Subhasish Mitra

282 papers A* 24A 68B 6C 15Misc 26Journal 98Unranked 45

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	AI+HW 2035: Shaping the Next Decade. CoRR Deming Chen, Jason Cong, Azalia Mirhoseini, Christos Kozyrakis, Subhasish Mitra, Jinjun Xiong, Cliff Young, Anima Anandkumar, Michael L. Littman, Aron Kirschen, Sophia Shao, Serge Leef, Naresh R. Shanbhag, Dejan S. Milojicic, Michael Schulte, Gert Cauwenberghs, Jerry M. Chow, Tri Dao, Kailash Gopalakrishnan, Richard Ho, Hoshik Kim, Kunle Olukotun, David Z. Pan, Mark Ren, Dan Roth, Aarti Singh, Yizhou Sun, Yusu Wang, Yann LeCun, Ruchir Puri
2026	J	`jnl`	Report for NSF Workshop on AI for Electronic Design Automation. CoRR Deming Chen, Vijay Ganesh, Weikai Li, Yingyan Celine Lin, Yong Liu, Subhasish Mitra, David Z. Pan, Ruchir Puri, Jason Cong, Yizhou Sun
2025	J	`jnl`	CLEAR Cross-Layer Resilience: A Retrospective. IEEE Des. Test Eric Cheng, Hyungmin Cho, Shahrzad Mirkhani, Lukasz G. Szafaryn, Jacob A. Abraham, Pradip Bose, Chen-Yong Cher, Klas Lilja, Kevin Skadron, Mircea Stan, Subhasish Mitra
2025	A	`conf`	IC-PEPR: PEPR Testing Goes Intra-Cell. ITC Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. (Shawn) Blanton
2025	J	`jnl`	MINOTAUR: A Posit-Based 0.42-0.50-TOPS/W Edge Transformer Inference and Training Accelerator. IEEE J. Solid State Circuits Kartik Prabhu, Robert M. Radway, Jeffrey Yu, Kai Bartolone, Massimo Giordano, Fabian Peddinghaus, Yonatan Urman, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Subhasish Mitra, Priyanka Raina
2025	J	`jnl`	Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing. CoRR Subhasish Mitra, Subho S. Banerjee, Martin Dixon, Rama Govindaraju, Peter H. Hochschild, Eric X. Liu, Bharath Parthasarathy, Parthasarathy Ranganathan
2025	J	`jnl`	Silent Data Corruption by 10× Test Escapes Threatens Reliable Computing. IEEE Des. Test Subhasish Mitra, Subho S. Banerjee, Martin Dixon, Mike Fuller, Rama Govindaraju, Peter Hochschild, Eric X. Liu, Bharath Parthasarathy, Parthasarathy Ranganathan
2025	J	`jnl`	The Future of Memory: Limits and Opportunities. CoRR Samuel Dayo, Shuhan Liu, Peijing Li, Philip Levis, Subhasish Mitra, Thierry Tambe, David Tennenhouse, H.-S. Philip Wong
2024	J	`jnl`	EMBER: Efficient Multiple-Bits-Per-Cell Embedded RRAM Macro for High-Density Digital Storage. IEEE J. Solid State Circuits Akash Levy, Luke R. Upton, Michael D. Scott, Dennis Rich, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Subhasish Mitra, Boris Murmann, Priyanka Raina
2024	A	`conf`	Efficient Ultra-Dense 3D IC Power Delivery and Cooling Using 3D Thermal Scaffolding. ICCAD Dennis Rich, Tathagata Srimani, Mohamadali Malakoutian, Srabanti Chowdhury, Subhasish Mitra
2024	B	`conf`	Faulty Function Extraction for Defective Circuits. ETS Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. Shawn Blanton
2024	J	`jnl`	Future Design Direction for SRAM Data Array: Hierarchical Subarray With Active Interconnect. IEEE Trans. Circuits Syst. I Regul. Pap. Hsiao-Hsuan Liu, Carlo Gilardi, Shairfe Muhammad Salahuddin, Zhenlin Pei, Pieter Schuddinck, Yang Xiang, Pieter Weckx, Geert Hellings, Marie Garcia Bardon, Julien Ryckaert, Chenyun Pan, Subhasish Mitra, Francky Catthoor
2024	—	`conf`	High Performance Transistor of Aligned Carbon Nanotubes in a Nanosheet Structure. VLSI Technology and Circuits Nathaniel Safron, Tzu-Ang Chao, Shengman Li, Shreyam Natani, San Lin Liew, Carlo Gilardi, Hsin-Yuan Chiu, Sheng-Kai Su, Andrew Bechdolt, Gilad Zeevi, Zichen Zhang, Matthias Passlack, Vincent D.-H. Hou, Harshil Kashyap, Chao-Hsin Chien, Prabhakar Bandaru, Andrew C. Kummel, H.-S. Philip Wong, Subhasish Mitra, Gregory Pitner, Iuliana P. Radu
2024	—	`conf`	MINOTAUR: An Edge Transformer Inference and Training Accelerator with 12 MBytes On-Chip Resistive RAM and Fine-Grained Spatiotemporal Power Gating. VLSI Technology and Circuits Kartik Prabhu, Robert M. Radway, Y. Jeffrey, Kai Bartolone, Massimo Giordano, Fabian Peddinghaus, Yonatan Urman, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Subhasish Mitra, Priyanka Raina
2024	J	`jnl`	Next-generation Probabilistic Computing Hardware with 3D MOSAICs, Illusion Scale-up, and Co-design. CoRR Tathagata Srimani, Robert M. Radway, Masoud Mohseni, Kerem Yunus Çamsari, Subhasish Mitra
2024	J	`jnl`	Omni 3D: BEOL-Compatible 3D Logic with Omnipresent Power, Signal, and Clock. CoRR Suhyeong Choi, Carlo Gilardi, Paul Gutwin, Robert M. Radway, Tathagata Srimani, Subhasish Mitra
2024	B	`conf`	Silent Data Corruption: Test or Reliability Problem? ETS Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen
2024	J	`jnl`	VLSI Test and Trust Roundtable. IEEE Des. Test Ramesh Karri, Janusz Rajski, Rob Aitken, Subhasish Mitra, Mark Tehranipoor
2023	J	`jnl`	An Exhaustive Approach to Detecting Transient Execution Side Channels in RTL Designs of Processors. IEEE Trans. Computers Mohammad Rahmani Fadiheh, Alex Wezel, Johannes Müller, Jörg Bormann, Sayak Ray, Jason M. Fung, Subhasish Mitra, Dominik Stoffel, Wolfgang Kunz
2023	—	`conf`	Building high performance transistors on carbon nanotube channel. VLSI Technology and Circuits Gregory Pitner, Nathaniel Safron, Tzu-Ang Chao, Shengman Li, Sheng-Kai Su, Gilad Zeevi, Qing Lin, Hsin-Yuan Chiu, Matthias Passlack, Zichen Zhang, D. Mahaveer Sathaiya, Aslan Wei, Carlo Gilardi, Edward Chen, San Lin Liew, Vincent D.-H. Hou, Chung-Wei Wu, Jeff Wu, Zhiwei Lin, Jeffrey Fagan, Ming Zheng, Han Wang, Subhasish Mitra, H.-S. Philip Wong, Iuliana P. Radu
2023	—	`conf`	Dendrite-inspired Computing to Improve Resilience of Neural Networks to Faults in Emerging Memory Technologies. ICRC Lizy K. John, Felipe M. G. França, Subhasish Mitra, Zachary Susskind, Priscila M. V. Lima, Igor D. S. Miranda, Eugene B. John, Diego L. C. Dutra, Maurício Breternitz
2023	—	`conf`	EMBER: A 100 MHz, 0.86 mm ESSCIRC Luke R. Upton, Akash Levy, Michael D. Scott, Dennis Rich, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Subhasish Mitra, Priyanka Raina, Boris Murmann
2023	—	`conf`	Efficient Modeling and Calibration of Multi-Electrode Stimuli for Epiretinal Implants. NER Praful K. Vasireddy, Alex R. Gogliettino, Jeff B. Brown, Ramandeep S. Vilkhu, Sasidhar Madugula, A. J. Phillips, Subhasish Mitra, Pawel Hottowy, Alexander Sher, Alan M. Litke, Nishal P. Shah, E. J. Chichilnisky
2023	—	`conf`	Foundry Monolithic 3D BEOL Transistor + Memory Stack: Iso-performance and Iso-footprint BEOL Carbon Nanotube FET+RRAM vs. FEOL Silicon FET+RRAM. VLSI Technology and Circuits Tathagata Srimani, Andrew C. Yu, Robert M. Radway, Dennis Rich, Mark Nelson, Simon S. Wong, Denis Murphy, Samuel Fuller, Gage Hills, Subhasish Mitra, Max M. Shulaker
