Sukeshwar Kannan

22 papers A 4C 5Misc 1Journal 8Unranked 4
YearRankTypeTitle / Venue / Authors
2022 J jnl
Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs.
ACM J. Emerg. Technol. Comput. Syst.
Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Heechun Park, Bon Woong Ku, Sukeshwar Kannan, Krishnendu Chakrabarty, Sung Kyu Lim
2020 — conf
Accelerating Artificial Intelligence with Silicon Photonics.
OFC
Nicholas C. Harris, Ryan Braid, Darius Bunandar, Jim Carr, Brad Dobbie, Carlos Dorta-Quinones, Jon Elmhurst, Martin Forsythe, Michael Gould, Shashank Gupta, Sukeshwar Kannan, Tyler Kenney, Gary Kong, Tomo Lazovich, Scott McKenzie, Carl Ramey, Chithira Ravi, Michael Scott, John Sweeney, Ozgur Yildirim, Katrina Zhang
2019 J jnl
A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
2019 — conf
Compact Scalable Dynamic TSV IR Drop Compensation for Power Delivery in 3D Packages.
MWSCAS
Arjun Chaudhuri, Sukeshwar Kannan, Luke England, Jack Golz
2017 C conf
A Design-for-Test Solution for Monolithic 3D Integrated Circuits.
ICCD
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
2017 C conf
Design of a digital IP for 3D-IC die-to-die clock synchronization.
ISCAS
Mehdi Sadi, Sukeshwar Kannan, Luke England, Mark Tehranipoor
2017 J jnl
Impact of Electrostatic Coupling and Wafer-Bonding Defects on Delay Testing of Monolithic 3D Integrated Circuits.
ACM J. Emerg. Technol. Comput. Syst.
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
2017 J jnl
Prebond Testing and Test-Path Design for the Silicon Interposer in 2.5-D ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ran Wang, Zipeng Li, Sukeshwar Kannan, Krishnendu Chakrabarty
2017 J jnl
SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Mehdi Sadi, Sukeshwar Kannan, LeRoy Winemberg, Mark Tehranipoor
2016 — conf
Impact of TSV integration on 14nm FinFET device performance.
3DIC
Luke England, Sukeshwar Kannan, Rahul Agarwal, Daniel Smith
2016 A conf
Power delivery in 3D packages: current crowding effects, dynamic IR drop and compensation network using sensors (invited paper).
ICCAD
Sukeshwar Kannan, Mehdi Sadi, Luke England
2016 A conf
Pre-bond testing of the silicon interposer in 2.5D ICs.
DATE
Ran Wang, Zipeng Li, Sukeshwar Kannan, Krishnendu Chakrabarty
2015 — conf
Device performance analysis on 20nm technology thin wafers in a 3D package.
IRPS
Sukeshwar Kannan, Rahul Agarwal, Arnaud Bousquet, Geetha Aluri, Hui-Shan Chang
2013 C conf
Development of hybrid electrical model for CNT based Through Silicon Vias.
ISCAS
Kaushal Kannan, Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho
2013 Misc conf
Physics Based Fault Models for Testing High-Voltage LDMOS.
VLSI Design
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian
2013 J jnl
Physics-Based Low-Cost Test Technique for High Voltage LDMOS.
J. Electron. Test.
Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi
2012 C conf
Analysis of propagation delay in 3 - D stacked DRAM.
ISCAS
Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho, Byoungchul Ahn
2012 J jnl
Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects.
J. Electron. Test.
Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn
2012 C conf
Modeling and characterization of CNT-based TSV for high frequency applications.
ISCAS
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Seok-Ho Noh, Li Li, Sang-Bock Cho
2011 J jnl
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme.
J. Electron. Test.
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force
2010 A conf
RADPro: Automatic RF analyzer and diagnostic program generation tool.
ITC
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed
2009 A conf
Automatic diagnostic tool for Analog-Mixed Signal and RF load boards.
ITC
Sukeshwar Kannan, Bruce C. Kim