Stefan Eichenberger

25 papers A 10B 1Misc 6Journal 7Unranked 1
YearRankTypeTitle / Venue / Authors
2013 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 J jnl
Gate Leakage Impact on Full Open Defects in Interconnect Lines.
IEEE Trans. Very Large Scale Integr. Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2010 A conf
Defect-oriented cell-internal testing.
ITC
Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
2010 B conf
Diagnosis of full open defects in interconnect lines with fan-out.
ETS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2010 Misc conf
Impact of Temperature on Test Quality.
VLSI Design
Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti
2009 A conf
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.
ITC
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
2008 Misc conf
Full Open Defects in Nanometric CMOS.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008 A conf
Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
ITC
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008 A conf
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality.
ITC
Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi
2007 Misc conf
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 Misc conf
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 J jnl
Memory Testing Under Different Stress Conditions: An Industrial Evaluation
CoRR
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2007 J jnl
Modeling Power Supply Noise in Delay Testing.
IEEE Des. Test Comput.
Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger
2006 A conf
Power Supply Noise in Delay Testing.
ITC
Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger
2005 A conf
Memory Testing Under Different Stress Conditions: An Industrial Evaluation.
DATE
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2005 — conf
Memory testing improvements through different stress conditions.
ESSCIRC
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2004 Misc conf
Delay Defect Screening using Process Monitor Structures.
VTS
Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger
2004 J jnl
ITC 2003 Roundtable: Design for Manufacturability.
IEEE Des. Test Comput.
Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker
2004 A conf
On Hazard-free Patterns for Fine-delay Fault Testing.
ITC
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger
2004 A conf
Systematic Defects in Deep Sub-Micron Technologies.
ITC
Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede
2003 A conf
Design for Manufacturability - or the meaning of 'subtle'.
ITC
Stefan Eichenberger
2003 Misc conf
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
VTS
Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
2003 J jnl
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.
J. Electron. Test.
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
2002 A conf
An Effective Diagnosis Method to Support Yield Improvement.
ITC
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg