Taizhi Liu

24 papers C 2Misc 2Journal 14Unranked 6
YearRankTypeTitle / Venue / Authors
2025 J jnl
Simulation and Experimental Study on Trajectory Tracking of Tracked Unmanned Vehicle on Nonstructured Roads in the Field.
J. Field Robotics
Taizhi Liu, Kang Wu, Zhi Lin, Rulin Shen
2022 J jnl
CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
2021 J jnl
A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory.
IEEE Trans. Very Large Scale Integr. Syst.
Rui Zhang, Kexin Yang, Zhaocheng Liu, Taizhi Liu, Wenshan Cai, Linda Milor
2020 — conf
Inverse Design of FinFET SRAM Cells.
IRPS
Rui Zhang, Zhaocheng Liu, Kexin Yang, Taizhi Liu, Wenshan Cai, Linda Milor
2020 J jnl
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations.
IEEE Trans. Very Large Scale Integr. Syst.
Rui Zhang, Taizhi Liu, Kexin Yang, Chang-Chih Chen, Linda Milor
2019 — conf
Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor.
IWASI
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
2018 J jnl
A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst.
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
2018 Misc conf
Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology.
VTS
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
2018 J jnl
Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for Microprocessors.
IEEE Trans. Emerg. Top. Comput.
Taizhi Liu, Chang-Chih Chen, Linda Milor
2018 — conf
Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms.
DCIS
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
2018 — conf
Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology.
DCIS
Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim, Linda Milor
2017 J jnl
Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations.
Microelectron. Reliab.
Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
2017 J jnl
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits.
Microelectron. Reliab.
Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim, Linda Milor
2017 J jnl
Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements.
IEEE Trans. Very Large Scale Integr. Syst.
Soonyoung Cha, Taizhi Liu, Linda Milor
2017 C conf
On-line monitoring of system health using on-chip SRAMs as a wearout sensor.
IOLTS
Woongrae Kim, Taizhi Liu, Linda Milor
2016 C conf
SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection.
ICCD
Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor
2016 J jnl
System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection.
IEEE Trans. Very Large Scale Integr. Syst.
Chang-Chih Chen, Taizhi Liu, Linda Milor
2015 — conf
Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines.
ISQED
Taizhi Liu, Chang-Chih Chen, Linda S. Milor
2015 J jnl
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems.
Microelectron. Reliab.
Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor
2015 — conf
Estimation of remaining life using embedded SRAM for wearout parameter extraction.
IWASI
Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor
2015 J jnl
Processor-level reliability simulator for time-dependent gate dielectric breakdown.
Microprocess. Microsystems
Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor
2015 J jnl
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown.
Microelectron. Reliab.
Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor
2015 J jnl
The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system.
Microelectron. Reliab.
Soonyoung Cha, Dae Hyun Kim, Taizhi Liu, Linda S. Milor
2014 Misc conf
Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements.
VTS
Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor