Tanya Nigam - RankMe

16 papers Journal 2Unranked 14

Year	Rank	Type	Title / Venue / Authors
2022	—	`conf`	Optimized LDMOS Offering for Power Management and RF Applications. IRPS Salvatore Cimino, J. Singh, Jeffrey B. Johnson, W. Zheng, Y. Chen, W. Liu, P. Srinivasan, O. Gonzales, M. Hauser, Matthew Koskinen, K. Nagahiro, Y. Liu, B. Min, Tanya Nigam, N. Squib
2022	—	`conf`	Robust Off-State TDDB Reliability of n-LDMOS. IRPS Wen Liu, Dimitris P. Ioannou, Johnatan Kantarovsky, Byoung Min, Tanya Nigam
2021	—	`conf`	Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. IRPS Maria Toledano-Luque, Peter C. Paliwoda, Mohamed Nour, Thomas Kauerauf, Byoung Min, Germain Bossu, Mahesh Siddabathula, Tanya Nigam
2020	—	`conf`	A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. IRPS Wafa Arfaoui, Germain Bossu, A. Muehlhoff, D. Lipp, R. Manuwald, T. Chen, Tanya Nigam, Mahesh Siddabathula
2020	—	`conf`	Self-heating characterization and its applications in technology development. NATW Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch, B. Min
2019	—	`conf`	Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. IRPS M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, Jeffrey B. Johnson, P. Srinivasan, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam
2018	J	`jnl`	Bias temperature instability in scaled CMOS technologies: A circuit perspective. Microelectron. Reliab. Andreas Kerber, Tanya Nigam
2018	—	`conf`	Understanding gate metal work function (mWF) impact on device reliability - A holistic approach. IRPS P. Srinivasan, Rakesh Ranjan, S. Cimino, A. Zainuddin, B. Kannan, L. Pantisano, I. Mahmud, G. Dilliway, Tanya Nigam
2017	—	`conf`	Material and device innovation impact on reliability for scaled CMOS technologies. ESSDERC Tanya Nigam, Andreas Kerber, Tian Shen, Rakesh Ranjan, Linjun Cao
2015	—	`conf`	Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing. IRPS Yoann Mamy Randriamihaja, William McMahon, S. Balasubramanian, Tanya Nigam, Biju Parameshwaran, Randy W. Mann, Torsten Klick, T. Schaefer, A. Kumar, Y. Song, Vivek Joshi, Rakesh Ranjan, F. Chen
2015	—	`conf`	Enabling Scaling of Advanced CMOS Technologies: A Reliability Perspective. ISVLSI Tanya Nigam, Andreas Kerber
2014	—	`conf`	HTOL SRAM Vmin shift considerations in scaled HKMG technologies. CICC S. Balasubramanian, Vivek Joshi, Torsten Klick, Randy W. Mann, Joseph Versaggi, Akhilesh Gautam, C. Weintraub, G. Kurz, G. Krause, Andreas Kerber, Biju Parameshwaran, Tanya Nigam
2014	—	`conf`	Reliability modeling of HK MG technologies. CICC Tanya Nigam, Andreas Kerber
2013	—	`conf`	CMOS reliability: From discrete device degradation to circuit aging. VLSI-DAT Tanya Nigam
2009	—	`conf`	Impact of Transistor Level degradation on product reliability. CICC Tanya Nigam
1999	J	`jnl`	Cost-effective cleaning and high-quality thin gate oxides. IBM J. Res. Dev. Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke