Suresh Goyal

16 papers A* 1A 3Misc 1Journal 10
YearRankTypeTitle / Venue / Authors
2018 J jnl
A DEMATEL based approach for investigating barriers in green supply chain management in Canadian manufacturing firms.
Int. J. Prod. Res.
Jasneet Kaur, Ramneet Sidhu, Anjali Awasthi, Satyaveer Singh Chauhan, Suresh Goyal
2013 J jnl
Executing IJTAG: Are Vectors Enough?
IEEE Des. Test
Michele Portolan, Bradford G. Van Treuren, Suresh Goyal
2012 — ed.
Proceedings of the 3rd International Conference on Energy-Efficient Computing and Networking, e-Energy'12, Madrid, Spain, May 9-11, 2012
e-Energy
Marco Ajmone Marsan, Suresh Goyal, Shugong Xu, Antonio Fernández, Milan Prodanovic, Ken Christensen
2010 J jnl
A Common Language Framework for Next-Generation Embedded Testing.
IEEE Des. Test Comput.
Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook
2010 J jnl
Energy scavenging for energy efficiency in networks and applications.
Bell Labs Tech. J.
Kyoung Joon Kim, Francesco Cottone, Suresh Goyal, Jeff M. Punch
2010 A conf
Scan chain securization though Open-Circuit Deadlocks.
ITC
Michele Portolan, Bradford G. Van Treuren, Suresh Goyal
2009 A conf
Scalable and efficient integrated test architecture.
ITC
Michele Portolan, Suresh Goyal, Bradford G. Van Treuren
2008 A conf
A New Language Approach for IJTAG.
ITC
Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook
2008 J jnl
A review of the joint replenishment problem literature: 1989-2005.
Eur. J. Oper. Res.
Moutaz Khouja, Suresh Goyal
2007 J jnl
Economic modeling of global test strategy I: Mathematical models.
Bell Labs Tech. J.
Eric S. Fisher, Steven Fortune, Martin K. Gladstein, Suresh Goyal, William B. Lyons, James H. Mosher Jr., Gordon T. Wilfong
2007 J jnl
Economic modeling of global test strategy II: Software system and examples.
Bell Labs Tech. J.
Eric S. Fisher, Steven Fortune, Martin K. Gladstein, Suresh Goyal, William B. Lyons, James H. Mosher Jr., Gordon T. Wilfong
2007 Misc conf
Parameter Estimation for a Model with Both Imperfect Test and Repair.
VTS
Simon P. Wilson, Ben Flood, Suresh Goyal, Jim Mosher, Susan Bergin, Joseph O'Brien, Robert Kennedy
2006 J jnl
An improved test process model for cost reduction.
Bell Labs Tech. J.
Suresh Goyal, James H. Mosher Jr.
2006 J jnl
Piecewise analysis and modeling of circuit pack temperature cycling data.
Bell Labs Tech. J.
Toby Joyce, Edward J. Lisay, David E. Dalton, Jeff M. Punch, Michael S. Shellmer, Shirish N. Kher, Suresh Goyal
1998 J jnl
Designing best-in-class impact-tolerant cellular phones and other portable products.
Bell Labs Tech. J.
Suresh Goyal, Sanjay S. Upasani, Dhiren M. Patel
1989 A* conf
Limit surface and moment function descriptions of planar sliding.
ICRA
Suresh Goyal, Andy Ruina, Jim Papadopoulos