| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Intell. Veh.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
CoRR
|
| 2023 | C | conf |
IECON
|
| 2023 | — | conf |
VTC2023-Spring
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Geosci. Remote. Sens. Lett.
|
| 2023 | — | conf |
IEEM
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | — | conf |
iSES
|
| 2021 | — | conf |
ICPHM
|
| 2021 | — | conf |
ICPHM
|
| 2019 | — | conf |
SICE
|
| 2018 | — | conf |
ECC
|
| 2017 | Misc | conf |
VLSID
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2013 | C | conf |
CCA
|
| 2013 | C | conf |
CCA
|
| 2013 | J | jnl |
Integr.
|
| 2012 | Misc | conf |
VLSI Design
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2012 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2012 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2012 | — | conf |
ISVLSI
|
| 2011 | — | conf |
ISVLSI
|
| 2011 | — | conf |
ISVLSI
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2011 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2010 | J | jnl |
Integr.
|
| 2010 | Misc | conf |
VLSI Design
|
| 2010 | J | jnl |
Int. J. Syst. Sci.
|
| 2010 | A | conf |
FPGA
|
| 2010 | J | jnl |
Discret. Event Dyn. Syst.
|
| 2009 | C | conf |
ISCAS
|
| 2009 | — | conf |
CASE
|
| 2008 | Misc | conf |
VLSI Design
|
| 2008 | — | conf |
ICIIS
|
| 2008 | C | conf |
ISCAS
|
| 2008 | — | conf |
ICIIS
|
| 2008 | C | conf |
ACC
|
| 2008 | — | conf |
ICIIS
|
| 2008 | — | conf |
ICIIS
|
| 2008 | J | jnl |
J. Circuits Syst. Comput.
|
| 2007 | C | conf |
ACC
|
| 2007 | J | jnl |
Inf. Sci.
|
| 2006 | C | conf |
DDECS
|
| 2006 | — | conf |
LATW
|
| 2006 | C | conf |
ACC
|
| 2005 | J | jnl |
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation.
J. Electron. Test.
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | Misc | conf |
VLSI Design
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | — | conf |
SMC (2)
|
| 2004 | C | conf |
IOLTS
|
| 1998 | J | jnl |
IEEE Trans. Autom. Control.
|
| 1998 | J | jnl |
IEEE Trans. Autom. Control.
|
| 1997 | J | jnl |
Discret. Event Dyn. Syst.
|
| 1995 | J | jnl |
IEEE Trans. Syst. Man Cybern.
|
| 1994 | J | jnl |
IEEE Trans. Autom. Control.
|