Steffen Tarnick

22 papers A 4C 6Misc 2Journal 9
YearRankTypeTitle / Venue / Authors
2011 J jnl
An Accumulator - Based Test-Per-Clock Scheme.
IEEE Trans. Very Large Scale Integr. Syst.
Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick
2010 C conf
Design of embedded constant weight code checkers based on averaging operations.
IOLTS
Steffen Tarnick
2008 C conf
A Low-Cost Accumulator-Based Test Pattern Generation Architecture.
IOLTS
Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick
2008 J jnl
Self-Testing Embedded Borden
J. Electron. Test.
Steffen Tarnick
2007 C conf
Design of Embedded m-out-of-n Code Checkers Using Complete Parallel Counters.
IOLTS
Steffen Tarnick
2006 C conf
Embedded Borden 2-UED Code Checkers.
IOLTS
Steffen Tarnick
2005 J jnl
Single- and Double-Output Embedded Checker Architectures for Systematic Unordered Codes.
J. Electron. Test.
Steffen Tarnick
2004 J jnl
Design of Embedded Self-Testing Checkers for
J. Electron. Test.
Steffen Tarnick
2004 C conf
Single-Output Embedded Checkers for Systematic Unordered Codes.
IOLTS
Steffen Tarnick
2003 C conf
A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers.
IOLTS
Steffen Tarnick
2003 A conf
Self-Testing Embedded Checkers for Bose-Lin, Bose, and a Class of Borden Codes.
DATE
Steffen Tarnick
2000 J jnl
Embedded Checker Architectures for Cyclic and Low-Cost Arithmetic Codes.
J. Electron. Test.
Albrecht P. Stroele, Steffen Tarnick
1999 Misc conf
Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Code.
VTS
Albrecht P. Stroele, Steffen Tarnick
1998 J jnl
Embedded Parity and Two-Rail TSC Checkers with Error-Memorizing Capability.
VLSI Design
Steffen Tarnick
1998 A conf
Embedded self-testing checkers for low-cost arithmetic codes.
ITC
Steffen Tarnick, Albrecht P. Stroele
1996 J jnl
Self-Checking Comparator with One Periodic Output.
IEEE Trans. Computers
Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick
1995 J jnl
Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.
IEEE Trans. Computers
Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois
1995 J jnl
Controllable self-checking checkers for conditional concurrent checking.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Steffen Tarnick
1995 — —
Data compression techniques for concurrent error detection and built-in self test.
Steffen Tarnick
1995 A conf
Pattern generation for a deterministic BIST scheme.
ICCAD
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, Hans-Joachim Wunderlich
1994 Misc conf
Controllable self-checking checkers for conditional concurrent checking.
VTS
Steffen Tarnick
1992 A conf
Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers.
ITC
Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski