Sule Ozev

197 papers A* 2A 40B 19C 12Misc 39Journal 64Unranked 21
YearRankTypeTitle / Venue / Authors
2026 J jnl
Fault Tolerant Design of IGZO-based Binary Search ADCs.
CoRR
Paula Carolina Lozano Duarte, Sule Ozev, Mehdi B. Tahoori
2025 Misc conf
A Multi-Step Algorithm to Increase Measurement Accuracy of mm-Wave BIST Using Periodic Structures.
VTS
Noah Rajbharti, Esteban Chacon, Muslum Emir Avci, Jennifer Kitchen, Sule Ozev
2025 J jnl
Background Receiver IQ Imbalance Correction for In-Field Testing.
IEEE Des. Test
Muslum Emir Avci, Sule Ozev
2025 Misc conf
DC Stimulus Electrical Calibration of MEMS Accelerometers.
VTS
Ishaan Bassi, Sule Ozev
2025 Misc conf
Defect Severity Analysis for Analog Circuits Using Zoom Search and Hierarchical Fault Simulation.
VTS
Mehmet Onder, Lakshmanan Balasubramanian, Rubin A. Parekhji, Suriyaprakash Natarajan, Sule Ozev
2025 J jnl
Evaluating the impact of dehazing algorithms on object tracking performance.
Signal Image Video Process.
Huseyin Seckin Demir, Noah Rajbharti, Sloan Sciarappo, Jennifer Blain Christen, Sule Ozev
2025 — conf
Testing of Passive Memristive Crossbars in AI Hardware Accelerators.
ATS
Shanmukha Mangadahalli Siddaramu, Mahta Mayahinia, Surendra Hemaram, Sule Ozev, Mehdi B. Tahoori
2024 Misc conf
Calibration and Source Localization Using an Array of Resistive Metal Oxide Gas Sensors.
VTS
Ishaan Bassi, Sule Ozev
2024 A conf
Electrical Stimulus Based Calibration of MEMS Accelerometer.
ITC
Ishaan Bassi, Sule Ozev
2024 — conf
Evaluating the Impact of Dehazing Algorithms on Visual Object Tracking Performance.
ISVC (1)
Huseyin Seckin Demir, Noah Rajbharti, Sloan Sciarappo, Jennifer Blain Christen, Sule Ozev
2024 B conf
Hierarchical Fault Simulation for Mixed-Signal Circuits Using Template Based Fault Response Modeling.
ETS
Tolga Aksoy, Nikhil Sagar Modala, Lakshmanan Balasubramanian, Rubin A. Parekhji, Sule Ozev
2024 — conf
Increasing the Efficiency of Hierarchical Fault Simulation through Functional Fault Clustering.
MWSCAS
Nikhil Sagar Modala, Lakshmanan Balasubramanian, Rubin A. Parekhji, Sule Ozev
2024 Misc conf
Multi-Parameter Optimization of mm-Wave Antenna Layout Using Hybrid Modeling and Incremental Model Learning.
VTS
Ferhat Can Ataman, Mohammed Aladsani, Y. B. Chethan Kumar, Georgios Trichopoulos, Sule Ozev
2024 Misc conf
Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors.
VTS
Suhas Krishna Kashyap, Chinmaye Raghavendra, Suriyaprakash Natarajan, Sule Ozev
2024 — conf
Underwater Image Restoration Using Light Attenuation.
ISVC (2)
Huseyin Seckin Demir, Jennifer Blain Christen, Sule Ozev
2023 — conf
A Low Cost Physical Stimulus Emulator for Motion and Pressure Sensors.
MWSCAS
Ishaan Bassi, Sule Ozev
2023 B conf
Global Tuning for System Performance Optimization of RF MIMO Radars.
ETS
Ferhat Can Ataman, Muslum Emir Avci, Y. B. Chethan Kumar, Sule Ozev
2023 J jnl
IMPRoVED: Integrated Method to Predict PostRouting setup Violations in Early Design Stages.
