Simon Van Beek

16 papers Journal 1Unranked 15

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	Dielectric Breakdown Analysis on Bottom and Top-Gated IGZO-TFT. IRPS Simon Van Beek, Adrian Vaisman Chasin, Subhali Subhechha, Harold Dekkers, Nouredine Rassoul, Yiqun Wan, Hongwei Tang, Joao P. Bastos, Attilio Belmonte, Gouri Sankar Kar
2024	—	`conf`	Extremely Scaled Perpendicular SOT-MRAM Array Integration on 300mm Wafer. VLSI Technology and Circuits Farrukh Yasin, A. Palomino, Ankit Kumar, Valerio Pica, Simon Van Beek, Giacomo Talmelli, Van D. Nguyen, Stefan Cosemans, D. Crotti, Kurt Wostyn, Gouri Sankar Kar, Sebastien Couet
2023	—	`conf`	MTJ degradation in multi-pillar SOT-MRAM with selective writing. IRPS Simon Van Beek, Kaiming Cai, Kaiquan Fan, Giacomo Talmelli, Anna Trovato, Nico Jossart, Siddharth Rao, Adrian Vaisman Chasin, Sebastien Couet
2023	—	`conf`	STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes. ESSDERC Fernando García-Redondo, S. Rao, M. Gupta, Manu Perumkunnil, Y. Xiang, D. Abdi, Simon Van Beek, Sebastien Couet, Marie Garcia Bardon
2022	—	`conf`	MTJ degradation in SOT-MRAM by self-heating-induced diffusion. IRPS Simon Van Beek, Kaiming Cai, Siddharth Rao, Ganesh Jayakumar, Sebastien Couet, Nico Jossart, Adrian Vaisman Chasin, Gouri Sankar Kar
2022	—	`conf`	Selective operations of multi-pillar SOT-MRAM for high density and low power embedded memories. VLSI Technology and Circuits Kaiming Cai, Simon Van Beek, Siddharth Rao, Kaiquan Fan, M. Gupta, Van D. Nguyen, Ganesh Jayakumar, Giacomo Talmelli, Sebastien Couet, Gouri Sankar Kar
2021	—	`conf`	Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. IRPS Simon Van Beek, Siddharth Rao, Shreya Kundu, Woojin Kim, Barry J. O'Sullivan, Stefan Cosemans, Farrukh Yasin, Robert Carpenter, Sebastien Couet, Shamin H. Sharifi, Nico Jossart, Davide Crotti, Gouri Sankar Kar
2021	—	`conf`	STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application. IMW Sidharth Rao, Woojin Kim, Simon Van Beek, Shreya Kundu, Manu Perumkunnil, Stefan Cosemans, Farrukh Yasin, Sebastien Couet, Robert Carpenter, Barry J. O'Sullivan, Shamin H. Sharifi, N. Jossart, Laurent Souriau, Ludovic Goux, Dimitri Crotti, Gouri Sankar Kar
2020	—	`conf`	Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs. IRPS Simon Van Beek, Barry J. O'Sullivan, Sebastien Couet, Davide Crotti, Dimitri Linten, Gouri Sankar Kar
2019	—	`conf`	Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the {V IRPS Erik Bury, Adrian Vaisman Chasin, Michiel Vandemaele, Simon Van Beek, Jacopo Franco, Ben Kaczer, Dimitri Linten
2018	—	`conf`	Experimental extraction of BEOL composite equivalent thermal conductivities for application in self-heating simulations. ESSDERC Erik Bury, Ben Kaczer, Simon Van Beek, Dimitri Linten
2018	—	`conf`	Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown. IRPS Barry J. O'Sullivan, Simon Van Beek, Philippe J. Roussel, Sidharth Rao, Wonsub Kim, Sebastien Couet, Johan Swerts, Farrukh Yasin, Dimitri Crotti, Dimitri Linten, Gouri Sankar Kar
2018	—	`conf`	SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories. VLSI Circuits Kevin Garello, Kevin Garello Yasin, Sebastien Couet, Laurent Souriau, Johan Swerts, Sidharth Rao, Simon Van Beek, Wonsub Kim, Enlong Liu, Shreya Kundu, Diana Tsvetanova, Kris Croes, N. Jossart, E. Grimaldi, M. Baumgartner, D. Crotti, Arnaud Fumemont, Pietro Gambardella, Gouri Sankar Kar
2018	J	`jnl`	SOT-MRAM 300mm integration for low power and ultrafast embedded memories. CoRR Kevin Garello, Farrukh Yasin, Sebastien Couet, Laurent Souriau, Johan Swerts, Sidharth Rao, Simon Van Beek, Wonsub Kim, Enlong Liu, Shreya Kundu, Diana Tsvetanova, N. Jossart, Kris Croes, E. Grimaldi, M. Baumgartner, D. Crotti, Arnaud Furnémont, Pietro Gambardella, Gouri Sankar Kar
2018	—	`conf`	Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit. ESSDERC Simon Van Beek, Philippe Roussel, Barry J. O'Sullivan, Robin Degraeve, Stefan Cosemans, Dimitri Linten, Gouri Sankar Kar
2015	—	`conf`	Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. IRPS Simon Van Beek, Koen Martens, Philippe Roussel, Gabriele Luca Donadio, Johan Swerts, Sofie Mertens, Gouri Sankar Kar, Tai Min, Guido Groeseneken