Srikanth Krishnan

19 papers A* 1Journal 3Unranked 15
YearRankTypeTitle / Venue / Authors
2025 — conf
Positive Bias Temperature Instability in Polysilicon/SiO2 PMOS Transistors for Analog High Precision Applications.
IRPS
Dhanoop Varghese, Vijaya Vemuri, Arif Sonnet, Vijay Reddy, Srikanth Krishnan, Vivek Varier, Cheuk Yu, Srinivas Pulijala
2025 — conf
Thermomechanical Fatigue in Two Level Cu Interconnects Under Pulsing Peak Current.
IRPS
Hariram Mohanram, Harikrishnan Kumarasamy, Choong-Un Kim, Young-Joon Park, Sudarshan Prasad, Srikanth Krishnan
2024 — conf
Study of Thermomechanical Damage Mechanism in Al Interconnects in Al-SiO2 structure by High Density Peak Current.
IRPS
Hariram Mohanram, Harikrishnan Kumarasamy, Choong-Un Kim, Young-Joon Park, Srikanth Krishnan
2022 — conf
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.
IRPS
Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy
2021 — conf
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique.
IRPS
Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam
2020 — conf
A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors.
IRPS
Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam
2020 — conf
Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing.
IRPS
Chung-Shuo Lee, Pavan Kumar Vaitheeswaran, Ganesh Subbarayan, Young-Joon Park, Jayhoon Chung, Srikanth Krishnan
2019 — conf
Current Crowding Impact on Electromigration in Al Interconnects.
IRPS
Young-Joon Park, Jungwoo Joh, Jayhoon Chung, Srikanth Krishnan
2019 — conf
Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process.
IRPS
Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy
2019 — conf
Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.
IRPS
Ethan S. Lee, Luis Hurtado, Jungwoo Joh, Srikanth Krishnan, Sameer Pendharkar, Jesús A. del Alamo
2018 A* conf
Cross-Modal Health State Estimation.
ACM Multimedia
Nitish Nag, Vaibhav Pandey, Preston J. Putzel, Hari Bhimaraju, Srikanth Krishnan, Ramesh C. Jain
2018 J jnl
Cross-Modal Health State Estimation.
CoRR
Nitish Nag, Vaibhav Pandey, Preston J. Putzel, Hari Bhimaraju, Srikanth Krishnan, Ramesh C. Jain
2018 — conf
High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.
IRPS
Sanghoon Shin, Yen-Pu Chen, Woojin Ahn, Honglin Guo, Byron Williams, Jeff West, Tom Bonifield, Dhanoop Varghese, Srikanth Krishnan, Muhammad Ashraful Alam
2013 — conf
ACE: A robust variability and aging sensor for high-k/metal gate SoC.
ESSDERC
Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao
2012 J jnl
Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors.
IEEE Des. Test Comput.
Min Chen, Vijay Reddy, Srikanth Krishnan, Venkatesh Srinivasan, Yu Cao
2009 — conf
Circuit aging prediction for low-power operation.
CICC
Rui Zheng, Jyothi Velamala, Vijay Reddy, Varsha Balakrishnan, Evelyn Mintarno, Subhasish Mitra, Srikanth Krishnan, Yu Cao
2008 — conf
Statistical prediction of circuit aging under process variations.
CICC
Wenping Wang, Vijay Reddy, Bo Yang, Varsha Balakrishnan, Srikanth Krishnan, Yu Cao
2007 — conf
An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology.
CICC
Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao
2005 J jnl
Impact of negative bias temperature instability on digital circuit reliability.
Microelectron. Reliab.
Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan