| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Access
|
| 2026 | — | conf |
ASP-DAC
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Proc. IEEE
|
| 2025 | — | conf |
ISQED
|
| 2025 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
ISVLSI
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | C | conf |
ICCD
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2025 | — | conf |
ISQED
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2025 | J | jnl |
CoRR
|
| 2025 | Misc | conf |
VLSID
|
| 2025 | A | conf |
ICCAD
|
| 2025 | J | jnl |
Entropy
|
| 2025 | — | conf |
TPS-ISA
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
ISVLSI
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
ISQED
|
| 2025 | J | jnl |
IEEE Trans. Emerg. Top. Comput. Intell.
|
| 2025 | — | conf |
ISVLSI
|
| 2025 | J | jnl |
CoRR
|
| 2025 | Misc | conf |
VLSID
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
ISQED
|
| 2025 | — | conf |
ISQED
|
| 2025 | — | conf |
ISQED
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
HOST
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
ISQED
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2024 | J | jnl |
CoRR
|
| 2024 | Misc | conf |
VLSID
|
| 2024 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
ISQED
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Des. Test
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | Misc | conf |
QCE
|
| 2024 | — | conf |
ISQED
|
| 2024 | — | conf |
ISQED
|
| 2024 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2024 | J | jnl |
CoRR
|
| 2024 | Misc | conf |
QCE
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
HASP@MICRO
|
| 2024 | Misc | conf |
VLSID
|
| 2024 | — | conf |
ASHES@CCS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
ISQED
|
| 2024 | — | conf |
ISVLSI
|
| 2024 | J | jnl |
Frontiers Comput. Sci.
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | — | conf |
ASP-DAC
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | Misc | conf |
QCE
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Sensors
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Cryptogr.
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2022 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2022 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2022 | A | conf |
DATE
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | Misc | conf |
VLSID
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | Misc | conf |
VLSID
|
| 2022 | A | ed. |
ISLPED
|
| 2022 | J | jnl |
CoRR
|
| 2022 | A | conf |
DATE
|
| 2022 | C | conf |
ICCD
|
| 2022 | A | conf |
ICCAD
|
| 2022 | J | jnl |
CoRR
|
| 2022 | — | conf |
HASP@MICRO
|
| 2022 | A | conf |
DATE
|
| 2022 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2022 | J | jnl |
CoRR
|
| 2022 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | Misc | conf |
VTS
|
| 2021 | J | jnl |
CoRR
|
| 2021 | B | conf |
ETS
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
ISQED
|
| 2021 | A* | conf |
DAC
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2021 | A | conf |
ICCAD
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2021 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2021 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2021 | — | conf |
HASP@MICRO
|
| 2021 | A | conf |
ICCAD
|
| 2020 | — | conf |
ISQED
|
| 2020 | A | conf |
DATE
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
CoRR
|
| 2020 | A* | conf |
DAC
|
| 2020 | A | conf |
ISLPED
|
| 2020 | A | conf |
ITC
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | A* | conf |
MICRO
|
| 2020 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2020 | — | conf |
CICC
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | B | conf |
IJCNN
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | — | conf |
ISQED
|
| 2020 | — | conf |
ISQED
|
| 2020 | — | conf |
ISQED
|
| 2020 | A | conf |
ICCAD
|
| 2020 | A | conf |
ICCAD
|
| 2020 | — | conf |
ECCV (29)
|
| 2020 | J | jnl |
CoRR
|
| 2020 | — | conf |
MWSCAS
|
| 2020 | J | jnl |
CoRR
|
| 2020 | A | conf |
ISLPED
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
IEEE Trans. Reliab.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
CoRR
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2019 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2019 | A | conf |
ISLPED
|
| 2019 | J | jnl |
CoRR
|
| 2019 | J | jnl |
CoRR
|
| 2019 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2019 | — | conf |
HOST
|
| 2019 | A | conf |
DATE
|
| 2019 | B | conf |
IJCNN
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | A | conf |
DATE
|
| 2019 | — | conf |
MWSCAS
|
| 2019 | A | conf |
ICCAD
|
| 2019 | C | conf |
Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories : (Invited Paper).
