Takashi Aikyo

32 papers A* 1A 6B 1Misc 3Journal 9Unranked 12
YearRankTypeTitle / Venue / Authors
2014 J jnl
A Variability-Aware Adaptive Test Flow for Test Quality Improvement.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, Takashi Sato
2012 J jnl
Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool.
IEICE Trans. Inf. Syst.
Yoshinobu Higami, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo
2011 J jnl
Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing.
IEICE Trans. Inf. Syst.
Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara
2010 J jnl
A Study of Capture-Safe Test Generation Flow for At-Speed Testing.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja
2010 — conf
Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau.
DFT
Takashi Aikyo
2009 Misc conf
A Novel Approach for Improving the Quality of Open Fault Diagnosis.
VLSI Design
Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume
2009 A conf
A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment.
ICCAD
Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara
2009 — conf
An Adaptive Test for Parametric Faults Based on Statistical Timing Information.
Asian Test Symposium
Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu
2009 A conf
Diagnostic test generation for transition faults using a stuck-at ATPG tool.
ITC
Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu
2009 Misc conf
Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC.
VLSI Design
Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu
2009 Misc conf
Small Delay Fault Model for Intra-Gate Resistive Open Defects.
VTS
Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki, Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo
2008 B conf
A Capture-Safe Test Generation Scheme for At-Speed Scan Testing.
ETS
Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja
2008 A conf
Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.
ICCAD
Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara
2008 J jnl
Estimation of Delay Test Quality and Its Application to Test Generation.
Inf. Media Technol.
Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo
2008 J jnl
Estimation of Delay Test Quality and Its Application to Test Generation.
IPSJ Trans. Syst. LSI Des. Methodol.
Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo
2008 J jnl
Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information.
IEICE Trans. Inf. Syst.
Yuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Koji Yamazaki
2008 J jnl
Post-BIST Fault Diagnosis for Multiple Faults.
IEICE Trans. Inf. Syst.
Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato
2008 J jnl
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate.
IEICE Trans. Inf. Syst.
Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo
2007 — conf
Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines.
ATS
Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Takashi Aikyo, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume
2007 A conf
Estimation of delay test quality and its application to test generation.
ICCAD
Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo
2007 — conf
Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines.
DFT
Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume
2007 — conf
Test Roles in Diagnosis and Silicon Debug.
ATS
Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera
2007 — conf
Timing-Aware Diagnosis for Small Delay Defects.
DFT
Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu
2006 — conf
At-Speed Testing with Timing Exceptions and Constraints-Case Studies.
ATS
Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Takeo Kobayashi, Janusz Rajski, Bruce Swanson, Darryl Walters, Yasuo Sato, Toshiharu Asaka, Takashi Aikyo
2006 — conf
Effective Post-BIST Fault Diagnosis for Multiple Faults.
DFT
Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato
2006 A conf
Test Data Compression of 100x for Scan-Based BIST.
ITC
Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo
2006 — conf
Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.
ATS
Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo
2000 — conf
Issues on SOC testing in DSM area: embedded tutorial.
ASP-DAC
Takashi Aikyo
1997 A* conf
A Test Synthesis Approach to Reducing BALLAST DFT Overhead.
DAC
Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng
1997 — conf
ATREX : Design for Testability System for Mega Gate LSIs.
Asian Test Symposium
Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi
1990 A conf
ASIC CAD system based on hierarchical design-for-testability.
ITC
Michiaki Emori, Takashi Aikyo, Yasuhide Machida, Jun-ichi Shikatani
1986 — conf
An Automatic Test Generation System for Large Scale Gate Arrays.
COMPCON
Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii