| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2015 | — | conf |
I2MTC
|
| 2006 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2003 | — | conf |
DFT
|
| 2003 | J | jnl |
Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment.
IEEE Trans. Instrum. Meas.
|
| 2001 | A | conf |
ITC
|
| 1999 | A | conf |
ITC
|
| 1998 | A | conf |
ITC
|
| 1996 | A | conf |
ITC
|
| 1995 | A | conf |
ITC
|
| 1994 | A | conf |
ITC
|
| 1989 | A | conf |
ITC
|