2023	A*	`conf`	G-QED: Generalized QED Pre-silicon Verification beyond Non-Interfering Hardware Accelerators. DAC Saranyu Chattopadhyay, Keerthikumara Devarajegowda, Bihan Zhao, Florian Lonsing, Brandon A. D'Agostino, Ioanna Vavelidou, Vijay Deep Bhatt, Sebastian Prebeck, Wolfgang Ecker, Caroline Trippel, Clark W. Barrett, Subhasish Mitra
2023	—	`conf`	MC-ELMM: Multi-Chip Endurance-Limited Memory Management. MEMSYS Andrew M. Bartolo, Mohamed M. Sabry Aly, George Michelogiannakis, Subhasish Mitra
2023	J	`jnl`	Micro/Nano Circuits and Systems Design and Design Automation: Challenges and Opportunities. Proc. IEEE Gert Cauwenberghs, Jason Cong, X. Sharon Hu, Siddharth Joshi, Subhasish Mitra, Wolfgang Porod, H.-S. Philip Wong
2023	A	`conf`	PBA: Percentile-Based Level Allocation for Multiple-Bits-Per-Cell RRAM. ICCAD Anjiang Wei, Akash Levy, Pu Yi, Robert M. Radway, Priyanka Raina, Subhasish Mitra, Sara Achour
2023	—	`conf`	Partitioned Temporal Dithering for Efficient Epiretinal Electrical Stimulation. NER Amrith Lotlikar, Nishal P. Shah, Alex R. Gogliettino, Ramandeep Vilkhu, Sasidhar Madugula, Lauren E. Grosberg, Pawel Hottowy, Alexander Sher, Alan M. Litke, E. J. Chichilnisky, Subhasish Mitra
2023	—	`conf`	Testbench on a Chip: A Yield Test Vehicle for Resistive Memory Devices. ISQED Luke R. Upton, Guénolé Lallement, Michael D. Scott, Joyce Taylor, Robert M. Radway, Dennis Rich, Mark Nelson, Subhasish Mitra, Boris Murmann
2023	A*	`conf`	Thermal Scaffolding for Ultra-Dense 3D Integrated Circuits. DAC Dennis Rich, Anna Kasperovich, Mohamadali Malakoutian, Robert M. Radway, Shiho Hagiwara, Takahide Yoshikawa, Srabanti Chowdhury, Subhasish Mitra
2023	A	`conf`	Ultra-Dense 3D Physical Design Unlocks New Architectural Design Points with Large Benefits. DATE Tathagata Srimani, Robert M. Radway, Jinwoo Kim, Kartik Prabhu, Dennis Rich, Carlo Gilardi, Priyanka Raina, Max M. Shulaker, Sung Kyu Lim, Subhasish Mitra
2022	J	`jnl`	CHIMERA: A 0.92-TOPS, 2.2-TOPS/W Edge AI Accelerator With 2-MByte On-Chip Foundry Resistive RAM for Efficient Training and Inference. IEEE J. Solid State Circuits Kartik Prabhu, Albert Gural, Zainab F. Khan, Robert M. Radway, Massimo Giordano, Kalhan Koul, Rohan Doshi, John W. Kustin, Timothy Liu, Gregorio B. Lopes, Victor Turbiner, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Guénolé Lallement, Boris Murmann, Subhasish Mitra, Priyanka Raina
2022	J	`jnl`	Innovating at Speed and at Scale: A Next Generation Infrastructure for Accelerating Semiconductor Technologies. CoRR Richard A. Gottscho, Edlyn V. Levine, Tsu-Jae King Liu, Paul C. McIntyre, Subhasish Mitra, Boris Murmann, Jan M. Rabaey, Sayeef S. Salahuddin, Willy C. Shih, H.-S. Philip Wong
2022	A	`conf`	PEPR: Pseudo-Exhaustive Physically-Aware Region Testing. ITC Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, Ronald D. Blanton
2022	J	`jnl`	Three-Dimensional Stacked Neural Network Accelerator Architectures for AR/VR Applications. IEEE Micro Lita Yang, Robert M. Radway, Yu-Hsin Chen, Tony F. Wu, Huichu Liu, Elnaz Ansari, Vikas Chandra, Subhasish Mitra, Edith Beigné
2021	J	`jnl`	An Exhaustive Approach to Detecting Transient Execution Side Channels in RTL Designs of Processors. CoRR Mohammad Rahmani Fadiheh, Alex Wezel, Johannes Müller, Jörg Bormann, Sayak Ray, Jason M. Fung, Subhasish Mitra, Dominik Stoffel, Wolfgang Kunz
2021	—	`conf`	CHIMERA: A 0.92 TOPS, 2.2 TOPS/W Edge AI Accelerator with 2 MByte On-Chip Foundry Resistive RAM for Efficient Training and Inference. VLSI Circuits Massimo Giordano, Kartik Prabhu, Kalhan Koul, Robert M. Radway, Albert Gural, Rohan Doshi, Zainab F. Khan, John W. Kustin, Timothy Liu, Gregorio B. Lopes, Victor Turbiner, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Guénolé Lallement, Boris Murmann, Subhasish Mitra, Priyanka Raina
2021	J	`jnl`	Effective Pre-Silicon Verification of Processor Cores by Breaking the Bounds of Symbolic Quick Error Detection. CoRR Karthik Ganesan, Florian Lonsing, Srinivasa Shashank Nuthakki, Eshan Singh, Mohammad Rahmani Fadiheh, Wolfgang Kunz, Dominik Stoffel, Clark W. Barrett, Subhasish Mitra
2021	B	`conf`	Scaling Up Hardware Accelerator Verification using A-QED with Functional Decomposition. FMCAD Saranyu Chattopadhyay, Florian Lonsing, Luca Piccolboni, Deepraj Soni, Peng Wei, Xiaofan Zhang, Yuan Zhou, Luca P. Carloni, Deming Chen, Jason Cong, Ramesh Karri, Zhiru Zhang, Caroline Trippel, Clark W. Barrett, Subhasish Mitra
2021	J	`jnl`	Scaling Up Hardware Accelerator Verification using A-QED with Functional Decomposition. CoRR Saranyu Chattopadhyay, Florian Lonsing, Luca Piccolboni, Deepraj Soni, Peng Wei, Xiaofan Zhang, Yuan Zhou, Luca P. Carloni, Deming Chen, Jason Cong, Ramesh Karri, Zhiru Zhang, Caroline Trippel, Clark W. Barrett, Subhasish Mitra
2021	J	`jnl`	Split-Chip Design to Prevent IP Reverse Engineering. IEEE Des. Test Samuel Pagliarini, Joseph Sweeney, Ken Mai, R. D. Shawn Blanton, Larry T. Pileggi, Subhasish Mitra
2020	J	`jnl`	A Density Metric for Semiconductor Technology [Point of View]. Proc. IEEE H.-S. Philip Wong, Kerem Akarvardar, Dimitri A. Antoniadis, Jeffrey Bokor, Chenming Hu, Tsu-Jae King Liu, Subhasish Mitra, James D. Plummer, Sayeef S. Salahuddin
2020	A*	`conf`	A Formal Approach for Detecting Vulnerabilities to Transient Execution Attacks in Out-of-Order Processors. DAC Mohammad Rahmani Fadiheh, Johannes Müller, Raik Brinkmann, Subhasish Mitra, Dominik Stoffel, Wolfgang Kunz
2020	B	`conf`	A Theoretical Framework for Symbolic Quick Error Detection. FMCAD Florian Lonsing, Subhasish Mitra, Clark W. Barrett
2020	J	`jnl`	A Theoretical Framework for Symbolic Quick Error Detection. CoRR Florian Lonsing, Subhasish Mitra, Clark W. Barrett
2020	A*	`conf`	A-QED Verification of Hardware Accelerators. DAC Eshan Singh, Florian Lonsing, Saranyu Chattopadhyay, Maxwell Strange, Peng Wei, Xiaofan Zhang, Yuan Zhou, Deming Chen, Jason Cong, Priyanka Raina, Zhiru Zhang, Clark W. Barrett, Subhasish Mitra
2020	A*	`conf`	DECOY: DEflection-Driven HLS-Based Computation Partitioning for Obfuscating Intellectual PropertY. DAC Jianqi Chen, Monir Zaman, Yiorgos Makris, R. D. Shawn Blanton, Subhasish Mitra, Benjamin Carrión Schäfer
2020	A	`conf`	Gap-free Processor Verification by S DATE Keerthikumara Devarajegowda, Mohammad Rahmani Fadiheh, Eshan Singh, Clark W. Barrett, Subhasish Mitra, Wolfgang Ecker, Dominik Stoffel, Wolfgang Kunz
2020	Misc	`conf`	Message from the Technical Program Co-Chairs. VLSID David Atienza, Subhasish Mitra, Manan Suri
2020	A	`conf`	Reconfigurable tiles of computing-in-memory SRAM architecture for scalable vectorization. ISLPED Roman Gauchi, Valentin Egloff, Maha Kooli, Jean-Philippe Noël, Bastien Giraud, Pascal Vivet, Subhasish Mitra, Henri-Pierre Charles
