| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | J | jnl |
Circuits Syst. Signal Process.
|
| 2022 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IET Circuits Devices Syst.
|
| 2018 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2016 | — | conf |
MIXDES
|
| 2015 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2015 | J | jnl |
Circuits Syst. Signal Process.
|
| 2015 | J | jnl |
J. Electron. Test.
|
| 2014 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2013 | J | jnl |
Circuits Syst. Signal Process.
|
| 2012 | J | jnl |
Circuits Syst. Signal Process.
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2010 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2009 | — | conf |
ECCTD
|
| 2009 | — | conf |
ECCTD
|
| 2008 | — | conf |
ICECS
|
| 2008 | — | conf |
ICECS
|
| 2007 | — | conf |
ECCTD
|
| 2007 | — | conf |
ECCTD
|
| 2006 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2005 | — | conf |
ECCTD
|
| 2005 | — | conf |
ECCTD
|
| 2004 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2002 | — | conf |
ICECS
|
| 2000 | — | conf |
ICECS
|
| 1998 | J | jnl |
Int. J. Circuit Theory Appl.
|