yan, Pengcheng Xu
2021	J	`jnl`	Degradation modeling and remaining useful life prediction for dependent competing failure processes. Reliab. Eng. Syst. Saf. Tao Yan, Yaguo Lei, Naipeng Li, Biao Wang, Wenting Wang
2021	J	`jnl`	Remaining useful life prediction based on a multi-sensor data fusion model. Reliab. Eng. Syst. Saf. Naipeng Li, Nagi Gebraeel, Yaguo Lei, Xiaolei Fang, Xiao Cai, Tao Yan
2020	J	`jnl`	Joint maintenance and spare parts inventory optimization for multi-unit systems considering imperfect maintenance actions. Reliab. Eng. Syst. Saf. Tao Yan, Yaguo Lei, Biao Wang, Tianyu Han, Xiaosheng Si, Naipeng Li
2020	J	`jnl`	Recurrent convolutional neural network: A new framework for remaining useful life prediction of machinery. Neurocomputing Biao Wang, Yaguo Lei, Tao Yan, Naipeng Li, Liang Guo
2019	J	`jnl`	A Wiener-Process-Model-Based Method for Remaining Useful Life Prediction Considering Unit-to-Unit Variability. IEEE Trans. Ind. Electron. Naipeng Li, Yaguo Lei, Tao Yan, Ningbo Li, Tianyu Han
2019	J	`jnl`	Deep Convolutional Transfer Learning Network: A New Method for Intelligent Fault Diagnosis of Machines With Unlabeled Data. IEEE Trans. Ind. Electron. Liang Guo, Yaguo Lei, Saibo Xing, Tao Yan, Naipeng Li
2018	J	`jnl`	Machinery health indicator construction based on convolutional neural networks considering trend burr. Neurocomputing Liang Guo, Yaguo Lei, Naipeng Li, Tao Yan, Ningbo Li
2018	—	`conf`	Remaining Useful Life Prediction of Machinery Subjected to Two-Phase Degradation Process. ICPHM Tao Yan, Yaguo Lei, Naipeng Li
2017	J	`jnl`	Remaining Useful Life Prediction Based on a General Expression of Stochastic Process Models. IEEE Trans. Ind. Electron. Naipeng Li, Yaguo Lei, Liang Guo, Tao Yan, Jing Lin

Nicolò Altamura, Enrico Bragastini, Marco Campion, Mila Dalla Preda

Chang Liu, Noah Fleischmann, Nicolò Altamura, Edward Raff, James Holt, Kristopher Micinski