2020	J	`jnl`	Scanning the Issue. Proc. IEEE H.-S. Philip Wong, Kerem Akarvardar, Dimitri A. Antoniadis, Jeffrey Bokor, Chenming Hu, Tsu-Jae King Liu, Subhasish Mitra, James D. Plummer, Sayeef S. Salahuddin, Lei Deng, Xin-Guo Li, Song Han, Luping Shi, Yuan Xie, Elias Yaacoub, Mohamed-Slim Alouini, Ahmed Douik, Hayssam Dahrouj, Tareq Y. Al-Naffouri
2020	C	`conf`	Sensory Particles with Optical Telemetry. ISCAS Karthik Ganesan, Thomas A. Flores, Binh Q. Le, Dante G. Muratore, Neal A. Patel, Subhasish Mitra, Boris Murmann, Daniel Palanker
2019	—	`conf`	A 43pJ/Cycle Non-Volatile Microcontroller with 4.7μs Shutdown/Wake-up Integrating 2.3-bit/Cell Resistive RAM and Resilience Techniques. ISSCC Tony F. Wu, Binh Q. Le, Robert M. Radway, Andrew Bartolo, William Hwang, Seungbin Jeong, Haitong Li, Pulkit Tandon, Elisa Vianello, Pascal Vivet, Etienne Nowak, Mary Wootters, H.-S. Philip Wong, Mohamed M. Sabry Aly, Edith Beigné, Subhasish Mitra
2019	C	`conf`	A Data-Compressive Wired-OR Readout for Massively Parallel Neural Recording. ISCAS Dante G. Muratore, Pulkit Tandon, Mary Wootters, E. J. Chichilnisky, Subhasish Mitra, Boris Murmann
2019	J	`jnl`	A Data-Compressive Wired-OR Readout for Massively Parallel Neural Recording. IEEE Trans. Biomed. Circuits Syst. Dante Gabriel Muratore, Pulkit Tandon, Mary Wootters, E. J. Chichilnisky, Subhasish Mitra, Boris Murmann
2019	A*	`conf`	Cross-Layer Resilience: Challenges, Insights, and the Road Ahead. DAC Eric Cheng, Daniel Mueller-Gritschneder, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Deming Chen, Hyungmin Cho, Yanjing Li, Uzair Sharif, Kevin Skadron, Mircea Stan, Ulf Schlichtmann, Subhasish Mitra
2019	J	`jnl`	Hybrid Quick Error Detection: Validation and Debug of SoCs Through High-Level Synthesis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Keith A. Campbell, David Lin, Leon He, Liwei Yang, Swathi T. Gurumani, Kyle Rupnow, Subhasish Mitra, Deming Chen
2019	C	`conf`	Memory Sizing of a Scalable SRAM In-Memory Computing Tile Based Architecture. VLSI-SoC Roman Gauchi, Maha Kooli, Pascal Vivet, Jean-Philippe Noël, Edith Beigné, Subhasish Mitra, Henri-Pierre Charles
2019	J	`jnl`	Monolithic 3-D Integration. IEEE Micro Mindy D. Bishop, H.-S. Philip Wong, Subhasish Mitra, Max M. Shulaker
2019	—	`conf`	Optimization of Electrical Stimulation for a High-Fidelity Artificial Retina. NER Nishal P. Shah, Sasidhar Madugula, Lauren E. Grosberg, Gonzalo E. Mena, Pulkit Tandon, Pawel Hottowy, Alexander Sher, Alan M. Litke, Subhasish Mitra, E. J. Chichilnisky
2019	A	`conf`	Processor Hardware Security Vulnerabilities and their Detection by Unique Program Execution Checking. DATE Mohammad Rahmani Fadiheh, Dominik Stoffel, Clark W. Barrett, Subhasish Mitra, Wolfgang Kunz
2019	A	`conf`	Review of Methodologies for Pre- and Post-Silicon Analog Verification in Mixed-Signal SOCs. DATE Georges G. E. Gielen, Nektar Xama, Karthik Ganesan, Subhasish Mitra
2019	A	`conf`	Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study. DATE Eshan Singh, Keerthikumara Devarajegowda, Sebastian Simon, Ralf Schnieder, Karthik Ganesan, Mohammad Rahmani Fadiheh, Dominik Stoffel, Wolfgang Kunz, Clark W. Barrett, Wolfgang Ecker, Subhasish Mitra
2019	J	`jnl`	Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study. CoRR Eshan Singh, Keerthikumara Devarajegowda, Sebastian Simon, Ralf Schnieder, Karthik Ganesan, Mohammad Rahmani Fadiheh, Dominik Stoffel, Wolfgang Kunz, Clark W. Barrett, Wolfgang Ecker, Subhasish Mitra
2019	J	`jnl`	The N3XT Approach to Energy-Efficient Abundant-Data Computing. Proc. IEEE Mohamed M. Sabry Aly, Tony F. Wu, Andrew Bartolo, Yash H. Malviya, William Hwang, Gage Hills, Igor L. Markov, Mary Wootters, Max M. Shulaker, H.-S. Philip Wong, Subhasish Mitra
2019	A	`conf`	Unlocking the Power of Formal Hardware Verification with CoSA and Symbolic QED: Invited Paper. ICCAD Florian Lonsing, Karthik Ganesan, Makai Mann, Srinivasa Shashank Nuthakki, Eshan Singh, Mario Srouji, Yahan Yang, Subhasish Mitra, Clark W. Barrett
2019	J	`jnl`	Variability Expeditions: A Retrospective. IEEE Des. Test Rajesh K. Gupta, Subhasish Mitra, Puneet Gupta
2018	—	`conf`	Abundant-data computing: The N3XT 1, 000X. VLSI-DAT Subhasish Mitra
2018	—	`conf`	Brain-inspired computing exploiting carbon nanotube FETs and resistive RAM: Hyperdimensional computing case study. ISSCC Tony F. Wu, Haitong Li, Ping-Chen Huang, Abbas Rahimi, Jan M. Rabaey, H.-S. Philip Wong, Max M. Shulaker, Subhasish Mitra
2018	C	`conf`	Coming Up N3XT, After 2D Scaling of Si CMOS. ISCAS William Hwang, Weier Wan, Subhasish Mitra, H.-S. Philip Wong
2018	A	`conf`	ETISS-ML: A multi-level instruction set simulator with RTL-level fault injection support for the evaluation of cross-layer resiliency techniques. DATE Daniel Mueller-Gritschneder, Martin Dittrich, Josef Weinzierl, Eric Cheng, Subhasish Mitra, Ulf Schlichtmann
2018	J	`jnl`	Hyperdimensional Computing Exploiting Carbon Nanotube FETs, Resistive RAM, and Their Monolithic 3D Integration. IEEE J. Solid State Circuits Tony F. Wu, Haitong Li, Ping-Chen Huang, Abbas Rahimi, Gage Hills, Bryce Hodson, William Hwang, Jan M. Rabaey, H.-S. Philip Wong, Max M. Shulaker, Subhasish Mitra
2018	J	`jnl`	Hyperdimensional Computing Nanosystem. CoRR Abbas Rahimi, Tony F. Wu, Haitong Li, Jan M. Rabaey, H.-S. Philip Wong, Max M. Shulaker, Subhasish Mitra
2018	J	`jnl`	Processor Hardware Security Vulnerabilities and their Detection by Unique Program Execution Checking. CoRR Mohammad Rahmani Fadiheh, Dominik Stoffel, Clark W. Barrett, Subhasish Mitra, Wolfgang Kunz
2018	A	`conf`	Symbolic quick error detection using symbolic initial state for pre-silicon verification. DATE Mohammad Rahmani Fadiheh, Joakim Urdahl, Srinivasa Shashank Nuthakki, Subhasish Mitra, Clark W. Barrett, Dominik Stoffel, Wolfgang Kunz
2018	A*	`conf`	TRIG: hardware accelerator for inference-based applications and experimental demonstration using carbon nanotube FETs. DAC Gage Hills, Daniel Bankman, Bert Moons, Lita Yang, Jake Hillard, Alex Kahng, Rebecca Park, Marian Verhelst, Boris Murmann, Max M. Shulaker, H.-S. Philip Wong, Subhasish Mitra
2018	J	`jnl`	Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
2017	Misc	`conf`	3D nanosystems enable CODES+ISSS William Hwang, Mohamed M. Sabry Aly, Yash H. Malviya, Mingyu Gao, Tony F. Wu, Christos Kozyrakis, H.-S. Philip Wong, Subhasish Mitra
2017	A*	`conf`	A Systems Approach to Computing in Beyond CMOS Fabrics: Invited. DAC Ameya Patil, Naresh R. Shanbhag, Lav R. Varshney, Eric Pop, H.-S. Philip Wong, Subhasish Mitra, Jan M. Rabaey, Jeffrey A. Weldon, Larry T. Pileggi, Sasikanth Manipatruni, Dmitri E. Nikonov, Ian A. Young
