| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
Design Criteria of High-Temperature Integrated Circuits Using Standard SOI CMOS Process up to 300°C.
IEEE Access
|
| 2024 | — | conf |
I2MTC
|
| 2022 | — | conf |
ICPS
|
| 2019 | — | conf |
ApplePies
|
| 2018 | — | conf |
ApplePies
|
| 2018 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2016 | — | conf |
MeMeA
|
| 2015 | — | conf |
I2MTC
|
| 2015 | J | jnl |
IEEE Trans. Smart Grid
|
| 2015 | — | conf |
M&N
|
| 2013 | — | conf |
CAMAD
|
| 2013 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
|
| 2012 | — | conf |
NORCHIP
|
| 2008 | J | jnl |
Microelectron. J.
|
| 2008 | J | jnl |
Microelectron. Reliab.
|
| 2002 | J | jnl |
Microelectron. Reliab.
|