Taiki Uemura - RankMe

28 papers C 2Journal 1Unranked 25

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	Comprehensive Study of Thermal Neutron SER in Bulk-Planar, Bulk-FinFET, FDSOI-Planar, and Bulk-GAA Technology, Evaluated at HANARO. IRPS Taiki Uemura, Jongyul Kim, Sungsoo Kim, Shinyoung Chung, Jong-Ho Lee
2025	—	`conf`	Cost-Effective Assessment of Neutron-Induced SER Using Single Proton Irradiation Test with Fixed Correlation Factor. IRPS Taiki Uemura, Sungsoo Kim, Shinyoung Chung, Jong-Ho Lee
2025	—	`conf`	Introduction to Voltage-Ramping Wafer Level Electromigration Method and Current Exponent Correction Factor for Co-Capping Metal Lines. IRPS Da Yong Shin, Hyunjun Choi, Joosung Kim, Myungsoo Yeo, Miji Lee, Taiki Uemura, Shin-Young Chung, Jong-Ho Lee
2025	—	`conf`	Reliability Impacts of Tapered Nanosheets and Localized Layout Effects in MBCFETs Fabricated with 2NM Logic Technology Featuring GAA. IRPS Seongkyung Kim, Eunyu Choi, Jinyoung Kim, Junkyo Jeong, Jihun Ryu, Myungsoo Yeo, Taiki Uemura, Shin-Young Chung, Jong-Ho Lee
2024	—	`conf`	Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence. IRPS Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae
2024	—	`conf`	Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology. IRPS Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae
2023	—	`conf`	Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. IRPS Taiki Uemura, Byungjin Chung, Shin-Young Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae
2023	—	`conf`	Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. IRPS SungMan Rhee, HyunJin Kim, Sangku Park, Taiki Uemura, Yuchul Hwang, Seungjin Choo, Jinju Kim, Hwasung Rhee, Shin-Young Chung
2022	—	`conf`	Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices. IRPS Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2022	—	`conf`	Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology. IRPS Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2021	—	`conf`	Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. IRPS Taiki Uemura, Byungjin Chung, Jeongmin Jo, Mijoung Kim, Dalhee Lee, Gunrae Kim, Seungbae Lee, Taesjoong Song, Hwasung Rhee, Brandon Lee, Jaehee Choi
2020	—	`conf`	Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology. IRPS Hai Jiang, Hyun-Chul Sagong, Jinju Kim, Hyewon Shim, Yoohwan Kim, Junekyun Park, Taiki Uemura, Yongsung Ji, Taeyoung Jeong, Dongkyun Kwon, Hwasung Rhee, Sangwoo Pae, Brandon Lee
2020	—	`conf`	Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. IRPS Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2020	—	`conf`	Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology. IRPS Heung-Kook Ko, Sena Park, Jihyun Ryu, Sung Ryul Kim, Giwon Lee, Dongjoon Lee, Sangwoo Pae, Euncheol Lee, Yongsun Ji, Hai Jiang, Taeyoung Jeong, Taiki Uemura, Dongkyun Kwon, Hyungrok Do, Hyungu Kahng, Yoon-Sang Cho, Jiyoon Lee, Seoung Bum Kim
2020	—	`conf`	Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET. IRPS Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Youngin Park, Kiil Hong, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2020	—	`conf`	Reliability of Industrial grade Embedded-STT-MRAM. IRPS Yongsung Ji, Hyunjae Goo, Jungman Lim, Tae-Young Jeong, Taiki Uemura, Gun Rae Kim, Boil Seo, Seungbae Lee, Goeun Park, Jeongmin Jo, Sang-Il Han, Kilho Lee, Junghyuk Lee, Sohee Hwang, Daesop Lee, Suksoo Pyo, Hyun Taek Jung, Shinhee Han, Seungmo Noh, Kiseok Suh, Sungyoung Yoon, Hyeonwoo Nam, Hyewon Hwang, Hai Jiang, J. W. Kim, D. Kwon, Yoonjong Song, K. H. Koh, Hwasung Rhee, Sangwoo Pae, E. Lee
2020	—	`conf`	Reliability on EUV Interconnect Technology for 7nm and beyond. IRPS Tae-Young Jeong, Miji Lee, Yunkyung Jo, Jinwoo Kim, Min Kim, Myungsoo Yeo, Jinseok Kim, Hyunjun Choi, Joosung Kim, Yoojin Jo, Yongsung Ji, Taiki Uemura, Hai Jiang, Dongkyun Kwon, Hwasung Rhee, Sangwoo Pae, Brandon Lee
2019	—	`conf`	Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. IRPS Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, Taiki Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S. H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, Gwanhyeob Koh, K. C. Park, Sangwoo Pae, Gi-Tae Jeong, J. S. Yoon, E. S. Jung
2019	—	`conf`	SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET. IRPS Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Seungbae Lee, Sangwoo Pae
2018	—	`conf`	Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit. IRPS Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Jungman Lim, Seungbae Lee, Hyun-Chul Sagong, Sangwoo Pae
2015	—	`conf`	Critical charge dependence of correlation of different neutron sources for soft error testing. IRPS Hiroko Mori, Taiki Uemura, Hideya Matsuyama, Shin-ichiro Abe, Yukinobu Watanabe
2015	—	`conf`	Impact of package on neutron induced single event upset in 20 nm SRAM. IRPS Taiki Uemura, Takashi Kato, Hideya Matsuyama, Masanori Hashimoto
2015	—	`conf`	Investigation of single event upset and total ionizing dose in FeRAM for medical electronic tag. IRPS Taiki Uemura, Masanori Hashimoto
2015	—	`conf`	Soft error immune latch design for 20 nm bulk CMOS. IRPS Taiki Uemura, Takashi Kato, Hideya Matsuyama, Masanori Hashimoto
2014	J	`jnl`	The 10th Generation 16-Core SPARC64™ Processor for Mission Critical UNIX Server. IEEE J. Solid State Circuits Ryuji Kan, Tomohiro Tanaka, Go Sugizaki, Kinya Ishizaka, Ryuichi Nishiyama, Sota Sakabayashi, Yoichi Koyanagi, Ryuji Iwatsuki, Kazumi Hayasaka, Taiki Uemura, Gaku Ito, Yoshitomo Ozeki, Hiroyuki Adachi, Kazuhiro Furuya, Tsuyoshi Motokurumada
2013	—	`conf`	A 10 ISSCC Ryuji Kan, Tomohiro Tanaka, Go Sugizaki, Ryuichi Nishiyama, Sota Sakabayashi, Yoichi Koyanagi, Ryuji Iwatsuki, Kazumi Hayasaka, Taiki Uemura, Gaku Ito, Yoshitomo Ozeki, Hiroyuki Adachi, Kazuhiro Furuya, Tsuyoshi Motokurumada
2011	C	`conf`	Investigation of multi cell upset in sequential logic and validity of redundancy technique. IOLTS Taiki Uemura, Takashi Kato, Hideya Matsuyama, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka
2008	C	`conf`	Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs. IOLTS Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh