Shupeng Sun

17 papers A* 2A 4Journal 7Unranked 4
YearRankTypeTitle / Venue / Authors
2019 J jnl
Nonlinear Dynamic Modeling and Model Reduction Strategy for Rotating Thin Cylindrical Shells.
Complex.
Shupeng Sun, Lun Liu
2018 J jnl
Sparse Regression Driven Mixture Importance Sampling for Memory Design.
IEEE Trans. Very Large Scale Integr. Syst.
Maria Malik, Rajiv V. Joshi, Rouwaida Kanj, Shupeng Sun, Houman Homayoun, Tong Li
2017 J jnl
Machine Learning for Noise Sensor Placement and Full-Chip Voltage Emergency Detection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Xiaochen Liu, Shupeng Sun, Xin Li, Haifeng Qian, Pingqiang Zhou
2016 J jnl
Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Fa Wang, Paolo Cachecho, Wangyang Zhang, Shupeng Sun, Xin Li, Rouwaida Kanj, Chenjie Gu
2015 A* conf
A statistical methodology for noise sensor placement and full-chip voltage map generation.
DAC
Xiaochen Liu, Shupeng Sun, Pingqiang Zhou, Xin Li, Haifeng Qian
2015 J jnl
Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu
2015 — conf
Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space.
CICC
Shupeng Sun, Xin Li
2015 — conf
Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space.
ASP-DAC
Shupeng Sun, Xin Li
2014 A conf
Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space.
ICCAD
Shupeng Sun, Xin Li
2014 J jnl
Indirect Performance Sensing for On-Chip Self-Healing of Analog and RF Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap.
Shupeng Sun, Fa Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileggi, Arun Natarajan, Mark A. Ferriss, Jean-Olivier Plouchart, Bodhisatwa Sadhu, Benjamin D. Parker, Alberto Valdes-Garcia, Mihai A. T. Sanduleanu, José A. Tierno, Daniel J. Friedman
2013 A conf
Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits.
ICCAD
Xin Li, Fa Wang, Shupeng Sun, Chenjie Gu
2013 A* conf
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data.
DAC
Fa Wang, Wangyang Zhang, Shupeng Sun, Xin Li, Chenjie Gu
2013 A conf
Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space.
ICCAD
Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu
2013 — conf
Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion.
CICC
Shupeng Sun, Fa Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileggi, Arun Natarajan, Mark A. Ferriss, Jean-Olivier Plouchart, Bodhisatwa Sadhu, Benjamin D. Parker, Alberto Valdes-Garcia, Mihai A. T. Sanduleanu, José A. Tierno, Daniel J. Friedman
2013 — conf
Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits.
CICC
Shupeng Sun, Xin Li, Chenjie Gu
2012 J jnl
Efficient SRAM Failure Rate Prediction via Gibbs Sampling.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Shupeng Sun, Yamei Feng, Changdao Dong, Xin Li
2012 A conf
Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion.
ICCAD
Xin Li, Wangyang Zhang, Fa Wang, Shupeng Sun, Chenjie Gu