Takumi Uezono

30 papers A 4C 2Misc 1Journal 10Unranked 13
YearRankTypeTitle / Venue / Authors
2025 J jnl
A Hardware-Aware Failure-Detection Method for GPU Control-Logic.
IEEE Access
Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Kojiro Ito, Masanori Hashimoto
2025 — conf
Hardware Error Detection with In-Situ Monitoring of Control Flow-Related Specifications.
ASP-DAC
Tomonari Tanaka, Takumi Uezono, Kohei Suenaga, Masanori Hashimoto
2025 J jnl
In-Situ Hardware Error Detection Using Specification-Derived Petri Net Models and Behavior-Derived State Sequences.
CoRR
Tomonari Tanaka, Takumi Uezono, Kohei Suenaga, Masanori Hashimoto
2023 — conf
An Intelligent Diagnostic Technique for Reliable Operation of Edge AI.
ITSC
Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Subrata Kumar Kundu
2023 J jnl
Vulnerability Estimation of DNN Model Parameters with Few Fault Injections.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Yangchao Zhang, Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Masanori Hashimoto
2022 A conf
Achieving Automotive Safety Requirements through Functional In-Field Self-Test for Deep Learning Accelerators.
ITC
Takumi Uezono, Yi He, Yanjing Li
2022 A conf
Estimating Vulnerability of All Model Parameters in DNN with a Small Number of Fault Injections.
DATE
Yangchao Zhang, Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Masanori Hashimoto
2021 A conf
Efficient Functional In-Field Self-Test for Deep Learning Accelerators.
ITC
Yi He, Takumi Uezono, Yanjing Li
2020 A conf
Concurrent Detection of Failures in GPU Control Logic for Reliable Parallel Computing.
ITC
Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Kojiro Ito, Masanori Hashimoto
2016 — conf
Evaluation Technique for Soft-Error Rate in Terrestrial Environment Utilizing Low-Energy Neutron Irradiation.
ATS
Takumi Uezono, Tadanobu Toba, Ken-ichi Shimbo, Fumihiko Nagasaki, Kenji Kawamura
2016 J jnl
Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing.
J. Electron. Test.
Michihiro Shintani, Takumi Uezono, Kazumi Hatayama, Kazuya Masu, Takashi Sato
2014 J jnl
A Variability-Aware Adaptive Test Flow for Test Quality Improvement.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, Takashi Sato
2010 J jnl
A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation.
IEICE Trans. Electron.
Takumi Uezono, Kazuya Masu, Takashi Sato
2010 C conf
Decomposition of drain-current variation into gain-factor and threshold voltage variations.
ISCAS
Takashi Sato, Takumi Uezono, Noriaki Nakayama, Kazuya Masu
2010 Misc conf
Path clustering for adaptive test.
VTS
Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato
2010 C conf
Scan based process parameter estimation through path-delay inequalities.
ISCAS
Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato
2009 — conf
An Adaptive Test for Parametric Faults Based on Statistical Timing Information.
Asian Test Symposium
Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu
2009 J jnl
One-Shot Voltage-Measurement Circuit Utilizing Process Variation.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Takumi Uezono, Takashi Sato, Kazuya Masu
2008 J jnl
Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
2007 — conf
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.
ISQED
Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu
2007 — conf
Adaptable wire-length distribution with tunable occupation probability.
SLIP
Shuhei Amakawa, Takumi Uezono, Takashi Sato, Kenichi Okada, Kazuya Masu
2007 — conf
Improvement of power distribution network using correlation-based regression analysis.
ACM Great Lakes Symposium on VLSI
Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
2007 — conf
Weakness Identification for Effective Repair of Power Distribution Network.
PATMOS
Takashi Sato, Shiho Hagiwara, Takumi Uezono, Kazuya Masu
2006 — conf
Estimation of Power Reduction by On-Chip Transmission Line for 45nm Technology.
PATMOS
Kenichi Okada, Takumi Uezono, Kazuya Masu
2006 J jnl
Statistical Modeling of a Via Distribution for Yield Estimation.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Takumi Uezono, Kenichi Okada, Kazuya Masu
2006 — conf
Via Distribution Model for Yield Estimation.
ISQED
Takumi Uezono, Kenichi Okada, Kazuya Masu
2005 — conf
Evaluation of on-chip transmission line interconnect using wire length distribution.
ASP-DAC
Junpei Inoue, Hiroyuki Ito, Shinichiro Gomi, Takanori Kyogoku, Takumi Uezono, Kenichi Okada, Kazuya Masu
2005 — conf
Prediction of delay time for future LSI using on-chip transmission line interconnects.
SLIP
Takumi Uezono, Junpei Inoue, Takanori Kyogoku, Kenichi Okada, Kazuya Masu
2005 — conf
Wire Length Distribution Model Considering Core Utilization for System on Chip.
ISVLSI
Takanori Kyogoku, Junpei Inoue, Hidenari Nakashima, Takumi Uezono, Kenichi Okada, Kazuya Masu
2005 J jnl
Wire Length Distribution Model for System LSI.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Takanori Kyogoku, Junpei Inoue, Hidenari Nakashima, Takumi Uezono, Kenichi Okada, Kazuya Masu