Soumendu Bhattacharya

36 papers A 4B 2C 2Misc 11Journal 11Unranked 5
YearRankTypeTitle / Venue / Authors
2013 — conf
Predicting die-level process variations from wafer test data for analog devices: A feasibility study.
LATW
Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee
2012 J jnl
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures.
IEEE Des. Test Comput.
Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee
2012 J jnl
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya
2011 Misc conf
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation.
VLSI Design
Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya
2010 Misc conf
Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures.
VTS
Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee
2009 J jnl
Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers.
IEEE Trans. Very Large Scale Integr. Syst.
Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee
2009 C conf
Iterative built-in testing and tuning of mixed-signal/RF systems.
ICCD
Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan
2008 Misc conf
Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise.
VTS
Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee
2008 J jnl
System-Level Specification Testing Of Wireless Transceivers.
IEEE Trans. Very Large Scale Integr. Syst.
Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee
2007 J jnl
Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection.
IET Comput. Digit. Tech.
Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee
2007 Misc conf
Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors.
VTS
Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
2007 J jnl
Signature Testing of Analog and RF Circuits: Algorithms and Methodology.
IEEE Trans. Circuits Syst. I Regul. Pap.
Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
2006 J jnl
A DFT Approach for Testing Embedded Systems Using DC Sensors.
IEEE Des. Test Comput.
Soumendu Bhattacharya, Abhijit Chatterjee
2006 Misc conf
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors.
VTS
Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee
2006 J jnl
An Accurate DNA Sensing and Diagnosis Methodology Using Fabricated Silicon Nanopores.
IEEE Trans. Circuits Syst. I Regul. Pap.
Soumendu Bhattacharya, Sankar Nair, Abhijit Chatterjee
2006 Misc conf
Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction.
VTS
Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
2006 Misc conf
Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms.
VLSI Design
Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair
2006 B conf
Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study.
ETS
Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
2006 B conf
Low Cost Parametric Failure Diagnosis of RF Transceivers.
ETS
Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee
2006 — conf
Probabilistic Error Correction in Linear Digital Filters Using Checksum Codes.
LATW
Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
2005 Misc conf
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode.
VLSI Design
Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee
2005 — —
Alternate Testing of Analog and RF Systems using Extracted Test Response Features.
Soumendu Bhattacharya
2005 J jnl
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications.
J. Electron. Test.
Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee
2005 C conf
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST).
IOLTS
Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt
2005 J jnl
Optimized wafer-probe and assembled package test design for analog circuits.
ACM Trans. Design Autom. Electr. Syst.
Soumendu Bhattacharya, Abhijit Chatterjee
2005 Misc conf
Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices.
VTS
Soumendu Bhattacharya, Abhijit Chatterjee
2005 A conf
Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF.
ITC
Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee
2004 — conf
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits.
Asian Test Symposium
Soumendu Bhattacharya, Abhijit Chatterjee
2004 A conf
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit.
DATE
Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
2004 Misc conf
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.
VTS
Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
2004 — conf
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences.
DELTA
Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee
2004 A conf
Use of Embedded Sensors for Built-In-Test of RF Circuits.
ITC
Soumendu Bhattacharya, Abhijit Chatterjee
2003 A conf
Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models.
ITC
Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee
2003 Misc conf
High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost.
VTS
Soumendu Bhattacharya, Abhijit Chatterjee
2002 — conf
Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models.
DELTA
Soumendu Bhattacharya, Abhijit Chatterjee
1993 J jnl
Visualization in linear programming using parallel coordinates.
Pattern Recognit.
Abhijit Chatterjee, Partha Pratim Das, Soumendu Bhattacharya