Szczepan Urban

11 papers A 7B 1Unranked 3

Year	Rank	Type	Title / Venue / Authors
2025	A	`conf`	Advanced fault model, diagnosis and applications for deep nanometer process. ITC Youngseok Son, Muyun Cho, Hyunyul Lim, Jaeseok Park, Piotr Zimnowlodzki, Szczepan Urban, Jayant D'Souza, Manish Sharma
2025	A	`conf`	Chain Cell-Aware Diagnosis. ITC Szczepan Urban, Jakub Janicki, Piotr Zimnowlodzki, Artur Stelmach, Manish Sharma
2025	—	`conf`	Improving Effect-Cause Diagnosis Performance with Minimal Memory Overhead on Asymmetric Partition Trees (APT). ITC-Asia Wu-Tung Cheng, Szczepan Urban, Manish Sharma, Jakub Janicki
2025	A	`conf`	Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects. ITC Wu-Tung Cheng, Manish Sharma, Artur Stelmach, Jakub Janicki, Preston McWithey, Gaurav Veda, Szczepan Urban, Jayant D'Souza
2024	A	`conf`	Adaptive Diagnosis Points for 100% Chain Diagnosis Coverage. ITC Wu-Tung Cheng, Manish Sharma, Xin Yang, Artur Stelmach, Szczepan Urban, Jakub Janicki, Preston McWithey
2023	A	`conf`	Global Control Signal Defect Diagnosis in Volume Production Environment. ITC Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski
2023	A	`conf`	Predicting the Resolution of Scan Diagnosis. ITC Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza
2022	A	`conf`	Industry Evaluation of Reversible Scan Chain Diagnosis. ITC Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson
2020	—	`conf`	Scan Chain Diagnosis-Driven Test Response Compactor. ATS Jakub Janicki, Grzegorz Mrugalski, Artur Stelmach, Szczepan Urban
2019	B	`conf`	Non-Adaptive Pattern Reordering to Improve Scan Chain Diagnostic Resolution. ETS Yu Huang, Jakub Janicki, Szczepan Urban
2019	—	`conf`	Reversible Scan Based Diagnostic Patterns. VLSI-DAT Yu Huang, Szczepan Urban, Wu-Tung Cheng, Manish Sharma, Fengju Niu, Junna Zhong, Wen-Lung Hsu