Sudhansu S. Maiti

12 papers Journal 12
YearRankTypeTitle / Venue / Authors
2025 J jnl
Bayesian estimation of unified generalized process capability index for logistic-exponential distribution under progressive type II censoring scheme.
Eng. Appl. Artif. Intell.
Mahendra Saha, Abhimanyu Singh Yadav, Amartya Bhattacharya, Sudhansu S. Maiti, Arindam Gupta
2024 J jnl
Evaluation of a novel loss-based process capacity index ${\mathcal {S}}^{\prime }_{pk}$ and its applications.
Int. J. Syst. Assur. Eng. Manag.
Mahendra Saha, Anju Devi, Abhimanyu Singh Yadav, Sudhansu S. Maiti
2021 J jnl
Acceptance sampling inspection plan for the Lindley and power Lindley distributed quality characteristics.
Int. J. Syst. Assur. Eng. Manag.
Mahendra Saha, Harsh Tripathi, Sanku Dey, Sudhansu S. Maiti
2019 J jnl
Bootstrap confidence intervals of
Int. J. Syst. Assur. Eng. Manag.
Mahendra Saha, Sanku Dey, Sudhansu S. Maiti
2019 J jnl
Parameter estimates of general failure rate model: A Bayesian approach.
J. Comput. Appl. Math.
Asok K. Nanda, Sudhansu S. Maiti, Chanchal Kundu, Amarjit Kundu
2018 J jnl
Bootstrap confidence intervals of generalized process capability index Cpyk for Lindley and power Lindley distributions.
Commun. Stat. Simul. Comput.
Sanku Dey, Mahendra Saha, Sudhansu S. Maiti, Chi-Hyuck Jun
2018 J jnl
On Properties and Applications of a Two-Parameter Xgamma Distribution.
J. Stat. Theory Appl.
Subhradev Sen, N. Chandra, Sudhansu S. Maiti
2018 J jnl
On estimation of the PDF and CDF of the Lindley distribution.
Commun. Stat. Simul. Comput.
Sudhansu S. Maiti, Indrani Mukherjee
2018 J jnl
Survival estimation in xgamma distribution under progressively type-II right censored scheme.
Model. Assist. Stat. Appl.
Subhradev Sen, N. Chandra, Sudhansu S. Maiti
2013 J jnl
Bayesian inference for Maxwell distribution under conjugate prior.
Model. Assist. Stat. Appl.
Sanku Dey, Tanujit Dey, Sudhansu S. Maiti
2007 J jnl
A new characterization of geometric distribution.
Kybernetika
Sudhansu S. Maiti, Atanu Biswas
2007 J jnl
Rényi information measure for a used item.
Inf. Sci.
Asok K. Nanda, Sudhansu S. Maiti