2017	—	`conf`	ASP-DAC 2017 keynote speech I: In memory of Edward J. McCluskey: The next wave of pioneering innovations. ASP-DAC Subhasish Mitra, Deming Chen
2017	C	`conf`	Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. ICCD Eric Cheng, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Keith A. Campbell, Deming Chen, Chen-Yong Cher, Hyungmin Cho, Binh Q. Le, Klas Lilja, Shahrzad Mirkhani, Kevin Skadron, Mircea Stan, Lukasz G. Szafaryn, Christos Vezyrtzis, Subhasish Mitra
2017	J	`jnl`	E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods. CoRR Eshan Singh, Clark W. Barrett, Subhasish Mitra
2017	—	`conf`	E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods. CAV (2) Eshan Singh, Clark W. Barrett, Subhasish Mitra
2017	J	`jnl`	Edward J. McCluskey 1929-2016. IEEE Des. Test Michael J. Flynn, Subhasish Mitra
2017	J	`jnl`	Hot Chips 28. IEEE Micro Bryan Chin, Subhasish Mitra
2017	J	`jnl`	Introduction to the January Special Issue on the 2016 IEEE International Solid-State Circuits Conference. IEEE J. Solid State Circuits Dennis Sylvester, Dejan Markovic, Roman Genov, Atsushi Kawasumi, Subhasish Mitra
2017	J	`jnl`	Logic Bug Detection and Localization Using Symbolic Quick Error Detection. CoRR Eshan Singh, David Lin, Clark W. Barrett, Subhasish Mitra
2017	J	`jnl`	Resistive RAM-Centric Computing: Design and Modeling Methodology. IEEE Trans. Circuits Syst. I Regul. Pap. Haitong Li, Tony F. Wu, Subhasish Mitra, H.-S. Philip Wong
2017	J	`jnl`	System-Level Effects of Soft Errors in Uncore Components. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Hyungmin Cho, Eric Cheng, Thomas Shepherd, Chen-Yong Cher, Subhasish Mitra
2017	J	`jnl`	Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). CoRR Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
2017	C	`conf`	Very Low Voltage (VLV) Design. ICCD Ramon Bertran, Pradip Bose, David M. Brooks, Jeff Burns, Alper Buyuktosunoglu, Nandhini Chandramoorthy, Eric Cheng, Martin Cochet, Schuyler Eldridge, Daniel J. Friedman, Hans M. Jacobson, Rajiv V. Joshi, Subhasish Mitra, Robert K. Montoye, Arun Paidimarri, Pritish Parida, Kevin Skadron, Mircea Stan, Karthik Swaminathan, Augusto Vega, Swagath Venkataramani, Christos Vezyrtzis, Gu-Yeon Wei, John-David Wellman, Matthew M. Ziegler
2016	J	`jnl`	CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores. CoRR Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
2016	A*	`conf`	Clear: cross-layer exploration for architecting resilience combining hardware and software techniques to tolerate soft errors in processor cores. DAC Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
2016	B	`conf`	Cross-layer resilience. ETS Subhasish Mitra
2016	Misc	`conf`	Nano-engineered architectures for ultra-low power wireless body sensor nodes. CODES+ISSS Rubén Braojos, David Atienza, Mohamed M. Sabry Aly, Tony F. Wu, H.-S. Philip Wong, Subhasish Mitra, Giovanni Ansaloni
2016	—	`conf`	Session 24 overview: Ultra-efficient computing: Application-inspired and analog-assisted digital. ISSCC Antoine Dupret, Subhasish Mitra
2016	J	`jnl`	Symbolic Quick Error Detection for Pre-Silicon and Post-Silicon Validation: Frequently Asked Questions. IEEE Des. Test Eshan Singh, David Lin, Clark W. Barrett, Subhasish Mitra
2016	J	`jnl`	TPAD: Hardware Trojan Prevention and Detection for Trusted Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Tony F. Wu, Karthik Ganesan, Yunqing Alexander Hu, H.-S. Philip Wong, S. Simon Wong, Subhasish Mitra
2016	J	`jnl`	Time-Based Sensor Interface Circuits in CMOS and Carbon Nanotube Technologies. IEEE Trans. Circuits Syst. I Regul. Pap. Georges G. E. Gielen, Jelle Van Rethy, Jorge Marin, Max M. Shulaker, Gage Hills, H.-S. Philip Wong, Subhasish Mitra
2016	—	`conf`	Transforming nanodevices into nanosystems: The N3XT 1, 000X. LATS Subhasish Mitra
2016	—	`conf`	Transforming nanodevices to next generation nanosystems. SAMOS Max Marcel Shulaker, Gage Hills, H.-S. Philip Wong, Subhasish Mitra
2015	A	`conf`	A structured approach to post-silicon validation and debug using symbolic quick error detection. ITC David Lin, Eshan Singh, Clark W. Barrett, Subhasish Mitra
2015	A	`conf`	Efficient soft error vulnerability estimation of complex designs. DATE Shahrzad Mirkhani, Subhasish Mitra, Chen-Yong Cher, Jacob A. Abraham
2015	J	`jnl`	Energy-Efficient Abundant-Data Computing: The N3XT 1, 000x. Computer Mohamed M. Sabry, Mingyu Gao, Gage Hills, Chi-Shuen Lee, Greg Pitner, Max M. Shulaker, Tony F. Wu, Mehdi Asheghi, Jeffrey Bokor, Franz Franchetti, Kenneth E. Goodson, Christos Kozyrakis, Igor L. Markov, Kunle Olukotun, Larry T. Pileggi, Eric Pop, Jan M. Rabaey, Christopher Ré, H.-S. Philip Wong, Subhasish Mitra
2015	A*	`conf`	Hybrid quick error detection (H-QED): accelerator validation and debug using high-level synthesis principles. DAC Keith A. Campbell, David Lin, Subhasish Mitra, Deming Chen
2015	A	`conf`	Monolithic 3D integration: a path from concept to reality. DATE Max M. Shulaker, Tony F. Wu, Mohamed M. Sabry, Hai Wei, H.-S. Philip Wong, Subhasish Mitra
2015	—	`conf`	Multiple Independent Gate FETs: How many gates do we need? ASP-DAC Luca Gaetano Amarù, Gage Hills, Pierre-Emmanuel Gaillardon, Subhasish Mitra, Giovanni De Micheli
2015	J	`jnl`	NSF expedition on variability-aware software: Recent results and contributions. it Inf. Technol. Lucas Francisco Wanner, Liangzhen Lai, Abbas Rahimi, Mark Gottscho, Pietro Mercati, Chu-Hsiang Huang, Frederic Sala, Yuvraj Agarwal, Lara Dolecek, Nikil D. Dutt, Puneet Gupta, Rajesh K. Gupta, Ranjit Jhala, Rakesh Kumar, Sorin Lerner, Subhasish Mitra, Alexandru Nicolau, Tajana Simunic Rosing, Mani B. Srivastava, Steven Swanson, Dennis Sylvester, Yuanyuan Zhou
2015	J	`jnl`	New Logic Synthesis as Nanotechnology Enabler. Proc. IEEE Luca Gaetano Amarù, Pierre-Emmanuel Gaillardon, Subhasish Mitra, Giovanni De Micheli
2015	A	`conf`	Quick error detection tests with fast runtimes for effective post-silicon validation and debug. DATE David Lin, Eswaran S, Sharad Kumar, Eric Rentschler, Subhasish Mitra
2015	J	`jnl`	Rapid Co-Optimization of Processing and Circuit Design to Overcome Carbon Nanotube Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Gage Hills, Jie Zhang, Max Marcel Shulaker, Hai Wei, Chi-Shuen Lee, Arjun Balasingam, H.-S. Philip Wong, Subhasish Mitra
2015	J	`jnl`	Rapid Co-optimization of Processing and Circuit Design to Overcome Carbon Nanotube Variations. CoRR Gage Hills, Jie Zhang, Max Marcel Shulaker, Hai Wei, Chi-Shuen Lee, Arjun Balasingam, H.-S. Philip Wong, Subhasish Mitra
