Takuji Okamoto

19 papers A 1Journal 11Unranked 7
YearRankTypeTitle / Venue / Authors
2007 J jnl
Detection of CMOS Open Node Defects by Frequency Analysis.
IEICE Trans. Inf. Syst.
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
2005 J jnl
Superconductive logic circuits constructed by the use of two thresholds of SQUID.
Syst. Comput. Jpn.
Masahiro Kawai, Yoichiro Sato, Hiroto Kagotani, Takuji Okamoto
2004 J jnl
CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component.
IEICE Trans. Inf. Syst.
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
2004 J jnl
Model analysis of coronary hemodynamics incorporating autoregulation.
Syst. Comput. Jpn.
Mitsuyasu Kagiyama, Hiroyuki Michinishi, Hiroto Kagotani, Takuji Okamoto, Yasuo Ogasawara, Fumihiko Kajiya
2003 — conf
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test.
Asian Test Symposium
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
2002 — conf
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply.
Asian Test Symposium
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
2001 — conf
A dynamic traffic sharing with minimal administration on multihomed networks.
ICC
Nariyoshi Yamai, Kiyohiko Okayama, Hiroshi Shimamoto, Takuji Okamoto
2001 — conf
Synthesis of four-phase asynchronous control circuits from pipeline dependency graphs.
ASP-DAC
Hiroto Kagotani, Takuji Okamoto, Takashi Nanya
2000 J jnl
A method of affine transformation for rectangular video image.
Syst. Comput. Jpn.
Hiroto Kagotani, Yoichiro Sato, Yoshimichi Takahara, Takuji Okamoto
2000 J jnl
Systematic reducing of metastable operations in CMOS D flip-flops.
Syst. Comput. Jpn.
Yoichiro Sato, Yoshinobu Yamasoto, Masanori Saito, Hiroto Kagotani, Takuji Okamoto, Masahiro Kawai
1997 — conf
Testing for the programming circuit of LUT-based FPGAs.
Asian Test Symposium
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara
1996 — conf
A Test Methodology for Interconnect Structures of LUT-based FPGAs.
Asian Test Symposium
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara
1996 J jnl
A method of shortening metastable operation duration time by the use of feedback.
Syst. Comput. Jpn.
Yoichiro Sato, Takuji Okamoto, Yuji Sugiyama, Masahiro Kawai, Toshifumi Kobayashi
1996 J jnl
Realization of multiwindow system with high-speed operations of nonrectangular windows.
Syst. Comput. Jpn.
Toshiyuki Maeda, Yoichiro Sato, Tokumi Yokohira, Takuji Okamoto
1996 J jnl
Timing verification of asynchronous sequential circuits with specifications - A method of reducing state transitions to be verified in detail.
Syst. Comput. Jpn.
Atsushi Ohnishi, Yuji Sugiyama, Takuji Okamoto
1995 J jnl
The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs.
IEICE Trans. Inf. Syst.
Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto
1995 — conf
Universal test complexity of field-programmable gate arrays.
Asian Test Symposium
Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto
1991 J jnl
Decentralized priority encoder and its applications.
Syst. Comput. Jpn.
Toshiyuki Maeda, Yoichiro Sato, Tokumi Yokohira, Takuji Okamoto
1983 A conf
Design of High-Level Test Language for Digital LSI.
ITC
Takuji Okamoto, Hiroyuki Shibata, Kozo Kinoshita