IOLTS
|
| 2019 | A* | conf |
DAC
|
| 2019 | J | jnl |
CoRR
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2019 | A | conf |
ISLPED
|
| 2019 | A* | conf |
DAC
|
| 2019 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2019 | J | jnl |
CoRR
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2019 | — | conf |
DRC
|
| 2019 | — | conf |
ISVLSI
|
| 2018 | A | conf |
ISLPED
|
| 2018 | C | conf |
ICCD
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | — | conf |
HOST
|
| 2018 | C | conf |
ICCD
|
| 2018 | — | conf |
HASP@ISCA
|
| 2018 | C | conf |
ICCD
|
| 2018 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2018 | A | conf |
ISLPED
|
| 2018 | J | jnl |
J. Low Power Electron.
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | A | conf |
DATE
|
| 2018 | Misc | conf |
VTS
|
| 2018 | A | conf |
ITC
|
| 2018 | A | conf |
ISLPED
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2017 | J | jnl |
CoRR
|
| 2017 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2017 | A | conf |
DATE
|
| 2017 | — | conf |
ISQED
|
| 2017 | — | conf |
ISQED
|
| 2017 | A | conf |
DATE
|
| 2017 | J | jnl |
J. Hardw. Syst. Secur.
|
| 2017 | — | conf |
CICC
|
| 2017 | C | conf |
ICCD
|
| 2017 | — | conf |
HOST
|
| 2016 | B | conf |
ETS
|
| 2016 | C | conf |
ICCD
|
| 2016 | — | conf |
SAMOS
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
CoRR
|
| 2016 | J | jnl |
CoRR
|
| 2016 | — | conf |
ASP-DAC
|
| 2016 | A | conf |
ISLPED
|
| 2016 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2016 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2016 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2016 | J | jnl |
CoRR
|
| 2016 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2016 | A | conf |
ISLPED
|
| 2016 | J | jnl |
IEEE Des. Test
|
| 2016 | J | jnl |
J. Low Power Electron.
|
| 2016 | A | conf |
ICCAD
|
| 2016 | J | jnl |
CoRR
|
| 2016 | — | conf |
DFT
|
| 2016 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2016 | J | jnl |
Proc. IEEE
|
| 2015 | J | jnl |
IEEE J. Solid State Circuits
|
| 2015 | — | conf |
HOST
|
| 2015 | A | conf |
ISLPED
|
| 2015 | A | conf |
ISLPED
|
| 2015 | — | conf |
ISQED
|
| 2015 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2015 | A* | conf |
DAC
|
| 2015 | J | jnl |
Proc. IEEE
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | A | conf |
DATE
|
| 2015 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2015 | — | conf |
ISQED
|
| 2015 | J | jnl |
CoRR
|
| 2015 | A* | conf |
DAC
|
| 2015 | — | conf |
MWSCAS
|
| 2015 | J | jnl |
CoRR
|
| 2014 | — | conf |
ISSCC
|
| 2014 | — | conf |
HOST
|
| 2014 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2014 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2014 | A* | conf |
DAC
|
| 2014 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2014 | A* | conf |
DAC
|
| 2014 | A | conf |
ISLPED
|
| 2014 | Misc | conf |
VLSID
|
| 2013 | — | conf |
NANOARCH
|
| 2013 | — | conf |
CICC
|
| 2013 | A* | conf |
DAC
|
| 2011 | — | ch. |
Low-Power Variation-Tolerant Design in Nanometer Silicon
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | J | jnl |
Proc. IEEE
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2009 | Misc | conf |
VLSI Design
|
| 2008 | A | conf |
DATE
|
| 2008 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2008 | — | conf |
ASP-DAC
|
| 2008 | A | conf |
ISLPED
|
| 2007 | A | conf |
ITC
|
| 2007 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2007 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2007 | A | conf |
DATE
|
| 2007 | — | conf |
CICC
|
| 2007 | C | conf |
IOLTS
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | A | conf |
ICCAD
|
| 2006 | C | conf |
IOLTS
|
| 2006 | — | conf |
SoCC
|
| 2006 | A* | conf |
DAC
|
| 2005 | C | conf |
IOLTS
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | B | conf |
ETS
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2003 | J | jnl |
IEEE Trans. Reliab.
|