2015	J	`jnl`	TPAD: Hardware Trojan Prevention and Detection for Trusted Integrated Circuits. CoRR Tony F. Wu, Karthik Ganesan, Yunqing Alexander Hu, H.-S. Philip Wong, S. Simon Wong, Subhasish Mitra
2015	C	`conf`	Time-based sensor interface circuits in carbon nanotube technology. ISCAS Georges G. E. Gielen, Jelle Van Rethy, Max M. Shulaker, Gage Hills, H.-S. Philip Wong, Subhasish Mitra
2015	J	`jnl`	Understanding Soft Errors in Uncore Components. CoRR Hyungmin Cho, Chen-Yong Cher, Thomas Shepherd, Subhasish Mitra
2015	A*	`conf`	Understanding soft errors in uncore components. DAC Hyungmin Cho, Chen-Yong Cher, Thomas Shepherd, Subhasish Mitra
2014	—	`conf`	A new era of computing: Are you "ready now" to build a smarter and secured enterprise? ISQED Jacqueline Woods, Sridhar Iyengar, Amit Sinha, Subhasish Mitra, Stacy Cannady
2014	J	`jnl`	Addressing failures in exascale computing. Int. J. High Perform. Comput. Appl. Marc Snir, Robert W. Wisniewski, Jacob A. Abraham, Sarita V. Adve, Saurabh Bagchi, Pavan Balaji, James F. Belak, Pradip Bose, Franck Cappello, Bill Carlson, Andrew A. Chien, Paul Coteus, Nathan DeBardeleben, Pedro C. Diniz, Christian Engelmann, Mattan Erez, Saverio Fazzari, Al Geist, Rinku Gupta, Fred Johnson, Sriram Krishnamoorthy, Sven Leyffer, Dean Liberty, Subhasish Mitra, Todd S. Munson, Rob Schreiber, Jon Stearley, Eric Van Hensbergen
2014	—	`conf`	Carbon nanotube computer: transforming scientific discoveries into working systems. ISPD Subhasish Mitra
2014	A	`conf`	Cross layer resiliency in real world. DATE Vikas Chandra, Subhasish Mitra, Chen-Yong Cher, Silvia Melitta Müller
2014	J	`jnl`	Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. David Lin, Ted Hong, Yanjing Li, Eswaran S, Sharad Kumar, Farzan Fallah, Nagib Hakim, Donald S. Gardner, Subhasish Mitra
2014	J	`jnl`	Guest Editorial: Robust and energy-secure systems. IEEE J. Emerg. Sel. Topics Circuits Syst. Augusto Vega, Simha Sethumadhavan, Subhasish Mitra
2014	—	`conf`	QED post-silicon validation and debug: Frequently asked questions. ASP-DAC David Lin, Subhasish Mitra
2014	—	`conf`	QED post-silicon validation and debug: Invited abstract. ISIC David Lin, Subhasish Mitra
2014	—	`conf`	Rethinking error injection for effective resilience. ASP-DAC Shahrzad Mirkhani, Hyungmin Cho, Subhasish Mitra, Jacob A. Abraham
2014	—	`conf`	Robust design and experimental demonstrations of carbon nanotube digital circuits. CICC Gage Hills, Max M. Shulaker, Hai Wei, Hong-Yu Chen, H.-S. Philip Wong, Subhasish Mitra
2014	J	`jnl`	Sensor-to-Digital Interface Built Entirely With Carbon Nanotube FETs. IEEE J. Solid State Circuits Max M. Shulaker, Jelle Van Rethy, Gage Hills, Hai Wei, Hong-Yu Chen, Georges G. E. Gielen, H.-S. Philip Wong, Subhasish Mitra
2014	J	`jnl`	System Level Benchmarking with Yield-Enhanced Standard Cell Library for Carbon Nanotube VLSI Circuits. ACM J. Emerg. Technol. Comput. Syst. Shashikanth Bobba, Jie Zhang, Pierre-Emmanuel Gaillardon, H.-S. Philip Wong, Subhasish Mitra, Giovanni De Micheli
2014	—	`conf`	The resilience wall: Cross-layer solution strategies. VLSI-DAT Subhasish Mitra, Pradip Bose, Eric Cheng, Chen-Yong Cher, Hyungmin Cho, Rajiv V. Joshi, Young Moon Kim, Charles R. Lefurgy, Yanjing Li, Kenneth P. Rodbell, Kevin Skadron, James H. Stathis, Lukasz G. Szafaryn
2014	A	`conf`	Welcome message. ITC Michael Purtell, Subhasish Mitra
2013	A	`conf`	Carbon nanotube circuits: opportunities and challenges. DATE Hai Wei, Max M. Shulaker, Gage Hills, Hong-Yu Chen, Chi-Shuen Lee, Luckshitha Liyanage, Jie Zhang, H.-S. Philip Wong, Subhasish Mitra
2013	A	`conf`	Carbon nanotube imperfection-immune digital VLSI. ISLPED Subhasish Mitra
2013	J	`jnl`	Combinational Logic Design Using Six-Terminal NEM Relays. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Daesung Lee, W. Scott Lee, Chen Chen, Farzan Fallah, J. Provine, Soogine Chong, John Watkins, Roger T. Howe, H.-S. Philip Wong, Subhasish Mitra
2013	—	`conf`	Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. CICC Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Matthias Sauer, Bernd Becker, Subhasish Mitra
2013	A	`conf`	Early-life-failure detection using SAT-based ATPG. ITC Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker
2013	—	`conf`	Experimental demonstration of a fully digital capacitive sensor interface built entirely using carbon-nanotube FETs. ISSCC Max M. Shulaker, Jelle Van Rethy, Gage Hills, Hong-Yu Chen, Georges G. E. Gielen, H.-S. Philip Wong, Subhasish Mitra
2013	A	`conf`	Overcoming post-silicon validation challenges through quick error detection (QED). DATE David Lin, Ted Hong, Yanjing Li, Farzan Fallah, Donald S. Gardner, Nagib Hakim, Subhasish Mitra
2013	A*	`conf`	Quantitative evaluation of soft error injection techniques for robust system design. DAC Hyungmin Cho, Shahrzad Mirkhani, Chen-Yong Cher, Jacob A. Abraham, Subhasish Mitra
2013	A*	`conf`	Rapid exploration of processing and design guidelines to overcome carbon nanotube variations. DAC Gage Hills, Jie Zhang, Charles Mackin, Max M. Shulaker, Hai Wei, H.-S. Philip Wong, Subhasish Mitra
2013	A*	`conf`	Sacha: the Stanford carbon nanotube controlled handshaking robot. DAC Max M. Shulaker, Jelle Van Rethy, Gage Hills, Hong-Yu Chen, Georges G. E. Gielen, H.-S. Philip Wong, Subhasish Mitra
2013	A	`conf`	Self-repair of uncore components in robust system-on-chips: An OpenSPARC T2 case study. ITC Yanjing Li, Eric Cheng, Samy Makar, Subhasish Mitra
2013	J	`jnl`	Underdesigned and Opportunistic Computing in Presence of Hardware Variability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Puneet Gupta, Yuvraj Agarwal, Lara Dolecek, Nikil D. Dutt, Rajesh K. Gupta, Rakesh Kumar, Subhasish Mitra, Alexandru Nicolau, Tajana Simunic Rosing, Mani B. Srivastava, Steven Swanson, Dennis Sylvester
2012	—	`conf`	Bug localization techniques for effective post-silicon validation. ASP-DAC Subhasish Mitra, David Lin, Nagib Hakim, Donald S. Gardner
2012	J	`jnl`	Carbon Nanotube Robust Digital VLSI. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Jie Zhang, Albert Lin, Nishant Patil, Hai Wei, Lan Wei, H.-S. Philip Wong, Subhasish Mitra
2012	J	`jnl`	ERSA: Error Resilient System Architecture for Probabilistic Applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Hyungmin Cho, Larkhoon Leem, Subhasish Mitra
2012	J	`jnl`	Editorial. IEEE J. Emerg. Sel. Topics Circuits Syst. Giovanni De Micheli, Subhasish Mitra, Maciej Ogorzalek
2012	—	`conf`	Nano-Electro-Mechanical (NEM) relays and their application to FPGA routing. ASP-DAC Chen Chen, W. Scott Lee, J. Provine, Soogine Chong, Roozbeh Parsa, Daesung Lee, Roger T. Howe, H.-S. Philip Wong, Subhasish Mitra
