| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
CoRR
|
| 2025 | A* | conf |
ICLR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
ACL (1)
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | — | conf |
ACL (Findings)
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Sensors
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IET Commun.
|
| 2023 | B | conf |
ICIP
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Appl. Intell.
|
| 2022 | J | jnl |
IET Commun.
|
| 2021 | J | jnl |
IET Commun.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Commun. Lett.
|
| 2021 | C | conf |
ISCAS
|
| 2020 | J | jnl |
IEICE Electron. Express
|
| 2019 | — | conf |
I2MTC
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2019 | J | jnl |
J. Circuits Syst. Comput.
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2018 | — | conf |
I2MTC
|
| 2017 | — | conf |
WCSP
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2016 | J | jnl |
Comput. Intell. Neurosci.
|
| 2016 | J | jnl |
IEEE Trans. Smart Grid
|
| 2016 | J | jnl |
Comput. Intell. Neurosci.
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2015 | J | jnl |
An Adaptive Hybrid PSO Multi-Objective Optimization Algorithm for Constrained Optimization Problems.
Int. J. Pattern Recognit. Artif. Intell.
|
| 2015 | J | jnl |
J. Circuits Syst. Comput.
|
| 2015 | J | jnl |
J. Appl. Math.
|
| 2015 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2014 | — | conf |
CSE
|
| 2014 | J | jnl |
Circuits Syst. Signal Process.
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2014 | J | jnl |
J. Sensors
|
| 2014 | J | jnl |
J. Electron. Test.
|
| 2014 | J | jnl |
Comput. Intell. Neurosci.
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2013 | J | jnl |
Circuits Syst. Signal Process.
|
| 2013 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2010 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2010 | J | jnl |
IEEE Intell. Transp. Syst. Mag.
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | J | jnl |
J. Electron. Test.
|
| 2009 | — | conf |
PACCS
|