ACM Trans. Design Autom. Electr. Syst.
Suhas Krishna Kashyap, Sule Ozev
2023 A conf
Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars.
ITC
Ferhat Can Ataman, Y. B. Chethan Kumar, Sandeep Rao, Sule Ozev
2023 J jnl
Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation.
IEEE Des. Test
Bora Bilgic, Sule Ozev
2023 B conf
Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors.
ETS
Ferhat Can Ataman, Mohammed Aladsani, Georgios Trichopoulos, Y. B. Chethan Kumar, Sule Ozev
2022 J jnl
An In-Field Programmable Adaptive CMOS LNA for Intelligent IoT Sensor Node Applications.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Maryam Shafiee, Sule Ozev
2022 Misc conf
Detecting Anomaly in Chemical Sensors via Regularized Contrastive Learning.
ICASSP
Diaa Badawi, Ishaan Bassi, Sule Ozev, Ahmet Enis Çetin
2022 J jnl
Digital Fault-based Built-in Self-test and Evaluation of Low Dropout Voltage Regulators.
ACM J. Emerg. Technol. Comput. Syst.
Mehmet Ince, Bora Bilgic, Sule Ozev
2022 Misc conf
Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants.
VTS
Daniel W. Gulick, Yuna Jung, Seunghyun Lee, Sule Ozev, Jennifer Blain Christen
2022 Misc conf
Fast RF Mismatch Calibration Using Built-in Detectors.
VTS
Muslum Emir Avci, Sule Ozev, Y. B. Chethan Kumar
2022 A conf
Guaranteed Activation of Capacitive Trojan Triggers During Post Production Test via Supply Pulsing.
DATE
Bora Bilgic, Sule Ozev
2022 Misc conf
Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components.
VTS
Bora Bilgic, Sule Ozev
2021 A conf
Background Receiver IQ Imbalance Correction for in-Field and Post-Production Testing and Calibration.
ITC
Muslum Emir Avci, Sule Ozev
2021 Misc conf
Discrete Cosine Transform Based Causal Convolutional Neural Network for Drift Compensation in Chemical Sensors.
ICASSP
Diaa Badawi, Agamyrat Agambayev, Sule Ozev, A. Enis Çetin
2021 J jnl
Fault-based Built-in Self-test and Evaluation of Phase Locked Loops.
ACM Trans. Design Autom. Electr. Syst.
Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2021 Misc conf
Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration.
VTS
Ishaan Bassi, Sule Ozev, Doohwang Chang
2021 J jnl
Malicious Activity Detection in Lightweight Wearable and IoT Devices Using Signal Stitching.
Sensors
Fatih Karabacak, Ümit Y. Ogras, Sule Ozev
2020 A conf
A Crowd-Based Explosive Detection System with Two-Level Feedback Sensor Calibration.
ICCAD
Chengmo Yang, Patrick Cronin, Agamyrat Agambayev, Sule Ozev, A. Enis Çetin, Alex Orailoglu
2020 J jnl
A Reconfigurable 0.1-10 MHz DT Passive Dynamic Zoom ADC for Cellular Receivers.
IEEE Trans. Circuits Syst. I Regul. Pap.
Osman Emir Erol, Sule Ozev
2020 A conf
Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections.
ITC
Muslum Emir Avci, Sule Ozev
2020 J jnl
Determining Mechanical Stress Testing Parameters for FHE Designs with Low Computational Overhead.
IEEE Des. Test
Ganapati Bhat, Hang Gao, Sumit K. Mandal, Ümit Y. Ogras, Sule Ozev
2020 B conf
Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators.
ETS
Mehmet Ince, Sule Ozev
2020 — conf
Enabling Large-scale Fine-grained Simulation of IED Vapor Concentration in Open-air Environments.
