Stephen Sunter

19 papers A 8B 3C 1Misc 5Journal 2
YearRankTypeTitle / Venue / Authors
2025 A conf
Scan Test for 99% Defect Coverage of R-2R DACs.
ITC
Stephen Sunter, Krzysztof Jurga
2024 Misc conf
A Method for Simulating Mixed-Signal ATE Tests.
VTS
Stephen Sunter, Vladimir Zivkovic, Bartlomiej Praselski
2024 A conf
Digital Scan and ATPG for Analog Circuits.
ITC
Stephen Sunter, Krzysztof Jurga
2021 Misc conf
Automated Observability Analysis for Mixed-Signal Circuits.
VTS
Stephen Sunter, Krzysztof Jurga
2020 B conf
Analog Fault Simulation - a Hot Topic!
ETS
Stephen Sunter
2020 A conf
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs.
ITC
Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
2019 A conf
Efficient Analog Defect Simulation.
ITC
Stephen Sunter
2018 Misc conf
IP session on ISO26262 EDA.
VTS
Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson
2018 B conf
Measuring mixed-signal test stimulus quality.
ETS
Krzysztof Jurga, Stephen Sunter
2017 A conf
A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods.
ITC
Stephen Sunter, Peter Sarson
2016 A conf
Automated measurement of defect tolerance in mixed-signal ICs.
ITC
Stephen Sunter, Alessandro Valerio, Riccardo Miglierina
2016 C conf
Closing the loop between analog design and test.
ISCAS
Stephen Sunter
2016 B conf
Measuring defect tolerance within mixed-signal ICs.
ETS
Stephen Sunter, Alessandro Valerio, Riccardo Miglierina
2016 J jnl
Using Mixed-Signal Defect Simulation to Close the Loop Between Design and Test.
IEEE Trans. Circuits Syst. I Regul. Pap.
Stephen Sunter, Krzysztof Jurga, Andrew Laidler
2015 Misc conf
Special session: Hot topics: Statistical test methods.
VTS
Manuel J. Barragán, Gildas Léger, Florence Azaïs, Ronald D. Blanton, Adit D. Singh, Stephen Sunter
2014 Misc conf
Efficient Monte Carlo-based analog parametric fault modelling.
VTS
Haralampos-G. D. Stratigopoulos, Stephen Sunter
2014 A conf
Fast BIST of I/O Pin AC specifications and inter-chip delays.
ITC
Stephen Sunter, Saghir A. Shaikh, Qing Lin
2014 J jnl
Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Haralampos-G. D. Stratigopoulos, Stephen Sunter
2014 A conf
Practical random sampling of potential defects for analog fault simulation.
ITC
Stephen Sunter, Krzysztof Jurga, Peter Dingenen, Ronny Vanhooren