Stefan Dilhaire

21 papers B 1Misc 2Journal 17Unranked 1
YearRankTypeTitle / Venue / Authors
2014 J jnl
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.
Microelectron. J.
Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà
2014 — conf
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.
MWSCAS
Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo
2009 J jnl
Joule expansion imaging techniques on microlectronic devices.
Microelectron. J.
Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire
2008 J jnl
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues.
Microelectron. Reliab.
Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire
2008 B conf
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.
ETS
Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire
2006 J jnl
Dynamic Surface Temperature Measurements in ICs.
Proc. IEEE
Josep Altet, Wilfrid Claeys, Stefan Dilhaire, Antonio Rubio
2006 J jnl
Time gating imaging through thick silicon substrate: a new step towards backside characterisation.
Microelectron. Reliab.
Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire
2005 J jnl
ElectroStatic Discharge Fault Localization by Laser Probing.
Microelectron. Reliab.
Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire
2004 J jnl
Applications of temperature phase measurements to IC testing.
Microelectron. Reliab.
Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby
2004 J jnl
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope.
Microelectron. J.
Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz
2004 Misc conf
Sensing temperature in CMOS circuits for Thermal Testing.
VTS
Josep Altet, Antonio Rubio, M. Amine Salhi, Jose Luis Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov
2004 J jnl
Strain energy imaging of a power MOS transistor using speckle interferometry.
IEEE Trans. Reliab.
Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Wilfrid Claeys
2004 J jnl
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy.
Microelectron. J.
Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale
2003 J jnl
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.
Microelectron. Reliab.
G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
2003 J jnl
Determination of passive SiO
Microelectron. Reliab.
Guillaume Marinier, Stefan Dilhaire, Luis David Patiño Lopez, Mohamed Benzohra
2003 J jnl
Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.
Microelectron. Reliab.
Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys
2001 J jnl
Laser diode COFD analysis by thermoreflectance microscopy.
Microelectron. Reliab.
Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys
2001 J jnl
Thermal coupling in integrated circuits: application to thermal testing.
IEEE J. Solid State Circuits
Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys
2000 Misc conf
Thermal Testing: Fault Location Strategies.
VTS
Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys
1999 J jnl
Differential Thermal Testing: An Approach to its Feasibility.
J. Electron. Test.
Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, Emmanuel Schaub, Hideo Tamamoto
1999 J jnl
Temperature measurements of metal lines under current stress by high-resolution laser probing.
IEEE Trans. Instrum. Meas.
Véronique Quintard, Stefan Dilhaire, Tam Phan, Wilfrid Claeys