MWSCAS
Agamyrat Agambayev, Christopher Lue Sang, Jennifer Blain Christen, Sule Ozev
2020 J jnl
Energy-Efficient Image Recognition System for Marine Life.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
H. Seckin Demir, Jennifer Blain Christen, Sule Ozev
2020 J jnl
In-Field Recovery of RF Circuits from Wearout Based Performance Degradation.
IEEE Trans. Emerg. Top. Comput.
Doohwang Chang, Jennifer N. Kitchen, Sayfe Kiaei, Sule Ozev
2020 — conf
Self-Interference Signal Path Characterization in Full-Duplex Transceivers Using Built-in Self-Test.
RWS
Debatrayee Roychowdhury, Soroush Moallemi, Sule Ozev, Jennifer Kitchen
2020 J jnl
Self-Powered Wearable IoT Devices for Health and Activity Monitoring.
Found. Trends Electron. Des. Autom.
Ganapati Bhat, Ujjwal Gupta, Yigit Tuncel, Fatih Karabacak, Sule Ozev, Ümit Y. Ogras
2019 J jnl
Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements.
ACM Trans. Design Autom. Electr. Syst.
Yanjun Li, Ender Yilmaz, Pete Sarson, Sule Ozev
2019 J jnl
An In-Field Programmable Adaptive CMOS LNA for Intelligent IOT Sensor Node Applications.
CoRR
Maryam Shafiee, Sule Ozev
2019 J jnl
Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas.
J. Electron. Test.
Maryam Shafiee, Sule Ozev
2019 J jnl
Detecting Gas Vapor Leaks Using Uncalibrated Sensors.
IEEE Access
Diaa Badawi, Tuba Ayhan, Sule Ozev, Chengmo Yang, Alex Orailoglu, Ahmet Enis Çetin
2019 J jnl
Detecting Gas Vapor Leaks Using Uncalibrated Sensors.
CoRR
Diaa Badawi, Tuba Ayhan, Sule Ozev, Chengmo Yang, Alex Orailoglu, A. Enis Çetin
2019 Misc conf
Detecting Gas Vapor Leaks through Uncalibrated Sensor Based CPS.
ICASSP
Diaa Badawi, Sule Ozev, Jennifer Blain Christen, Chengmo Yang, Alex Orailoglu, A. Enis Çetin
2019 B conf
Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection.
ETS
Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2019 J jnl
Knowledge- and Simulation-Based Synthesis of Area-Efficient Passive Loop Filter Incremental Zoom-ADC for Built-In Self-Test Applications.
ACM Trans. Design Autom. Electr. Syst.
Osman Emir Erol, Sule Ozev
2019 J jnl
On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration.
IEEE Des. Test
Jae Woong Jeong, Jennifer Kitchen, Sule Ozev
2019 Misc conf
Optimized Stress Testing for Flexible Hybrid Electronics Designs.
VTS
Hang Gao, Ganapati Bhat, Ümit Y. Ogras, Sule Ozev
2019 Misc conf
PCB Hardware Trojans: Attack Modes and Detection Strategies.
VTS
Matthew McGuire, Ümit Y. Ogras, Sule Ozev
2018 J jnl
A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters.
ACM Trans. Design Autom. Electr. Syst.
Maryam Shafiee, Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Bertan Bakkaloglu, Sule Ozev
2018 Misc conf
A built-in self-test technique for transmitter-only systems.
VTS
Maryam Shafiee, Jennifer N. Kitchen, Sule Ozev
2018 J jnl
Detection Mechanisms for Unauthorized Wireless Transmissions.
ACM Trans. Design Autom. Electr. Syst.
Doohwang Chang, Ganapati Bhat, Ümit Y. Ogras, Bertan Bakkaloglu, Sule Ozev
2018 — conf
Enabling fast process variation and fault simulation through macromodelling of analog components.
