| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | C | conf |
ICCE
|
| 2023 | B | conf |
ETS
|
| 2023 | C | conf |
IOLTS
|
| 2023 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2023 | — | conf |
DSN-W
|
| 2023 | — | conf |
MCSoC
|
| 2023 | J | jnl |
PeerJ Comput. Sci.
|
| 2022 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2022 | B | conf |
ETS
|
| 2022 | Misc | conf |
VLSID
|
| 2021 | — | conf |
ATS
|
| 2021 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2020 | A | conf |
ITC
|
| 2019 | — | conf |
DFT
|
| 2019 | B | conf |
ETS
|
| 2019 | C | conf |
PRDC
|
| 2019 | A | conf |
ITC
|
| 2018 | — | conf |
Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing.
ATS
|
| 2018 | B | conf |
ETS
|
| 2017 | A | conf |
ITC
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | — | conf |
ATS
|
| 2016 | — | conf |
ATS
|
| 2016 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2016 | — | conf |
ATS
|
| 2015 | B | conf |
ETS
|
| 2015 | A | conf |
DATE
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | — | conf |
ATS
|
| 2014 | A | conf |
ICCAD
|
| 2014 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2014 | — | conf |
APCCAS
|
| 2012 | C | conf |
ICCD
|
| 2012 | — | — |
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | B | conf |
ETS
|
| 2009 | A | conf |
DATE
|
| 2009 | J | jnl |
J. Electron. Test.
|
| 2009 | Misc | conf |
VTS
|
| 2009 | B | conf |
ETS
|
| 2008 | B | conf |
ETS
|
| 2008 | J | jnl |
Numerische Mathematik
|
| 2007 | B | conf |
ETS
|
| 2004 | J | jnl |
SIAM J. Sci. Comput.
|
| 2003 | J | jnl |
SIAM J. Sci. Comput.
|
| 1999 | — | conf |
IATA
|