| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
J. Field Robotics
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | — | conf |
IRPS
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | — | conf |
Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor.
IWASI
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | Misc | conf |
VTS
|
| 2018 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2018 | — | conf |
DCIS
|
| 2018 | — | conf |
DCIS
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | C | conf |
IOLTS
|
| 2016 | C | conf |
ICCD
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | — | conf |
ISQED
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
IWASI
|
| 2015 | J | jnl |
Microprocess. Microsystems
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2014 | Misc | conf |
VTS
|