NATW
Mehmet Ince, Ender Yilmaz, Sule Ozev
2018 J jnl
Online Built-In Self-Test of High Switching Frequency DC-DC Converters Using Model Reference Based System Identification Techniques.
IEEE Trans. Circuits Syst. I Regul. Pap.
Navankur Beohar, Venkata N. K. Malladi, Debashis Mandal, Sule Ozev, Bertan Bakkaloglu
2018 Misc conf
Online information utility assessment for per-device adaptive test flow.
VTS
Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev
2018 Misc conf
RF circuit authentication for detection of process Trojans.
VTS
Fatih Karabacak, Richard Welker, Matthew J. Casto, Jennifer N. Kitchen, Sule Ozev
2018 J jnl
Remote Detection of Unauthorized Activity via Spectral Analysis.
ACM Trans. Design Autom. Electr. Syst.
Fatih Karabacak, Ümit Y. Ogras, Sule Ozev
2018 Misc conf
Special session on BIST/calibration of A/MS devices.
VTS
Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson
2017 J jnl
A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources.
ACM Trans. Design Autom. Electr. Syst.
Jae Woong Jeong, Vishwanath Natarajan, Shreyas Sen, T. M. Mak, Jennifer Kitchen, Sule Ozev
2017 J jnl
Adaptive Reduction of the Frequency Search Space for Multi-V
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Chandra K. H. Suresh, Sule Ozev, Ozgur Sinanoglu
2017 A conf
Built-in self-test for stability measurement of low dropout regulator.
ITC
Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev
2017 B conf
Contact-less near-field measurement of RF phased array antenna mismatches.
ETS
Maryam Shafiee, Sule Ozev
2017 — conf
Evaluation of loop transfer function based dynamic testing of LDOs.
ITC-Asia
Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev
2017 C conf
Receiver echo cancellation with real-time self calibration for passive implanted neuron recorders.
ISCAS
Maryam Shafiee, Sule Ozev
2017 Misc conf
Remote detection of unauthorized activity via spectral analysis: work-in-progress.
CODES+ISSS
Fatih Karabacak, Ümit Y. Ogras, Sule Ozev
2017 — conf
Statistical library characterization using arbitrary polynomial chaos.
LASCAS
Mehmet Ince, Sule Ozev, Sarma B. K. Vrudhula
2016 J jnl
A Comparator-Based Rail Clamp.
IEEE Trans. Very Large Scale Integr. Syst.
Ramachandran Venkatasubramanian, Kent Oertle, Sule Ozev
2016 J jnl
Adapting to Varying Distribution of Unknown Response Bits.
ACM Trans. Design Autom. Electr. Syst.
Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev
2016 J jnl
Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers.
IEEE Trans. Very Large Scale Integr. Syst.
Jae Woong Jeong, Afsaneh Nassery, Jennifer N. Kitchen, Sule Ozev
2016 J jnl
Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits.
IEEE Trans. Very Large Scale Integr. Syst.
Doohwang Chang, Jennifer N. Kitchen, Bertan Bakkaloglu, Sayfe Kiaei, Sule Ozev
2016 — conf
Detection of malicious hardware components in mobile platforms.
ISQED
Fatih Karabacak, Ümit Y. Ogras, Sule Ozev
2016 — conf
Making unreliable Chem-FET sensors smart via soft calibration.
ISQED
Fatih Karabacak, Uwadiae Obahiagbon, Ümit Y. Ogras, Sule Ozev, Jennifer Blain Christen
2016 A conf
Multi-objective design optimization for flexible hybrid electronics.
ICCAD
Ganapati Bhat, Ujjwal Gupta, Nicholas Tran, Jaehyun Park, Sule Ozev, Ümit Y. Ogras
2016 C conf
Post-production adaptation of RF circuits for application-specific performance metrics.
ISCAS
Doohwang Chang, Jennifer Kitchen, Sule Ozev
2016 J jnl
Process Independent Design Methodology for the Active RC and Single-Inverter-Based Rail Clamp.
