| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | B | conf |
ETS
|
| 2021 | — | conf |
MECO
|
| 2021 | — | conf |
CCWC
|
| 2020 | — | conf |
UEMCON
|
| 2020 | — | conf |
COINS
|
| 2014 | J | jnl |
Microprocess. Microsystems
|
| 2014 | C | conf |
CRITIS
|
| 2013 | — | conf |
IDT
|
| 2013 | — | conf |
IDT
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | B | conf |
ETS
|
| 2010 | Misc | conf |
VTS
|
| 2010 | J | jnl |
IEEE Trans. Computers
|
| 2009 | — | conf |
DFT
|
| 2008 | Misc | conf |
VTS
|
| 2008 | — | conf |
ISQED
|
| 2007 | — | conf |
DFT
|
| 2006 | C | conf |
IOLTS
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2005 | — | conf |
ISQED
|
| 2005 | — | conf |
ACM Great Lakes Symposium on VLSI
|