Steven Thijs - RankMe

22 papers Journal 9Unranked 13

Year	Rank	Type	Title / Venue / Authors
2023	—	`conf`	Band Relevance Study of SWIR Hyperspectral Imaging for Material Recycling and Reuse. WHISPERS Carolina Blanch Perez del Notario, Steven Thijs, Murali Jayapala
2022	—	`conf`	Benefits Of Multi-Exposure For Hyperspectral Imaging. WHISPERS Carolina Blanch Perez del Notario, Bert Geelen, Kathleen Vunckx, Bart Masschelein, Steven Thijs
2012	—	`conf`	A low-power 57-to-66GHz transceiver in 40nm LP CMOS with -17dB EVM at 7Gb/s. ISSCC Vojkan Vidojkovic, Giovanni Mangraviti, Khaled Khalaf, Viki Szortyka, Kristof Vaesen, Wim Van Thillo, Bertrand Parvais, Mike Libois, Steven Thijs, John R. Long, Charlotte Soens, Piet Wambacq
2011	J	`jnl`	Design Issues and Considerations for Low-Cost 3-D TSV IC Technology. IEEE J. Solid State Circuits Geert Van der Plas, Paresh Limaye, Igor Loi, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Antonio Pullini, Federico Angiolini, Luca Benini, Wim Dehaene, Youssef Travaly, Eric Beyne, Paul Marchal
2010	—	`conf`	Design issues and considerations for low-cost 3D TSV IC technology. ISSCC Geert Van der Plas, Paresh Limaye, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Domae Shinichi, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Pol Marchal, Eric Beyne
2010	—	`conf`	Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack - Challenges and solutions. CICC Geert Van der Plas, Steven Thijs, Dimitri Linten, Guruprasad Katti, Paresh Limaye, Abdelkarim Mercha, Michele Stucchi, Herman Oprins, Bart Vandevelde, Nikolaos Minas, Miro Cupac, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Eric Beyne, Paul Marchal
2009	—	`conf`	50-to-67GHz ESD-protected power amplifiers in digital 45nm LP CMOS. ISSCC Kuba Raczkowski, Steven Thijs, Walter De Raedt, Bart Nauwelaers, Piet Wambacq
2009	J	`jnl`	A Fully Integrated 7.3 kV HBM ESD-Protected Transformer-Based 4.5-6 GHz CMOS LNA. IEEE J. Solid State Circuits Jonathan Borremans, Steven Thijs, Piet Wambacq, Yves Rolain, Dimitri Linten, Maarten Kuijk
2009	J	`jnl`	A plug-and-play wideband RF circuit ESD protection methodology: T-diodes. Microelectron. Reliab. Dimitri Linten, Steven Thijs, Jonathan Borremans, Morin Dehan, David Trémouilles, Mirko Scholz, M. I. Natarajan, Piet Wambacq, Stefaan Decoutere, Guido Groeseneken
2009	J	`jnl`	ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool? IEEE Trans. Instrum. Meas. Mirko Scholz, Dimitri Linten, Steven Thijs, Sandeep Sangameswaran, Masanori Sawada, Toshiyuki Nakaei, Takumi Hasebe, Guido Groeseneken
2009	—	`conf`	Low-cost feedback-enabled LNAs in 45nm CMOS. ESSCIRC Jonathan Borremans, Steven Thijs, Morin Dehan, Abdelkarim Mercha, Piet Wambacq
2008	—	`conf`	Advanced Planar Bulk and Multigate CMOS Technology: Analog-Circuit Benchmarking up to mm-Wave Frequencies. ISSCC Piet Wambacq, Abdelkarim Mercha, Karen Scheir, Bob Verbruggen, Jonathan Borremans, Vincent De Heyn, Steven Thijs, Dimitri Linten, Geert Van der Plas, Bertrand Parvais, Morin Dehan, Stefaan Decoutere, Charlotte Soens, Nadine Collaert, Malgorzata Jurczak
2008	—	`conf`	Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications. CICC Steven Thijs, Mototsugu Okushima, Jonathan Borremans, Philippe Jansen, Dimitri Linten, Mirko Scholz, Piet Wambacq, Guido Groeseneken
2007	J	`jnl`	Transient voltage overshoot in TLP testing - Real or artifact? Microelectron. Reliab. David Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken
2006	J	`jnl`	Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions. Microelectron. Reliab. Steven Thijs, M. Natarajan Iyer, Dimitri Linten, Wutthinan Jeamsaksiri, T. Daenen, Robin Degraeve, Andries J. Scholten, Stefaan Decoutere, Guido Groeseneken
2005	J	`jnl`	A 5-GHz fully integrated ESD-protected low-noise amplifier in 90-nm RF CMOS. IEEE J. Solid State Circuits Dimitri Linten, Steven Thijs, Mahadeva Iyer Natarajan, Piet Wambacq, Wutthinan Jeamsaksiri, Javier Ramos, Abdelkarim Mercha, Snezana Jenei, Stéphane Donnay, Stefaan Decoutere
2005	—	`conf`	Advanced SCR ESD protection circuits for CMOS/SOI nanotechnologies. CICC Markus P. J. Mergens, Olivier Marichal, Steven Thijs, Benjamin Van Camp, Christian C. Russ
2005	J	`jnl`	ESD-RF co-design methodology for the state of the art RF-CMOS blocks. Microelectron. Reliab. Vesselin K. Vassilev, Steven Thijs, P. L. Segura, Piet Wambacq, Paul Leroux, Guido Groeseneken, M. I. Natarajan, Herman E. Maes, Michiel Steyaert
2005	—	`conf`	Low-power low-noise highly ESD robust LNA, and VCO design using above-IC inductors. CICC Dimitri Linten, Xiao Sun, Steven Thijs, M. I. Natarajan, Abdelkarim Mercha, Geert Carchon, Piet Wambacq, Takeshi Nakaie, Stefaan Decoutere
2005	—	`conf`	RF ESD protection strategies - the design and performance trade-off challenges. CICC Philippe Jansen, Steven Thijs, Dimitri Linten, M. I. Natarajan, Vesselin K. Vassilev, Mingxu Liu, Ann Concannon, David Trémouilles, Takeshi Nakaie, Masanori Sawada, Vladislav A. Vashchenko, Marcel ter Beek, Takumi Hasebe, Stefaan Decoutere, Guido Groeseneken
2004	—	`conf`	A 5 GHz fully integrated ESD-protected low-noise amplifier in 90 nm RF CMOS. ESSCIRC Dimitri Linten, Steven Thijs, Mahadeva Iyer Natarajan, Piet Wambacq, Wutthinan Jeamsaksiri, Javier Ramos, Abdelkarim Mercha, Snezana Jenei, Stéphane Donnay, Stefaan Decoutere
2003	J	`jnl`	High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectron. Reliab. Vesselin K. Vassilev, Snezana Jenei, Guido Groeseneken, Rafael Venegas, Steven Thijs, Vincent De Heyn, M. Natarajan Iyer, Michiel Steyaert, Herman E. Maes