ACM Trans. Design Autom. Electr. Syst.
Ramachandran Venkatasubramanian, Robert Elio, Sule Ozev
2016 Misc conf
Process independent gain measurement with low overhead via BIST/DUT co-design.
VTS
Jae Woong Jeong, Jennifer Kitchen, Sule Ozev
2016 J jnl
Rail Clamp with Dynamic Time-Constant Adjustment.
IEEE J. Solid State Circuits
Ramachandran Venkatasubramanian, Kent Oertle, Sule Ozev
2015 A conf
A self-compensating built-in self-test solution for RF phased array mismatch.
ITC
Jae Woong Jeong, Jennifer Kitchen, Sule Ozev
2015 J jnl
Adaptive Generation of Unique IDs for Digital Chips through Analog Excitation.
ACM Trans. Design Autom. Electr. Syst.
Chandra K. H. Suresh, Sule Ozev, Ozgur Sinanoglu
2015 J jnl
Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation.
IEEE Des. Test
Ender Yilmaz, Sule Ozev
2015 J jnl
Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector.
IEEE Trans. Very Large Scale Integr. Syst.
Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani
2015 Misc conf
Disturbance-free BIST for loop characterization of DC-DC buck converters.
VTS
Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Philippe Adell, Bert Vermeire, Bertan Bakkaloglu, Sule Ozev
2015 Misc conf
Enabling unauthorized RF transmission below noise floor with no detectable impact on primary communication performance.
VTS
Doohwang Chang, Bertan Bakkaloglu, Sule Ozev
2015 A conf
On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC.
DATE
Osman Emir Erol, Sule Ozev, Chandra K. H. Suresh, Rubin A. Parekhji, Lakshmanan Balasubramanian
2015 Misc conf
Panel: Analog/RF BIST: Are we there yet?
VTS
Sule Ozev, Linda Milor
2015 B conf
Robust amplitude measurement for RF BIST applications.
ETS
Jae Woong Jeong, Jennifer Kitchen, Sule Ozev
2014 Misc conf
A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters.
VTS
Tao Liu, Chao Fu, Sule Ozev, Bertan Bakkaloglu
2014 A conf
Approximating the age of RF/analog circuits through re-characterization and statistical estimation.
DATE
Doohwang Chang, Sule Ozev, Ozgur Sinanoglu, Ramesh Karri
2014 J jnl
Built-In EVM Measurement With Negligible Hardware Overhead.
IEEE Des. Test
Ender Yilmaz, Afsaneh Nassery, Sule Ozev
2014 A conf
Built-in self-test and characterization of polar transmitter parameters in the loop-back mode.
DATE
Jae Woong Jeong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, Mustapha Slamani
2014 Misc conf
Development and empirical verification of an accuracy model for the power down leakage tests.
VTS
Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao
2014 Misc conf
Reliability enhancement using in-field monitoring and recovery for RF circuits.
VTS
Doohwang Chang, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Engin Afacan, Günhan Dündar
2014 Misc conf
Special session 4B: Panel: Testing and calibration for power management circuits.
VTS
Sule Ozev, Bertan Bakkaloglu
2013 B conf
Adaptive quality binning for analog circuits.
ETS
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2013 A conf
Adaptive reduction of the frequency search space for multi-vdd digital circuits.
DATE
Chandra K. H. Suresh, Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu
2013 B conf
Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion.
ETS
Afsaneh Nassery, Sule Ozev, Mustapha Slamani
2013 J jnl
Efficient Process Shift Detection and Test Realignment.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2013 A conf
Electrical calibration of spring-mass MEMS capacitive accelerometers.
DATE
Lingfei Deng, Vinay Kundur, Naveen Sai Jangala Naga, Muhlis Kenan Ozel, Ender Yilmaz, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Divya Pratab, Tehmoor Dar
2013 A conf
Fault analysis and simulation of large scale industrial mixed-signal circuits.
