Sungyoul Seo

13 papers Journal 4Unranked 9
YearRankTypeTitle / Venue / Authors
2022 J jnl
Reduced-Pin-Count BOST for Test-Cost Reduction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Youngkwang Lee, Young-Woo Lee, Sungyoul Seo, Sungho Kang
2019 J jnl
An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
2018 — conf
2-D Failure Bitmap Compression Using Line Fault Marking Method.
ISOCC
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
2018 J jnl
A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test.
IEEE J. Emerg. Sel. Topics Circuits Syst.
Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang
2017 — conf
An efficient built-in self-repair scheme for area reduction.
ISOCC
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
2017 — conf
Broadcast scan compression based on deterministic pattern generation algorithm.
ISQED
Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang
2017 — conf
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder.
ISQED
Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang
2016 — conf
A test methodology to screen scan-path failures.
ISOCC
Junghwan Kim, Young-Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang
2016 — conf
Software-based embedded core test using multi-polynomial for test data reduction.
ISOCC
Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang
2016 J jnl
Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sungyoul Seo, Yong Lee, Sungho Kang
2015 — conf
A scan shifting method based on clock gating of multiple groups for low power scan testing.
ISQED
Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang
2015 — conf
Low power scan bypass technique with test data reduction.
ISQED
Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang
2015 — conf
Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction.
ATS
Sungyoul Seo, Yong Lee, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang