Stefano Aresu

11 papers Journal 10Unranked 1
YearRankTypeTitle / Venue / Authors
2023 — conf
28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers.
IMW
Alessandro Grossi, Matteo Coppetta, Stefano Aresu, Andreas Kux, Thomas Kern, Robert Strenz
2014 J jnl
HCS degradation of 5 nm oxide high-voltage PLDMOS.
Microelectron. Reliab.
C. Olk, Stefano Aresu, R. Rudolf, M. Röhner, Wolfgang Gustin, E. Stein Von Kamienski
2012 J jnl
New insights on the PBTI phenomena in SiON pMOSFETs.
Microelectron. Reliab.
Karina Rott, Hans Reisinger, Stefano Aresu, Christian Schlünder, Klaus Kölpin, Wolfgang Gustin, Tibor Grasser
2008 J jnl
NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique.
Microelectron. Reliab.
Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin
2008 J jnl
New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure.
Microelectron. Reliab.
Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin
2008 J jnl
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications.
Microelectron. Reliab.
Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll
2007 J jnl
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices.
Microelectron. Reliab.
Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu
2007 J jnl
Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors.
Microelectron. Reliab.
Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll
2004 J jnl
Evidence for source side injection hot carrier effects on lateral DMOS transistors.
Microelectron. Reliab.
Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot
2003 J jnl
A new method for the analysis of high-resolution SILC data.
Microelectron. Reliab.
Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen
2002 J jnl
High-resolution SILC measurements of thin SiO
Microelectron. Reliab.
Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger