| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2023 | J | jnl |
Voltage Balancing of Series-Connected SiC mosfets With Adaptive-Impedance Self-Powered Gate Drivers.
IEEE Trans. Ind. Electron.
|
| 2022 | C | conf |
IECON
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | C | conf |
IECON
|
| 2019 | C | conf |
IECON
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | C | conf |
IECON
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | — | conf |
PSCC
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2012 | — | conf |
ISIE
|
| 2012 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2004 | J | jnl |
IEEE Trans. Ind. Electron.
|