Taizhi Liu - RankMe

24 papers C 2Misc 2Journal 14Unranked 6

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	Simulation and Experimental Study on Trajectory Tracking of Tracked Unmanned Vehicle on Nonstructured Roads in the Field. J. Field Robotics Taizhi Liu, Kang Wu, Zhi Lin, Rulin Shen
2022	J	`jnl`	CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
2021	J	`jnl`	A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory. IEEE Trans. Very Large Scale Integr. Syst. Rui Zhang, Kexin Yang, Zhaocheng Liu, Taizhi Liu, Wenshan Cai, Linda Milor
2020	—	`conf`	Inverse Design of FinFET SRAM Cells. IRPS Rui Zhang, Zhaocheng Liu, Kexin Yang, Taizhi Liu, Wenshan Cai, Linda Milor
2020	J	`jnl`	SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations. IEEE Trans. Very Large Scale Integr. Syst. Rui Zhang, Taizhi Liu, Kexin Yang, Chang-Chih Chen, Linda Milor
2019	—	`conf`	Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor. IWASI Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
2018	J	`jnl`	A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology. IEEE Trans. Very Large Scale Integr. Syst. Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
2018	Misc	`conf`	Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology. VTS Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
2018	J	`jnl`	Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for Microprocessors. IEEE Trans. Emerg. Top. Comput. Taizhi Liu, Chang-Chih Chen, Linda Milor
2018	—	`conf`	Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. DCIS Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
2018	—	`conf`	Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology. DCIS Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim, Linda Milor
2017	J	`jnl`	Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations. Microelectron. Reliab. Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
2017	J	`jnl`	Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits. Microelectron. Reliab. Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim, Linda Milor
2017	J	`jnl`	Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements. IEEE Trans. Very Large Scale Integr. Syst. Soonyoung Cha, Taizhi Liu, Linda Milor
2017	C	`conf`	On-line monitoring of system health using on-chip SRAMs as a wearout sensor. IOLTS Woongrae Kim, Taizhi Liu, Linda Milor
2016	C	`conf`	SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection. ICCD Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor
2016	J	`jnl`	System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection. IEEE Trans. Very Large Scale Integr. Syst. Chang-Chih Chen, Taizhi Liu, Linda Milor
2015	—	`conf`	Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines. ISQED Taizhi Liu, Chang-Chih Chen, Linda S. Milor
2015	J	`jnl`	Comprehensive reliability and aging analysis on SRAMs within microprocessor systems. Microelectron. Reliab. Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor
2015	—	`conf`	Estimation of remaining life using embedded SRAM for wearout parameter extraction. IWASI Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor
2015	J	`jnl`	Processor-level reliability simulator for time-dependent gate dielectric breakdown. Microprocess. Microsystems Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor
2015	J	`jnl`	System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown. Microelectron. Reliab. Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor
2015	J	`jnl`	The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system. Microelectron. Reliab. Soonyoung Cha, Dae Hyun Kim, Taizhi Liu, Linda S. Milor
2014	Misc	`conf`	Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. VTS Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor