Subhadip Kundu

24 papers A* 1A 6B 1C 1Misc 4Journal 5Unranked 6

Year	Rank	Type	Title / Venue / Authors
2025	A	`conf`	Debugging and Preventing Abnormally High Vmin during Logic Scan Test Bring-up. ITC Min-Hsin Liu, Ding-Wei Cheng, James Chien-Mo Li, Chris Nigh, Szu Huat Goh, Mason Chern, Bing-Han Hsieh, Subhadip Kundu
2024	Misc	`conf`	Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network. VLSID Subhadip Kundu, Jais Abraham
2022	A	`conf`	Using Custom Fault Models to Improve Understanding of Silicon Failures. ITC Subhadip Kundu, Gaurav Bhargava, Lesly Endrinal, Lavakumar Ranganathan
2017	A	`conf`	Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set. ITC Subhadip Kundu, Kuldip Kumar, Rishi Kumar, Rohit Kapur
2016	A	`conf`	Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors. ITC Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur
2016	Misc	`conf`	Post-Silicon Validation and Diagnosis. VLSID Kanad Basu, Subhadip Kundu
2015	C	`conf`	A hardware based low temperature solution for VLSI testing using decompressor side masking. ISCAS Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay, Bijit Kumar Das
2015	A	`conf`	Fault diagnosis in designs with extreme low pin test data compressors. DATE Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur
2015	J	`jnl`	Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment. IEEE Trans. Very Large Scale Integr. Syst. Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
2014	J	`jnl`	Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. IEEE Trans. Very Large Scale Integr. Syst. Subhadip Kundu, Aniket Jha, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
2013	J	`jnl`	A Metric for Test Set Characterization and Customization Toward Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Subhadip Kundu, Sankhadeep Pal, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
2013	B	`conf`	Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. ETS Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
2013	A*	`conf`	An ATE assisted DFD technique for volume diagnosis of scan chains. DAC Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
2013	—	`conf`	Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing. Asian Test Symposium Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay
2012	Misc	`conf`	A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection. VLSI Design Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
2012	—	`conf`	Confidence Based Power Aware Testing. ISED Tapas Kumar Maiti, Subhadip Kundu, Arpita Dutta, Santanu Chattopadhyay
2012	J	`jnl`	Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing. Integr. S. Krishna Kumar, Subhadip Kundu, Santanu Chattopadhyay
2012	J	`jnl`	Efficient don't care filling and scan chain masking for low-power testing. Int. J. Comput. Aided Eng. Technol. Subhadip Kundu, Santanu Chattopadhyay
2012	—	`conf`	Particle Swarm Optimization Based BIST Design for Memory Cores in Mesh Based Network-on-Chip. VDAT Bibhas Ghoshal, Subhadip Kundu, Indranil Sengupta, Santanu Chattopadhyay
2011	Misc	`conf`	Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. VLSI Design Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur
2010	A	`conf`	Customizing pattern set for test power reduction via improved X-identification and reordering. ISLPED S. Krishna Kumar, S. Kaundinya, Subhadip Kundu, Santanu Chattopadhyay
2009	—	`conf`	Efficient Don't Care Filling for Power Reduction during Testing. ARTCom Subhadip Kundu, Santanu Chattopadhyay
2009	—	`conf`	Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption. Asian Test Symposium Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay
2008	—	`conf`	A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing. ICIIS Subhadip Kundu, Santanu Chattopadhyay, Kanchan Manna