Suresh K. Sitaraman

12 papers A 1Journal 10Unranked 1
YearRankTypeTitle / Venue / Authors
2025 J jnl
Optimizing Thermal Performance in 2.5D Systems Using Embedded Isolators.
IEEE J. Emerg. Sel. Topics Circuits Syst.
George Karfakis, Myriam Bouzidi, Yunhyeok Im, Alexander Graening, Suresh K. Sitaraman, Puneet Gupta
2019 J jnl
Multigated Carbon Nanotube Field Effect Transistors-Based Physically Unclonable Functions As Security Keys.
IEEE Internet Things J.
Nitish Kumar, Jialuo Chen, Monodeep Kar, Suresh K. Sitaraman, Saibal Mukhopadhyay, Satish Kumar
2018 — conf
A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect.
ATS
Jun-Yang Lei, Thomas Moon, Justin Chow, Suresh K. Sitaraman, Abhijit Chatterjee
2018 J jnl
Random vibration analysis of 3-Arc-Fan compliant interconnects.
Microelectron. Reliab.
Philip Y. Chung, Suresh K. Sitaraman
2014 J jnl
Experimental evaluation of SnAgCu solder joint reliability in 100-μm pitch flip-chip assemblies.
Microelectron. Reliab.
Ye Tian, Xi Liu, Justin Chow, Yi-Ping Wu, Suresh K. Sitaraman
2013 J jnl
Compliance analysis of multi-path fan-shaped interconnects.
Microelectron. Reliab.
Wei Chen, Raphael Okereke, Suresh K. Sitaraman
2013 J jnl
Failure analysis of through-silicon vias in free-standing wafer under thermal-shock test.
Microelectron. Reliab.
Xi Liu, Qiao Chen, Venkatesh Sundaram, Rao R. Tummala, Suresh K. Sitaraman
2011 A conf
Full-chip through-silicon-via interfacial crack analysis and optimization for 3D IC.
ICCAD
Moongon Jung, Xi Liu, Suresh K. Sitaraman, David Z. Pan, Sung Kyu Lim
2010 J jnl
Laser moiré interferometry for fatigue life prediction of lead-free solders.
Microelectron. Reliab.
Krishna Tunga, Suresh K. Sitaraman
2010 J jnl
ROM: a reliability knowledge representation for collaborative system design.
Eng. Comput.
Injoong Kim, Russell S. Peak, Suresh K. Sitaraman
2008 J jnl
ZAP: a knowledge-based FEA modeling method for highly coupled variable topology multi-body problems.
Eng. Comput.
Sai Zeng, Russell S. Peak, Angran Xiao, Suresh K. Sitaraman
2007 J jnl
Universal fatigue life prediction equation for ceramic ball grid array (CBGA) packages.
Microelectron. Reliab.
Andy Perkins, Suresh K. Sitaraman