DATE
Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev
2013 Misc conf
Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters.
VTS
Jae Woong Jeong, Sule Ozev, Shreyas Sen, T. M. Mak
2013 J jnl
Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring.
IEEE Trans. Very Large Scale Integr. Syst.
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2013 A conf
Zero-overhead self test and calibration of RF transceivers.
ITC
Afsaneh Nassery, Jae Woong Jeong, Sule Ozev
2012 B conf
Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information.
ETS
Ender Yilmaz, Sule Ozev
2012 B conf
Adaptive testing of chips with varying distributions of unknown response bits.
ETS
Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev
2012 B conf
Adaptive testing: Conquering process variations.
ETS
Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell
2012 A conf
An analytical technique for characterization of transceiver IQ imbalances in the loop-back mode.
DATE
Afsaneh Nassery, Sule Ozev
2012 Misc conf
Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector.
VTS
Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani
2012 J jnl
Test Application for Analog/RF Circuits With Low Computational Burden.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ender Yilmaz, Sule Ozev
2012 J jnl
Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Afsaneh Nassery, Osman Emir Erol, Sule Ozev, Marian Verhelst
2011 J jnl
A Multi-Site Test Solution for Quadrature Modulation RF Transceivers.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Erdem Serkan Erdogan, Sule Ozev
2011 J jnl
Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation.
J. Electron. Test.
Gurusubrahmaniyan Subrahmaniyan Radhakrishnan, Sule Ozev
2011 A conf
Adaptive multidimensional outlier analysis for analog and mixed signal circuits.
ITC
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2011 Misc conf
An industrial case study of analog fault modeling.
VTS
Ender Yilmaz, Anne Meixner, Sule Ozev
2011 B conf
Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study.
ETS
Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev
2011 B conf
Extraction of EVM from Transmitter System Parameters.
ETS
Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani
2011 B conf
Fast and Accurate DPPM Computation Using Model Based Filtering.
ETS
Ender Yilmaz, Sule Ozev
2010 A conf
Adaptive test flow for mixed-signal/RF circuits using learned information from device under test.
ITC
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2010 B conf
Defect filter for alternate RF test.
ETS
Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev
2010 J jnl
Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST.
IEEE Trans. Very Large Scale Integr. Syst.
Erdem Serkan Erdogan, Sule Ozev
2010 J jnl
Low Cost MIMO Testing for RF Integrated Circuits.
IEEE Trans. Very Large Scale Integr. Syst.
Erkan Acar, Sule Ozev
2009 Misc conf
A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources.
VTS
Erdem Serkan Erdogan, Sule Ozev
2009 A* conf
Adaptive test elimination for analog/RF circuits.
DAC
Ender Yilmaz, Sule Ozev
2009 A conf
Built-in EVM measurement for OFDM transceivers using all-digital DFT.
ITC
Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar
2009 B conf
Defect Filter for Alternate RF Test.
ETS
Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev
2009 C conf
Defect-based test optimization for analog/RF circuits for near-zero DPPM applications.
ICCD
Ender Yilmaz, Sule Ozev
2009 J jnl
Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Erkan Acar, Sule Ozev
2009 J jnl
Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs.
IEEE Trans. Very Large Scale Integr. Syst.
Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar
2008 J jnl
Defect-Oriented Testing of RF Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Erkan Acar, Sule Ozev
2008 C conf
Diagnosis of assembly failures for System-in-Package RF tuners.
ISCAS
Erdem Serkan Erdogan, Sule Ozev, Philippe Cauvet
2008 C conf
Dynamic test scheduling for analog circuits for improved test quality.
ICCD
Ender Yilmaz, Sule Ozev
2008 A conf
Optimized EVM Testing for IEEE 802.11a/n RF ICs.
ITC
Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler
2008 J jnl
Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling.
ACM Trans. Design Autom. Electr. Syst.
