| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2011 | J | jnl |
Int. Arab J. Inf. Technol.
|
| 2011 | — | conf |
LATW
|
| 2011 | J | jnl |
IET Comput. Digit. Tech.
|
| 2011 | J | jnl |
J. Low Power Electron.
|
| 2011 | — | conf |
LATW
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2010 | — | conf |
IDT
|
| 2010 | — | conf |
IDT
|
| 2010 | — | conf |
SBCCI
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2010 | A | conf |
ITC
|
| 2010 | B | conf |
ETS
|
| 2010 | — | conf |
IDT
|
| 2010 | C | conf |
IOLTS
|
| 2010 | B | conf |
ETS
|
| 2009 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2009 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2009 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2009 | A | conf |
ITC
|
| 2008 | — | conf |
ASYNC
|
| 2008 | C | conf |
IOLTS
|
| 2008 | A | conf |
ITC
|
| 2008 | J | jnl |
IEEE Trans. Reliab.
|
| 2007 | J | jnl |
IEEE Trans. Computers
|
| 2006 | A | conf |
DATE
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | A | conf |
ITC
|
| 2005 | J | jnl |
Microelectron. J.
|
| 2005 | A | conf |
DATE
|
| 2004 | C | conf |
ICCD
|
| 2004 | — | conf |
ISQED
|
| 2004 | Misc | conf |
VTS
|
| 2004 | A | conf |
DATE
|
| 2003 | C | conf |
Cost-Effective Graceful Degradation in Speculative Processor Subsystems: The Branch Prediction Case.
ICCD
|
| 2003 | — | conf |
DFT
|
| 2003 | C | conf |
IOLTS
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2001 | — | conf |
CICC
|