2012	A	`conf`	Nano-Electro-Mechanical relays for FPGA routing: Experimental demonstration and a design technique. DATE Chen Chen, W. Scott Lee, Roozbeh Parsa, Soogine Chong, J. Provine, Jeff Watt, Roger T. Howe, H.-S. Philip Wong, Subhasish Mitra
2012	—	`conf`	Probabilistic analysis of Gallager B faulty decoder. ICC S. M. Sadegh Tabatabaei Yazdi, Hyungmin Cho, Yifan Sun, Subhasish Mitra, Lara Dolecek
2012	A*	`conf`	Quick detection of difficult bugs for effective post-silicon validation. DAC David Lin, Ted Hong, Farzan Fallah, Nagib Hakim, Subhasish Mitra
2012	Misc	`conf`	Tutorial T6: Variability-resistant Software and Hardware for Nano-Scale Computing. VLSI Design Nikil D. Dutt, Mani B. Srivastava, Rajesh Gupta, Subhasish Mitra
2011	—	`conf`	Architecture and performance evaluation of 3D CMOS-NEM FPGA. SLIP Chen Dong, Chen Chen, Subhasish Mitra, Deming Chen
2011	A	`conf`	Carbon nanotube imperfection-immune digital VLSI: Frequently asked questions updated. ICCAD Hai Wei, Jie Zhang, Lan Wei, Nishant Patil, Albert Lin, Max M. Shulaker, Hong-Yu Chen, H.-S. Philip Wong, Subhasish Mitra
2011	J	`jnl`	Characterization and Design of Logic Circuits in the Presence of Carbon Nanotube Density Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Jie Zhang, Nishant Patil, Arash Hazeghi, H.-S. Philip Wong, Subhasish Mitra
2011	J	`jnl`	Characterization and Implementation of Fault-Tolerant Vertical Links for 3-D Networks-on-Chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Igor Loi, Federico Angiolini, Shinobu Fujita, Subhasish Mitra, Luca Benini
2011	J	`jnl`	Robust System Design to Overcome CMOS Reliability Challenges. IEEE J. Emerg. Sel. Topics Circuits Syst. Subhasish Mitra, Kevin Brelsford, Young Moon Kim, Hsiao-Heng Lee, Yanjing Li
2011	J	`jnl`	Robust System Design. IPSJ Trans. Syst. LSI Des. Methodol. Subhasish Mitra, Hyungmin Cho, Ted Hong, Young Moon Kim, Hsiao-Heng Lee, Larkhoon Leem, Yanjing Li, David Lin, Evelyn Mintarno, Diana Mui, Sung-Boem Park, Nishant Patil, Hai Wei, Jie Zhang
2011	J	`jnl`	Self-Tuning for Maximized Lifetime Energy-Efficiency in the Presence of Circuit Aging. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Evelyn Mintarno, Joëlle Skaf, Rui Zheng, Jyothi Velamala, Yu Cao, Stephen P. Boyd, Robert W. Dutton, Subhasish Mitra
2011	J	`jnl`	The case for RAMCloud. Commun. ACM John K. Ousterhout, Parag Agrawal, David Erickson, Christos Kozyrakis, Jacob Leverich, David Mazières, Subhasish Mitra, Aravind Narayanan, Diego Ongaro, Guru M. Parulkar, Mendel Rosenblum, Stephen M. Rumble, Eric Stratmann, Ryan Stutsman
2010	A*	`conf`	BLoG: post-silicon bug localization in processors using bug localization graphs. DAC Sung-Boem Park, Anne Bracy, Hong Wang, Subhasish Mitra
2010	A	`conf`	Carbon nanotube circuits: Living with imperfections and variations. DATE Jie Zhang, Nishant Patil, Albert Lin, H.-S. Philip Wong, Subhasish Mitra
2010	A*	`conf`	Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement. DAC Jie Zhang, Shashikanth Bobba, Nishant Patil, Albert Lin, H.-S. Philip Wong, Giovanni De Micheli, Subhasish Mitra
2010	Misc	`conf`	Concurrent autonomous self-test for uncore components in system-on-chips. VTS Yanjing Li, Onur Mutlu, Donald S. Gardner, Subhasish Mitra
2010	A	`conf`	Cross-layer error resilience for robust systems. ICCAD Larkhoon Leem, Hyungmin Cho, Hsiao-Heng Lee, Young Moon Kim, Yanjing Li, Subhasish Mitra
2010	A	`conf`	Cross-layer resilience challenges: Metrics and optimization. DATE Subhasish Mitra, Kevin Brelsford, Pia N. Sanda
2010	A	`conf`	ERSA: Error Resilient System Architecture for probabilistic applications. DATE Larkhoon Leem, Hyungmin Cho, Jason Bau, Quinn A. Jacobson, Subhasish Mitra
2010	A	`conf`	Efficient FPGAs using nanoelectromechanical relays. FPGA Chen Chen, Roozbeh Parsa, Nishant Patil, Soogine Chong, Kerem Akarvardar, J. Provine, David Lewis, Jeff Watt, Roger T. Howe, H.-S. Philip Wong, Subhasish Mitra
2010	Misc	`conf`	Gate-oxide early-life failure identification using delay shifts. VTS Young Moon Kim, Tze Wee Chen, Yoshio Kameda, Masayuki Mizuno, Subhasish Mitra
2010	A	`conf`	Optimized self-tuning for circuit aging. DATE Evelyn Mintarno, Joëlle Skaf, Rui Zheng, Jyothi Velamala, Yu Cao, Stephen P. Boyd, Robert W. Dutton, Subhasish Mitra
2010	J	`jnl`	Post-silicon bug localization for processors using IFRA. Commun. ACM Sung-Boem Park, Subhasish Mitra
2010	A*	`conf`	Post-silicon validation opportunities, challenges and recent advances. DAC Subhasish Mitra, Sanjit A. Seshia, Nicola Nicolici
2010	A	`conf`	QED: Quick Error Detection tests for effective post-silicon validation. ITC Ted Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, Subhasish Mitra
2010	Misc	`conf`	Robust System Design. VLSI Design Subhasish Mitra
2010	A	`conf`	Statistical static timing analysis using Markov chain Monte Carlo. DATE Yashodhan Kanoria, Subhasish Mitra, Andrea Montanari
2009	A*	`conf`	Carbon nanotube circuits in the presence of carbon nanotube density variations. DAC Jie Zhang, Nishant Patil, Arash Hazeghi, Subhasish Mitra
2009	—	`conf`	Circuit aging prediction for low-power operation. CICC Rui Zheng, Jyothi Velamala, Vijay Reddy, Varsha Balakrishnan, Evelyn Mintarno, Subhasish Mitra, Srikanth Krishnan, Yu Cao
2009	A*	`conf`	Digital VLSI logic technology using Carbon Nanotube FETs: frequently asked questions. DAC Nishant Patil, Albert Lin, Jie Zhang, H.-S. Philip Wong, Subhasish Mitra
2009	—	`conf`	IFRA: Post-silicon bug localization in processors. HLDVT Sung-Boem Park, Subhasish Mitra
2009	C	`conf`	Imperfection-immune Carbon Nanotube digital VLSI. ICCD Nishant Patil, Subhasish Mitra
2009	A	`conf`	Imperfection-immune VLSI logic circuits using Carbon Nanotube Field Effect Transistors. DATE Subhasish Mitra, Jie Zhang, Nishant Patil, Hai Wei
2009	A	`conf`	Nanoelectromechanical (NEM) relays integrated with CMOS SRAM for improved stability and low leakage. ICCAD Soogine Chong, Kerem Akarvardar, Roozbeh Parsa, Jun-Bo Yoon, Roger T. Howe, Subhasish Mitra, H.-S. Philip Wong
2009	A	`conf`	Operating system scheduling for efficient online self-test in robust systems. ICCAD Yanjing Li, Onur Mutlu, Subhasish Mitra
2009	J	`jnl`	Overcoming Early-Life Failure and Aging for Robust Systems. IEEE Des. Test Comput. Yanjing Li, Young Moon Kim, Evelyn Mintarno, Donald S. Gardner, Subhasish Mitra
2009	J	`jnl`	Post-Silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Sung-Boem Park, Ted Hong, Subhasish Mitra
2009	J	`jnl`	Probabilistic Analysis and Design of Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Jie Zhang, Nishant Patil, Subhasish Mitra