Fang Liu, Sule Ozev, Plamen K. Nikolov
2008 — conf
Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetching.
Conf. Computing Frontiers
Bogdan F. Romanescu, Michael E. Bauer, Sule Ozev, Daniel J. Sorin
2008 Misc conf
Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers.
VTS
Erdem Serkan Erdogan, Sule Ozev
2007 Misc conf
A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up.
VTS
Erkan Acar, Sule Ozev, Kevin B. Redmond
2007 — conf
AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs.
ASP-DAC
Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar
2007 A conf
An ADC-BiST scheme using sequential code analysis.
DATE
Erdem Serkan Erdogan, Sule Ozev
2007 J jnl
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown
CoRR
Jonathan R. Carter, Sule Ozev, Daniel J. Sorin
2007 C conf
Digital calibration of RF transceivers for I-Q imbalances and nonlinearity.
ICCD
Erkan Acar, Sule Ozev
2007 A conf
Efficient simulation of parametric faults for multi-stage analog circuits.
ITC
Fang Liu, Sule Ozev
2007 J jnl
Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup.
IEEE Trans. Very Large Scale Integr. Syst.
Erkan Acar, Sule Ozev
2007 — conf
Lazy Error Detection for Microprocessor Functional Units.
DFT
Mahmut Yilmaz, Albert Meixner, Sule Ozev, Daniel J. Sorin
2007 A conf
Low cost characterization of RF transceivers through IQ data analysis.
ITC
Erkan Acar, Sule Ozev
2007 C conf
Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor.
ICCD
Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz
2007 J jnl
Online diagnosis of hard faults in microprocessors.
ACM Trans. Archit. Code Optim.
Fred A. Bower, Daniel J. Sorin, Sule Ozev
2007 B conf
Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation.
PACT
Bogdan F. Romanescu, Michael E. Bauer, Daniel J. Sorin, Sule Ozev
2007 J jnl
Statistical Test Development for Analog Circuits Under High Process Variations.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Fang Liu, Sule Ozev
2007 J jnl
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
CoRR
Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty
2007 A conf
Test yield estimation for analog/RF circuits over multiple correlated measurements.
ITC
Fang Liu, Erkan Acar, Sule Ozev
2007 J jnl
VariaSim: simulating circuits and systems in the presence of process variability.
SIGARCH Comput. Archit. News
Bogdan F. Romanescu, Michael E. Bauer, Sule Ozev, Daniel J. Sorin
2006 A conf
A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise.
ITC
Erdem Serkan Erdogan, Sule Ozev
2006 — conf
Applying architectural vulnerability Analysis to hard faults in the microprocessor.
SIGMETRICS/Performance
Fred A. Bower, Derek Hower, Mahmut Yilmaz, Daniel J. Sorin, Sule Ozev
2006 J jnl
Concurrent testing of digital microfluidics-based biochips.
ACM Trans. Design Autom. Electr. Syst.
Fei Su, Sule Ozev, Krishnendu Chakrabarty
2006 C conf
Efficient Testing of RF MIMO Transceivers Used in WLAN Applications.
ICCD
Erkan Acar, Sule Ozev
2006 A conf
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers.
ICCAD
Erkan Acar, Sule Ozev, Kevin B. Redmond
2006 J jnl
Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Fang Liu, Sule Ozev, Martin A. Brooke
2006 Misc conf
Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework.
VTS
Fang Liu, Plamen K. Nikolov, Sule Ozev
2006 A conf
Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier.
ITC
Mahmut Yilmaz, Derek Hower, Sule Ozev, Daniel J. Sorin
2006 J jnl
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems.
J. Electron. Test.
Fei Su, Sule Ozev, Krishnendu Chakrabarty
2006 J jnl
Test infrastructure design for mixed-signal SOCs with wrapped analog cores.
IEEE Trans. Very Large Scale Integr. Syst.
Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
2005 C conf
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs.
