Tao Chen

15 papers A 2C 2Misc 2Journal 6Unranked 2
YearRankTypeTitle / Venue / Authors
2020 J jnl
A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier.
IEEE Trans. Circuits Syst.
Chulhyun Park, Tao Chen, Kyoohyun Noh, Dadian Zhou, Suraj Prakash, Mohammadhossein Naderi Alizadeh, Aydin I. Karsilayan, Degang Chen, Randall L. Geiger, José Silva-Martínez
2020 J jnl
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test.
IEEE Trans. Instrum. Meas.
Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen
2020 J jnl
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method.
IEEE Trans. Instrum. Meas.
Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen
2019 A conf
Built-in self-test and self-calibration for analog and mixed signal circuits.
ITC
Tao Chen, Degang Chen
2019 — —
Built-in self-test and self-calibration for analog and mixed signal circuits.
Tao Chen
2018 J jnl
High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing.
IEEE Trans. Instrum. Meas.
Yuming Zhuang, Benjamin Magstadt, Tao Chen, Degang Chen
2018 — conf
Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME).
I2MTC
Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen
2018 J jnl
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test.
IEEE Trans. Circuits Syst. I Regul. Pap.
Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen
2017 J jnl
A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.
J. Electron. Test.
Yan Duan, Tao Chen, Degang Chen
2017 A conf
An on-chip ADC BIST solution and the BIST enabled calibration scheme.
ITC
Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen
2016 Misc conf
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise.
VTS
Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
2016 C conf
Low-cost dithering generator for accurate ADC linearity test.
ISCAS
Yan Duan, Tao Chen, Degang Chen
2015 — conf
Effect of flicker noise on SEIR for accurate ADC linearity testing.
MWSCAS
Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
2015 C conf
High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST.
ISCAS
Yan Duan, Tao Chen, Zhiqiang Liu, Xu Zhang, Degang Chen
2015 Misc conf
Ultrafast stimulus error removal algorithm for ADC linearity test.
VTS
Tao Chen, Degang Chen