2009	Misc	`conf`	Testing for Transistor Aging. VTS A. Hakan Baba, Subhasish Mitra
2009	J	`jnl`	The case for RAMClouds: scalable high-performance storage entirely in DRAM. ACM SIGOPS Oper. Syst. Rev. John K. Ousterhout, Parag Agrawal, David Erickson, Christos Kozyrakis, Jacob Leverich, David Mazières, Subhasish Mitra, Aravind Narayanan, Guru M. Parulkar, Mendel Rosenblum, Stephen M. Rumble, Eric Stratmann, Ryan Stutsman
2008	A	`conf`	A low-overhead fault tolerance scheme for TSV-based 3D network on chip links. ICCAD Igor Loi, Subhasish Mitra, Thomas H. Lee, Shinobu Fujita, Luca Benini
2008	A	`conf`	CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns. DATE Yanjing Li, Samy Makar, Subhasish Mitra
2008	A	`conf`	Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems. DATE Neeraj Suri, Christof Fetzer, Jacob A. Abraham, Stefan Poledna, Avi Mendelson, Subhasish Mitra
2008	A	`conf`	Design Guidelines for Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits. DATE Jie Zhang, Nishant Patil, Subhasish Mitra
2008	J	`jnl`	Design Methods for Misaligned and Mispositioned Carbon-Nanotube Immune Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Nishant Patil, Jie Deng, Albert Lin, H.-S. Philip Wong, Subhasish Mitra
2008	Misc	`conf`	Gate-Oxide Early Life Failure Prediction. VTS Tze Wee Chen, Kyunglok Kim, Young Moon Kim, Subhasish Mitra
2008	A	`conf`	Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges. DATE Subhasish Mitra
2008	J	`jnl`	Historical Perspective on Scan Compression. IEEE Des. Test Comput. Rohit Kapur, Subhasish Mitra, Thomas W. Williams
2008	A*	`conf`	IFRA: instruction footprint recording and analysis for post-silicon bug localization in processors. DAC Sung-Boem Park, Subhasish Mitra
2008	A	`conf`	Optimized Circuit Failure Prediction for Aging: Practicality and Promise. ITC Mridul Agarwal, Varsha Balakrishnan, Anshuman Bhuyan, Kyunglok Kim, Bipul C. Paul, Wenping Wang, Bo Yang, Yu Cao, Subhasish Mitra
2008	A	`conf`	Reliable system design: models, metrics and design techniques. ICCAD Subhasish Mitra, Ravishankar K. Iyer, Kishor S. Trivedi, James W. Tschanz
2008	C	`conf`	Soft Error Protection Techniques. IOLTS Subhasish Mitra
2008	A	`conf`	Soft Errors: System Effects, Protection Techniques and Case Studies. DATE Dimitris Gizopoulos, Kaushik Roy, Subhasish Mitra, Pia N. Sanda
2008	J	`jnl`	The Search for Alternative Computational Paradigms. IEEE Des. Test Comput. Naresh R. Shanbhag, Subhasish Mitra, Gustavo de Veciana, Michael Orshansky, Radu Marculescu, Jaijeet S. Roychowdhury, Douglas L. Jones, Jan M. Rabaey
2008	—	`conf`	Tutorial 4: Robust System Design in Scaled CMOS. ISQED Subhasish Mitra
2008	A	`conf`	VAST: Virtualization-Assisted Concurrent Autonomous Self-Test. ITC Hiroaki Inoue, Yanjing Li, Subhasish Mitra
2007	J	`jnl`	Application-Dependent Delay Testing of FPGAs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Mehdi Baradaran Tahoori, Subhasish Mitra
2007	A*	`conf`	Automated Design of Misaligned-Carbon-Nanotube-Immune Circuits. DAC Nishant Patil, Jie Deng, H.-S. Philip Wong, Subhasish Mitra
2007	A	`conf`	California scan architecture for high quality and low power testing. ITC Kyoung Youn Cho, Subhasish Mitra, Edward J. McCluskey
2007	—	`conf`	Carbon Nanotube Transistor Circuits: Circuit-Level Performance Benchmarking and Design Options for Living with Imperfections. ISSCC Jie Deng, Nishant Patil, Koungmin Ryu, Alexander Badmaev, Chongwu Zhou, Subhasish Mitra, H.-S. Philip Wong
2007	C	`conf`	Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout. IOLTS Subhasish Mitra
2007	Misc	`conf`	Circuit Failure Prediction and Its Application to Transistor Aging. VTS Mridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra
2007	A	`conf`	Circuit failure prediction to overcome scaled CMOS reliability challenges. ITC Subhasish Mitra, Mridul Agarwal
2007	C	`conf`	Soft Errors: Technology Trends, System Effects, and Protection Techniques. IOLTS Subhasish Mitra, Pia N. Sanda, Norbert Seifert
2007	A	`conf`	Verification-guided soft error resilience. DATE Sanjit A. Seshia, Wenchao Li, Subhasish Mitra
2006	A	`conf`	Combinational Logic Soft Error Correction. ITC Subhasish Mitra, Ming Zhang, Saad Waqas, Norbert Seifert, Balkaran S. Gill, Kee Sup Kim
2006	J	`jnl`	Conference Reports. IEEE Des. Test Comput. Subhasish Mitra, Ondrej Novák, Hana Kubátová, Bashir M. Al-Hashimi, Erik Jan Marinissen, C. P. Ravikumar
2006	Misc	`conf`	Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman
2006	B	`conf`	How To Safeguard Your Sensitive Data. SRDS Bob Mungamuru, Hector Garcia-Molina, Subhasish Mitra
2006	J	`jnl`	Sequential Element Design With Built-In Soft Error Resilience. IEEE Trans. Very Large Scale Integr. Syst. Ming Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, Nicholas J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, Sanjay J. Patel
2006	C	`conf`	Should Logic SER be Solved at the Circuit Level? IOLTS T. M. Mak, Subhasish Mitra
2006	A	`conf`	Signature Analyzer Design for Yield Learning Support. ITC Nishant Patil, Subhasish Mitra, Steven S. Lumetta
2006	C	`conf`	Soft Error Resilient System Design through Error Correction. VLSI-SoC Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim
2006	—	`conf`	Soft Error Resilient System Design through Error Correction. VLSI-SoC (Selected Papers) Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim
2006	A	`conf`	Test Compression for FPGAs. ITC Mehdi Baradaran Tahoori, Subhasish Mitra
2006	J	`jnl`	XPAND: An Efficient Test Stimulus Compression Technique. IEEE Trans. Computers Subhasish Mitra, Kee Sup Kim
2005	J	`jnl`	Application-independent testing of FPGA interconnects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Mehdi Baradaran Tahoori, Subhasish Mitra
2005	C	`conf`	DFT Assisted Built-In Soft Error Resilience. IOLTS T. M. Mak, Subhasish Mitra, Ming Zhang
2005	A	`conf`	Enabling yield analysis with X-compact. ITC Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman
2005	A	`conf`	Gate exhaustive testing. ITC Kyoung Youn Cho, Subhasish Mitra, Edward J. McCluskey
2005	A*	`conf`	Logic soft errors in sub-65nm technologies design and CAD challenges. DAC Subhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang
2005	A	`conf`	Logic soft errors: a major barrier to robust platform design. ITC Subhasish Mitra, Ming Zhang, T. M. Mak, Norbert Seifert, Victor Zia, Kee Sup Kim
2005	J	`jnl`	Optimized reseeding by seed ordering and encoding. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
2005	J	`jnl`	Recent Advances and New Avenues in Hardware-Level Reliability Support. IEEE Micro Ravishankar K. Iyer, Nithin Nakka, Zbigniew Kalbarczyk, Subhasish Mitra