ICCD
Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
2005 A* conf
A Mechanism for Online Diagnosis of Hard Faults in Microprocessors.
MICRO
Fred A. Bower, Daniel J. Sorin, Sule Ozev
2005 J jnl
Autonomic Microprocessor Execution via Self-Repairing Arrays.
IEEE Trans. Dependable Secur. Comput.
Fred A. Bower, Sule Ozev, Daniel J. Sorin
2005 A conf
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown.
DATE
Jonathan R. Carter, Sule Ozev, Daniel J. Sorin
2005 A conf
Defect-based RF testing using a new catastrophic fault model.
ITC
Erkan Acar, Sule Ozev
2005 Misc conf
Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements.
VTS
Erkan Acar, Sule Ozev
2005 C conf
Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits.
ICCD
Fang Liu, Sule Ozev
2005 A conf
Hierarchical Variance Analysis for Analog Circuits Based on Graph Modelling and Correlation Loop Tracing.
DATE
Fang Liu, Jacob J. Flomenberg, Devaka V. Yasaratne, Sule Ozev
2005 — conf
Hierarchical analysis of process variation for mixed-signal systems.
ASP-DAC
Fang Liu, Sule Ozev
2005 A conf
Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions.
ICCAD
Erkan Acar, Sule Ozev
2005 A conf
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores.
DATE
Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty
2004 A conf
Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis.
ITC
Erkan Acar, Sule Ozev
2004 J jnl
Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead.
IEEE Trans. Very Large Scale Integr. Syst.
Sule Ozev, Alex Orailoglu
2004 A conf
Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search.
ICCAD
Fang Liu, Sule Ozev, Martin A. Brooke
2004 C conf
End-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths.
ICCD
Sule Ozev, Alex Orailoglu
2004 J jnl
Seamless Test of Digital Components in Mixed-Signal Paths.
IEEE Des. Test Comput.
Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu
2004 B conf
Test planning and test resource optimization for droplet-based microfluidic systems.
ETS
Fei Su, Sule Ozev, Krishnendu Chakrabarty
2004 A conf
Tolerating Hard Faults in Microprocessor Array Structures.
DSN
Fred A. Bower, Paul G. Shealy, Sule Ozev, Daniel J. Sorin
2004 Misc conf
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures.
VTS
Sule Ozev, Christian Olgaard
2003 J jnl
Statistical Tolerance Analysis for Assured Analog Test Coverage.
J. Electron. Test.
Sule Ozev, Alex Orailoglu
2003 A conf
TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers.
ICCAD
Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
2003 A conf
Testing of Droplet-Based Microelectrofluidic Systems.
ITC
Fei Su, Sule Ozev, Krishnendu Chakrabarty
2002 — conf
An Integrated Tool for Analog Test Generation and Fault Simulation.
ISQED
Sule Ozev, Alex Orailoglu
2002 — conf
Automated test development and test time reduction for RF subsystems.
ISCAS (1)
Sule Ozev, Alex Orailoglu, Hosam Haggag
2002 Misc conf
Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis.
VTS
Sule Ozev, Alex Orailoglu
2002 C conf
Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits.
ICCD
Sule Ozev, Alex Orailoglu
2002 J jnl
Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers.
IEEE Des. Test Comput.
Sule Ozev, Christian Olgaard, Alex Orailoglu
2001 A conf
Testability implications in low-cost integrated radio transceivers: a Bluetooth case study.
ITC
Christian Olgaard, Sule Ozev, Alex Orailoglu
2000 — conf
Block-Based Test Integration for Analog Integrated Circuits.
LATW
Sule Ozev, Alex Orailoglu
2000 Misc conf
Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems.
VTS
Sule Ozev, Alex Orailoglu
2000 A conf
Test Synthesis for Mixed-Signal SOC Paths.
DATE
Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu
1999 — conf
Low-Cost Test for Large Analog IC's.
DFT
Sule Ozev, Alex Orailoglu