| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2020 | — | conf |
RADIOELEKTRONIKA
|
| 2020 | J | jnl |
J. Electron. Test.
|
| 2019 | J | jnl |
IEEE Trans. Computers
|
| 2019 | Misc | conf |
VLSID
|
| 2018 | J | jnl |
IET Comput. Digit. Tech.
|
| 2018 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2017 | C | conf |
SIN
|
| 2016 | J | jnl |
Microelectron. J.
|
| 2016 | Misc | conf |
VLSID
|
| 2015 | Misc | conf |
VLSID
|
| 2015 | — | conf |
VLSI-DAT
|
| 2014 | Misc | conf |
VLSID
|
| 2013 | — | conf |
ECCTD
|
| 2008 | J | jnl |
IEEE Trans. Educ.
|