2005	A*	`conf`	Response compaction with any number of unknowns using a new LFSR architecture. DAC Erik H. Volkerink, Subhasish Mitra
2005	—	`conf`	Robust platform design in advanced VLSI technologies. CICC David J. Leavins, Kee Sup Kim, Subhasish Mitra, Eddie J. Rodriguez
2005	J	`jnl`	Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim. Computer Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim
2005	Misc	`conf`	Testing Nanometer Digital Integration Circuits: Myths, Reality and the Road Ahead. VLSI Design R. D. (Shawn) Blanton, Subhasish Mitra
2005	J	`jnl`	X-Tolerant Test Response Compaction. IEEE Des. Test Comput. Subhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher, Nishant Patil
2004	J	`jnl`	Conference Reports. IEEE Des. Test Comput. Vladimir Hahanov, Raimund Ubar, Subhasish Mitra
2004	Misc	`conf`	Defect and Fault Tolerance of Reconfigurable Molecular Computing. FCCM Mehdi Baradaran Tahoori, Subhasish Mitra
2004	Misc	`conf`	Delay Defect Screening using Process Monitor Structures. VTS Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger
2004	Misc	`conf`	ELF-Murphy Data on Defects and Test Sets. VTS Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra
2004	J	`jnl`	Efficient Design Diversity Estimation for Combinational Circuits. IEEE Trans. Computers Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey
2004	A	`conf`	Interconnect Delay Testing of Designs on Programmable Logic Devices. ITC Mehdi Baradaran Tahoori, Subhasish Mitra
2004	J	`jnl`	Reconfigurable Architecture for Autonomous Self-Repair. IEEE Des. Test Comput. Subhasish Mitra, Wei-Je Huang, Nirmal R. Saxena, Shu-Yi Yu, Edward J. McCluskey
2004	A	`conf`	Speed Clustering of Integrated Circuits. ITC Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra
2004	J	`jnl`	Techniques and algorithms for fault grading of FPGA interconnect test configurations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Mehdi Baradaran Tahoori, Subhasish Mitra
2004	A	`conf`	X-Tolerant Signature Analysis. ITC Subhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher
2004	J	`jnl`	X-compact: an efficient response compaction technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Subhasish Mitra, Kee Sup Kim
2003	Misc	`conf`	Automatic Configuration Generation for FPGA Interconnect Testing. VTS Mehdi Baradaran Tahoori, Subhasish Mitra
2003	Misc	`conf`	Bist Reseeding with very few Seeds. VTS Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
2003	J	`jnl`	Delay Defect Characteristics and Testing Strategies. IEEE Des. Test Comput. Kee Sup Kim, Subhasish Mitra, Paul G. Ryan
2003	Misc	`conf`	Efficient Seed Utilization for Reseeding based Compression. VTS Erik H. Volkerink, Subhasish Mitra
2003	A	`conf`	H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. ITC David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish
2003	C	`conf`	XMAX: X-Tolerant Architecture for MAXimal Test Compression. ICCD Subhasish Mitra, Kee Sup Kim
2002	J	`jnl`	A Design Diversity Metric and Analysis of Redundant Systems. IEEE Trans. Computers Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey
2002	Misc	`conf`	Debating the Future of Burn-In. VTS Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
2002	—	`conf`	Dependable Reconfigurable Computing Design Diversity and Self Repair. Evolvable Hardware Subhasish Mitra, Edward J. McCluskey
2002	Misc	`conf`	Design for Testability and Testing of IEEE 1149.1 Tap Controller. VTS Subhasish Mitra, Edward J. McCluskey, Samy Makar
2002	J	`jnl`	ED4I: Error Detection by Diverse Data and Duplicated Instructions. IEEE Trans. Computers Nahmsuk Oh, Subhasish Mitra, Edward J. McCluskey
2002	A	`conf`	Fault Grading FPGA Interconnect Test Configurations. ITC Mehdi Baradaran Tahoori, Subhasish Mitra, Shahin Toutounchi, Edward J. McCluskey
2002	A	`conf`	Packet-Based Input Test Data Compression Techniques. ITC Erik H. Volkerink, Ajay Khoche, Subhasish Mitra
2002	Misc	`conf`	Test Vector Compression Using EDA-ATE Synergies. VTS Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra
2002	—	`conf`	Testing Digital Circuits with Constraints. DFT Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
2002	A	`conf`	X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. ITC Subhasish Mitra, Kee Sup Kim
2001	Misc	`conf`	An Evaluation of Pseudo Random Testing for Detecting Real Defects. VTS Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson
2001	Misc	`conf`	Design Diversity for Concurrent Error Detection in Sequential Logic Circuts. VTS Subhasish Mitra, Edward J. McCluskey
2001	Misc	`conf`	Design of Redundant Systems Protected Against Common-Mode Failures. VTS Subhasish Mitra, Edward J. McCluskey
2001	—	`conf`	Diversity Techniques for Concurrent Error Detection. ISQED Subhasish Mitra, Edward J. McCluskey
2001	—	`conf`	Fast Run-Time Fault Location in Dependable FPGA-Based Applications. DFT Wei-Je Huang, Subhasish Mitra, Edward J. McCluskey
2001	A	`conf`	Techniques for Estimation of Design Diversity for Combinational Logic Circuits. DSN Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey
2000	A	`conf`	Combinational logic synthesis for diversity in duplex systems. ITC Subhasish Mitra, Edward J. McCluskey
2000	J	`jnl`	Common-mode failures in redundant VLSI systems: a survey. IEEE Trans. Reliab. Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey
2000	—	`conf`	DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits. ASYNC Philip P. Shirvani, Subhasish Mitra, Jo C. Ebergen, Marly Roncken
2000	J	`jnl`	Dependable Computing and Online Testing in Adaptive and Configurable Systems. IEEE Des. Test Comput. Nirmal R. Saxena, Santiago Fernández-Gomez, Wei-Je Huang, Subhasish Mitra, Shu-Yi Yu, Edward J. McCluskey
2000	J	`jnl`	Efficient Multiplexer Synthesis Techniques. IEEE Des. Test Comput. Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey
2000	Misc	`conf`	Fault Escapes in Duplex Systems. VTS Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey
2000	A	`conf`	Which concurrent error detection scheme to choose ? ITC Subhasish Mitra, Edward J. McCluskey
2000	Misc	`conf`	Word Voter: A New Voter Design for Triple Modular Redundant Systems. VTS Subhasish Mitra, Edward J. McCluskey
1999	A	`conf`	A design diversity metric and reliability analysis for redundant systems. ITC Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey
1999	J	`jnl`	An output encoding problem and a solution technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey
1997	A	`conf`	An output encoding problem and a solution technique. ICCAD Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey
1997	A	`conf`	Scan Synthesis for One-Hot Signals. ITC Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey