Sungju Park - RankMe

47 papers A* 3A 6B 4C 2Misc 1Journal 21Unranked 10

Year	Rank	Type	Title / Venue / Authors
2022	J	`jnl`	Highly Efficient Test Architecture for Low-Power AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park
2022	J	`jnl`	Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators. IEEE Trans. Circuits Syst. II Express Briefs Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park
2021	J	`jnl`	Master-slave based test cost reduction method for DNN accelerators. IEICE Electron. Express Umair Saeed Solangi, Muhammad Ibtesam, Sungju Park
2021	J	`jnl`	Test Architecture for Systolic Array of Edge-Based AI Accelerator. IEEE Access Umair Saeed Solangi, Muhammad Ibtesam, Muhammad Adil Ansari, Jinuk Kim, Sungju Park
2021	J	`jnl`	Time multiplexed LBIST for in-field testing of automotive AI accelerators. IEICE Electron. Express Umair Saeed Solangi, Muhammad Ibtesam, Sungju Park
2020	J	`jnl`	CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience. IEEE Access Jinuk Kim, Muhammad Ibtesam, Dooyoung Kim, Jihun Jung, Sungju Park
2018	J	`jnl`	Erratum to "Time-Multiplexed-Network for Test Cost Reduction". IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park
2018	J	`jnl`	Time-Multiplexed 1687-Network for Test Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park
2017	J	`jnl`	On Diagnosing the Aging Level of Automotive Semiconductor Devices. IEEE Trans. Circuits Syst. II Express Briefs Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park
2016	J	`jnl`	Time-multiplexed test access architecture for stacked integrated circuits. IEICE Electron. Express Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park
2015	B	`conf`	Efficient diagnosis technique for aging defects on automotive semiconductor chips. ETS Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park
2015	—	`conf`	Scan-Puf: Puf Elements Selection Methods for Viable IC Identification. ATS Dooyoung Kim, Muhammad Adil Ansari, Jihun Jung, Sungju Park
2014	J	`jnl`	An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory. IEEE Trans. Computers Syed Mohsin Abbas, Soonyoung Lee, Sanghyeon Baeg, Sungju Park
2012	J	`jnl`	Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress. IEEE Trans. Instrum. Meas. Jongsun Bae, Sanghyeon Baeg, Sungju Park
2011	—	`conf`	Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate. Asian Test Symposium Umair Ishaq, Jihun Jung, Jaehoon Song, Sungju Park
2010	J	`jnl`	A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains. IEEE Trans. Circuits Syst. II Express Briefs Hyunbean Yi, Sandip Kundu, Sangwook Cho, Sungju Park
2010	A*	`conf`	A trial english class with a teaching assistant robot in elementary school. HRI Jeonghye Han, Seungmin Lee, Bokhyun Kang, Sungju Park, Jungkwan Kim, Myungsook Kim, Mihee Kim
2010	J	`jnl`	On-Chip Support for NoC-Based SoC Debugging. IEEE Trans. Circuits Syst. I Regul. Pap. Hyunbean Yi, Sungju Park, Sandip Kundu
2009	J	`jnl`	An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge. IEEE Trans. Circuits Syst. I Regul. Pap. Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park
2009	J	`jnl`	Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park
2009	J	`jnl`	Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park
2008	—	`conf`	A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC. ATS Hyunbean Yi, Sungju Park, Sandip Kundu
2008	A	`conf`	An Efficient Secure Scan Design for an SoC Embedding AES Core. ITC Jaehoon Song, Taejin Jung, Junseop Lee, Hyeran Jeong, Byeongjin Kim, Sungju Park
2008	B	`conf`	Comparative study of effects of language instruction program using intelligence robot and multimedia on linguistic ability of young children. RO-MAN Eun-ja Hyun, So-Yeon Kim, Siekyung Jang, Sungju Park
2008	J	`jnl`	Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE Trans. Instrum. Meas. Hyunbean Yi, Jaehoon Song, Sungju Park
2007	—	`conf`	An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips. Asia-Pacific Computer Systems Architecture Conference Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park
2007	—	`conf`	Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC. ATS Jaehoon Song, Juhee Han, Dooyoung Kim, Hyunbean Yi, Sungju Park
2007	Misc	`conf`	Design of Test Access Mechanism for AMBA-Based System-on-a-Chip. VTS Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park
2006	J	`jnl`	Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park
2006	A	`conf`	Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. ITC Hyunbean Yi, Jaehoon Song, Sungju Park
2005	—	`conf`	Hybrid test data compression technique for SOC scan testing. SoCC Sangwook Cho, Jaehoon Song, Hyunbean Yi, Sungju Park
2005	B	`conf`	The educational use of home robots for children. RO-MAN Jeonghye Han, Miheon Jo, Sungju Park, Sungho Kim
2004	A*	`conf`	A new state assignment technique for testing and low power. DAC Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J. Ciesielski
2003	—	`conf`	An Efficient Buffer Allocation Technique for Virtual Lanes in InfiniBand Networks. Human.Society@Internet 2003 Hyunbean Yi, Sungju Park, Misook Kim, Kiman Jeon
2002	J	`jnl`	A Genetic Algorithm for the Minimization of OPKFDDs. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. Migyoung Jung, Gueesang Lee, Sungju Park, Rolf Drechsler
2002	—	`conf`	A New Boundary Matching Algorithm Based on Edge Detection. EurAsia-ICT NamRye Son, YoJin Yang, Gueesang Lee, Sungju Park
2002	—	`conf`	A Simple Wrapped Core Linking Module for SoC Test Access. Asian Test Symposium Jaehoon Song, Sungju Park
2001	—	`conf`	A Microcode-Based Memory BIST Implementing Modified March Algorithm. Asian Test Symposium Dongkyu Youn, TaeHyung Kim, Sungju Park
2001	C	`conf`	Minimization of OPKFDDs Using Genetic Algorithms. DSD Migyoung Jung, Gueesang Lee, Sungju Park, Rolf Drechsler
2001	B	`conf`	Scalable data management using user-based caching and prefetching in distributed virtual environments. VRST Sungju Park, Dongman Lee, Mingyu Lim, Chansu Yu
2000	A	`conf`	A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects. DATE Sungju Park, TaeHyung Kim
2000	C	`conf`	A partial scan design by unifying structural analysis and testabilities. ISCAS Jongwook Park, Sang-Hoon Shin, Sungju Park
1996	A*	`conf`	A New Complete Diagnosis Patterns for Wiring Interconnects. DAC Sungju Park
1992	A	`conf`	A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination. ITC Sungju Park, Sheldon B. Akers
1992	J	`jnl`	Parity bit calculation and test signal compaction for BIST applications. J. Electron. Test. Sungju Park, Sheldon B. Akers
1991	A	`conf`	Parity Bit Calculation and Test Signal Compaction for BIST Applications. ITC Sungju Park, Sheldon B. Akers
1990	A	`conf`	Why is less information from logic simulation more useful in fault simulation? ITC Sheldon B. Akers Jr., Sungju Park, Balakrishnan Krishnamurthy, Ashok Swaminathan