| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Concurrent Self-Testing and Uncertainty Estimation of Neural Networks Using Uncertainty Fingerprint.
IEEE Trans. Emerg. Top. Comput.
|
| 2025 | Misc | conf |
VTS
|
| 2025 | A | conf |
ITC
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2024 | A | conf |
DATE
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | Misc | conf |
VTS
|
| 2024 | A | conf |
DATE
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | B | conf |
ETS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | A | conf |
ICCAD
|
| 2024 | J | jnl |
CoRR
|
| 2023 | Misc | conf |
VTS
|
| 2023 | J | jnl |
IEEE Des. Test
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | B | conf |
ETS
|
| 2023 | A | conf |
DATE
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2023 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2022 | — | conf |
NANOARCH
|
| 2022 | A | conf |
ITC
|
| 2022 | Misc | conf |
VTS
|
| 2022 | C | conf |
DSD
|
| 2022 | B | conf |
ETS
|
| 2021 | B | conf |
ETS
|