Tadahiro Shibutani

14 papers Journal 13Unranked 1
YearRankTypeTitle / Venue / Authors
2021 J jnl
Fabrication of doubly-curved CFRP shell structures with control over fiber directions.
Comput. Aided Des.
Masahito Takezawa, Yuto Otoguro, Kohei Matsuo, Tadahiro Shibutani, Akio Sakurai, Takashi Maekawa
2018 J jnl
Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test.
Microelectron. Reliab.
Junji Sakamoto, Ryoma Hirata, Tadahiro Shibutani
2017 J jnl
Finite element analysis of thermal and mechanical stresses due to the grain anisotropy of polycrystalline β-Sn.
Microelectron. Reliab.
Junji Sakamoto, Hisakazu Ohara, Tadahiro Shibutani
2017 J jnl
Nucleation and shrinkage of defects on the surface of tin induced by local strain distribution.
Microelectron. Reliab.
Tadahiro Shibutani, Jing Wen Sun
2016 J jnl
A fusion prognostics-based qualification test methodology for microelectronic products.
Microelectron. Reliab.
Michael G. Pecht, Tadahiro Shibutani, Myeongsu Kang, Melinda Hodkiewicz, Edward Cripps
2016 J jnl
A reliability assessment guide for the transition planning to lead-free electronics for companies whose products are RoHS exempted or excluded.
Microelectron. Reliab.
Michael G. Pecht, Tadahiro Shibutani, Lifeng Wu
2016 J jnl
Curvature sensitive analysis of axially compressed cylindrical tubes with corrugated surface using isogeometric analysis and experiment.
Comput. Aided Geom. Des.
Takuma Imai, Tadahiro Shibutani, Kazumi Matsui, Seitoku Kumagai, Dang Tien Tran, Kaiyuan Mu, Takashi Maekawa
2016 J jnl
IoT-Based Prognostics and Systems Health Management for Industrial Applications.
IEEE Access
Daeil Kwon, Melinda R. Hodkiewicz, Jiajie Fan, Tadahiro Shibutani, Michael G. Pecht
2012 J jnl
Precursor monitoring approach for reliability assessment of cooling fans.
J. Intell. Manuf.
Hyun-Seok Oh, Tadahiro Shibutani, Michael G. Pecht
2012 J jnl
Topologically robust B-spline surface reconstruction from point clouds using level set methods and iterative geometric fitting algorithms.
Comput. Aided Geom. Des.
Hiroki Yoshihara, Tatsuya Yoshii, Tadahiro Shibutani, Takashi Maekawa
2008 — conf
Effect of Creep Properties on Pressure Induced Tin Whisker Formation.
SSIRI
Tadahiro Shibutani, Qiang Yu, Masaki Shiratori
2008 J jnl
Effect of process-induced voids on isothermal fatigue resistance of CSP lead-free solder joints.
Microelectron. Reliab.
Qiang Yu, Tadahiro Shibutani, Do-Seop Kim, Yusuke Kobayashi, Jidong Yang, Masaki Shiratori
2008 J jnl
Key reliability concerns with lead-free connectors.
Microelectron. Reliab.
Tadahiro Shibutani, Ji Wu, Qiang Yu, Michael G. Pecht
2008 J jnl
Pressure-induced tin whisker formation.
Microelectron. Reliab.
Tadahiro Shibutani, Qiang Yu, Masaki Shiratori, Michael G. Pecht