Souvik Mahapatra

29 papers A 1Journal 5Unranked 23

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	TCAD Based Isolation of Self-Heat Enhanced HCD and NBTI in GAA SNS p-FET. IRPS Karansingh Thakor, Rai Sambhav, Rashmi Saikia, Souvik Mahapatra
2025	—	`conf`	The Importance of Gate Length Choice on NBTI Qualification in GAA-SNS FETs Under Normal and Overclocking Conditions. IRPS Arnav Shaurya Bisht, Souvik Mahapatra
2024	—	`conf`	A TCAD to SPICE Framework for Isolation of BTI and HCD in GAA-SNS FETs and to Estimate Impact on RO Under Normal and Overclocking Conditions. IRPS Karansingh Thakor, Payel Chatterjee, Souvik Mahapatra
2024	—	`conf`	Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions. IRPS Priyankka Gundlapudi Ravikumar, Prasanna Venkatesan Ravindran, Khandker Akif Aabrar, Taeyoung Song, Sharadindu Gopal Kirtania, Dipjyoti Das, Chinsung Park, Nashrah Afroze, Mengkun Tian, Shimeng Yu, Ahmad Ehtesham Islam, Suman Datta, Souvik Mahapatra, Asif Islam Khan
2024	—	`conf`	Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories. IMW Karansingh Thakor, Nikhil Rangarajan, Himanshu Diwakar, Rashmi Saikia, Tarun Samadder, Souvik Mahapatra, Shyam Raghunathan, Yingda Dong
2024	—	`conf`	Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology. IRPS Leitao Liu, Jingtian Fang, Ashish Pal, Plamen Asenov, Mohit Bajaj, Bei Deng, Xi-Wei Lin, Souvik Mahapatra, Subi Kengeri, El Mehdi Bazizi
2024	—	`conf`	Modeling of Post-Cycling Retention Bake in 3-D CTF TLC NAND Arrays. IRPS Rashmi Saikia, Himanshu Rai, Souvik Mahapatra
2023	—	`conf`	A Physics-based Model for Long Term Data Retention Characteristics in 3D NAND Flash Memory. IRPS Rashmi Saikia, Aseer Ansari, Souvik Mahapatra
2022	—	`conf`	Decoupling of NBTI and Pure HCD Contributions in p-GAA SNS FETs Under Mixed VG/VD Stress. IRPS Nilotpal Choudhury, Ayush Ranjan, Souvik Mahapatra
2022	—	`conf`	Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs. IRPS Himanshu Diwakar, Karansingh Thakor, Souvik Mahapatra
2022	—	`conf`	On the PBTI Reliability of Low EOT Negative Capacitance 1.8 nm HfO2-ZrO2 Superlattice Gate Stack on Lg=90 nm nFETs. VLSI Technology and Circuits Nirmaan Shanker, Li-Chen Wang, Suraj S. Cheema, Wenshen Li, Nilotpal Choudhury, Chenming Hu, Souvik Mahapatra, Sayeef S. Salahuddin
2021	—	`conf`	A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake. IRPS Tarun Samadder, Satyam Kumar, Karansingh Thakor, Souvik Mahapatra
2021	—	`conf`	Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs. IRPS Nilotpal Choudhury, Tarun Samadder, Ravi Tiwari, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra
2021	—	`conf`	Modeling of HKMG Stack Process Impact on Gate Leakage, SILC and PBTI. IRPS Dimple Vijay Kochar, Tarun Samadder, Subhadeep Mukhopadhyay, Souvik Mahapatra
2021	—	`conf`	Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs. IRPS Satyam Kumar, Tarun Samadder, Karansingh Thakor, Uma Sharma, Souvik Mahapatra
2020	—	`conf`	Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs. IRPS Nilotpal Choudhury, Uma Sharma, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra
2020	—	`conf`	Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range. IRPS Nilotpal Choudhury, Narendra Parihar, Souvik Mahapatra
2020	—	`conf`	BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity. IRPS Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch
2020	—	`conf`	Hot Carrier Degradation in Cryo-CMOS. IRPS Wriddhi Chakraborty, Uma Sharma, Suman Datta, Souvik Mahapatra
2019	J	`jnl`	Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. IEEE Trans. Very Large Scale Integr. Syst. Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
2019	—	`conf`	On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs. IRPS Narendra Parihar, Uma Sharma, Richard G. Southwick, Miaomiao Wang, James H. Stathis, Souvik Mahapatra
2018	J	`jnl`	A review of NBTI mechanisms and models. Microelectron. Reliab. Souvik Mahapatra, Narendra Parihar
2018	J	`jnl`	Controversial issues in negative bias temperature instability. Microelectron. Reliab. James H. Stathis, Souvik Mahapatra, Tibor Grasser
2018	—	`conf`	Prediction of NBTI stress and recovery time kinetics in Si capped SiGe p-MOSFETs. IRPS Narendra Parihar, Souvik Mahapatra
2018	J	`jnl`	TCAD modeling for reliability. Microelectron. Reliab. Paul Pfäffli, Hiu Yung Wong, X. Xu, Luca Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, Souvik Mahapatra, Steve Motzny, Victor Moroz, Terry Ma
2016	A	`conf`	Aging-aware voltage scaling. DATE Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
2015	—	`conf`	Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress. IRPS Nilesh Goel, Tejas Naphade, Souvik Mahapatra
2015	—	`conf`	Time dependent variability in RMG-HKMG FinFETs: Impact of extraction scheme on stochastic NBTI. IRPS Ankush Chaudhary, Ben Kaczer, Philippe J. Roussel, Thomas Chiarella, Naoto Horiguchi, Souvik Mahapatra
2014	J	`jnl`	A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs. Microelectron. Reliab. Nilesh Goel, Kaustubh Joshi, S. Mukhopadhyay, N. Nanaware, Souvik Mahapatra