| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Reliab.
|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
An Extended Gamma Process for Accelerated Destructive Degradation Test: Modeling and Optimal Design.
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Technometrics
|
| 2024 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Comput. Ind. Eng.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2021 | J | jnl |
Superposed Poisson process models with a modified bathtub intensity function for repairable systems.
IISE Trans.
|
| 2021 | J | jnl |
Comput. Ind. Eng.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Comput. Ind. Eng.
|
| 2020 | J | jnl |
Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits.
IEEE Trans. Reliab.
|
| 2020 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
IEEE Trans. Reliab.
|
| 2018 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
Appl. Intell.
|
| 2016 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2016 | J | jnl |
IEEE Trans. Reliab.
|
| 2016 | J | jnl |
J. Comput. Sci.
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2015 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2015 | J | jnl |
IEEE Trans. Reliab.
|
| 2013 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2013 | J | jnl |
Comput. Ind. Eng.
|
| 2013 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2012 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2011 | J | jnl |
Comput. Ind. Eng.
|
| 2011 | J | jnl |
IEEE Trans. Reliab.
|
| 2010 | J | jnl |
IEEE Trans. Reliab.
|
| 2009 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part C
|
| 2008 | J | jnl |
IEEE Trans. Reliab.
|
| 2007 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2007 | J | jnl |
IEEE Trans. Reliab.
|
| 2007 | J | jnl |
IEEE Trans. Reliab.
|
| 2006 | — | conf |
ICONIP (2)
|
| 2004 | J | jnl |
Technometrics
|