| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2014 | — | conf |
MWSCAS
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | — | conf |
MWSCAS
|
| 2013 | B | conf |
ETS
|
| 2013 | — | conf |
LATW
|
| 2013 | A* | conf |
DAC
|
| 2013 | — | — |
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | Misc | conf |
VLSI Design
|
| 2012 | B | conf |
ETS
|
| 2012 | A | conf |
ICCAD
|
| 2011 | A | conf |
ITC
|
| 2011 | Misc | conf |
VTS
|
| 2010 | Misc | conf |
VTS
|
| 2010 | C | conf |
IOLTS
|
| 2010 | Misc | conf |
VTS
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | — | conf |
Rapid Radio Frequency Amplitude and Phase Distortion Measurement Using Amplitude Modulated Stimulus.
Asian Test Symposium
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | C | conf |
DDECS
|
| 2009 | C | conf |
ICCD
|
| 2009 | A | conf |
ITC
|