Tai Song

20 papers Misc 1Journal 17Unranked 2
YearRankTypeTitle / Venue / Authors
2026 J jnl
Cost-aware test pattern ordering for VLSI using an enhanced LSTNet architecture.
Integr.
Bintao Geng, Ying Sun, Tai Song, Yadong Li
2025 — conf
LLM-Design Platform for Thermal-Failure-Aware 3D Chiplet Layout via Iterative Parameter Analysis.
ATS
Tai Song, Senling Wang, Xiaoqing Wen
2025 J jnl
Low-Cost Quadruple-Node-Upset Self-Recoverable Latch Based on Cross-Interlocking.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Zhengfeng Huang, Lei Ai, Xinyu Jiang, Xiaolei Wang, Yingchun Lu, Jun Pan, Tai Song, Xiaoqing Wen, Aibin Yan
2025 — conf
Software-Defined Secure Island for Testing Chiplet Systems.
ATS
Hisashi Okamoto, Senling Wang, Hiroshi Kai, Hiroyuki Yotsuyanagi, Yoshinobu Higami, Tianming Ni, Tai Song, Hiroshi Takahashi, Xiaoqing Wen
2024 J jnl
Designs of High-Speed Triple-Node-Upset Hardened Latch Based on Dual-Modular-Redundancy.
J. Circuits Syst. Comput.
Zhengfeng Huang, Yan Zhang, Lei Ai, Huaguo Liang, Tianming Ni, Tai Song, Aibin Yan
2024 J jnl
Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments.
Microelectron. J.
Hui Xu, Chaoming Liu, Ruijun Ma, Tai Song, Zhengfeng Huang, Jun Wang, Xuewei Qin, Yu Xia
2024 J jnl
Test Cost Reduction for VLSI Adaptive Test With K-Nearest Neighbor Classification Algorithm.
IEEE Trans. Circuits Syst. II Express Briefs
Tai Song, Zhengfeng Huang, Li Zhang, Qi Hong, Zhao Yang, Milos Krstic
2023 J jnl
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation.
J. Electron. Test.
Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstic Milos
2023 J jnl
Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs.
Microelectron. J.
Liang Huang, Tai Song, Tiezhen Jiang
2023 J jnl
Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix.
IEEE Trans. Aerosp. Electron. Syst.
Zhengfeng Huang, Dongxing Ma, Runwu Ji, Huaguo Liang, Aibin Yan, Tai Song, Tianming Ni
2022 J jnl
A double-node-upset completely tolerant CMOS latch design with extremely low cost for high-performance applications.
Integr.
Aibin Yan, Kuikui Qian, Tai Song, Zhengfeng Huang, Tianming Ni, Yu Chen, Xiaoqing Wen
2022 J jnl
Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements.
J. Circuits Syst. Comput.
Zhengfeng Huang, Wanshu Zhong, Lanxi Duan, Yue Zhang, Huaguo Liang, Jianan Wang, Tai Song, Yingchun Lu
2022 J jnl
Machine learning classification algorithm for VLSI test cost reduction.
Integr.
Tai Song, Zhengfeng Huang, Aibin Yan
2022 J jnl
RLDA: Valid test pattern identification by machine learning classification method for VLSI test.
Microelectron. J.
Tai Song, Zhengfeng Huang, Xiaohui Guo
2022 J jnl
VLSI test through an improved LDA classification algorithm for test cost reduction.
Microelectron. J.
Liang Huang, Tai Song
2022 J jnl
Valid test pattern identification for VLSI adaptive test.
Integr.
Tai Song, Tianming Ni, Zhengfeng Huang, Jinlei Wan
2021 J jnl
Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs.
IEICE Electron. Express
Tai Song, Huaguo Liang, Zhengfeng Huang, Tianming Ni, Ying Sun
2020 J jnl
Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC.
IEEE Trans. Circuits Syst.
Tianming Ni, Hao Chang, Tai Song, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen
2020 J jnl
Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm.
IEEE Access
Tai Song, Huaguo Liang, Tianming Ni, Zhengfeng Huang, Yingchun Lu, Jinlei Wan, Aibin Yan
2019 Misc conf
Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory.
VTS
Tai Song, Huaguo Liang, Ying Sun, Zhengfeng Huang, Maoxiang Yi, Xiangsheng Fang, Aibin Yan