| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Intell. Syst.
|
| 2023 | — | conf |
ICECET
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
Trans. Inst. Meas. Control
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
J. Frankl. Inst.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Int. J. Syst. Sci.
|
| 2019 | J | jnl |
Int. J. Syst. Sci.
|
| 2019 | J | jnl |
Int. J. Syst. Sci.
|
| 2019 | J | jnl |
Int. J. Syst. Sci.
|
| 2019 | — | conf |
TAAI
|
| 2019 | — | conf |
CASE
|
| 2019 | — | conf |
TAAI
|
| 2019 | — | conf |
CASE
|
| 2018 | J | jnl |
J. Frankl. Inst.
|
| 2018 | J | jnl |
Int. J. Syst. Sci.
|
| 2018 | J | jnl |
Int. J. Syst. Sci.
|
| 2017 | J | jnl |
Int. J. Syst. Sci.
|
| 2017 | J | jnl |
Int. J. Syst. Sci.
|
| 2017 | J | jnl |
Int. J. Syst. Sci.
|
| 2017 | J | jnl |
Adv. Data Sci. Adapt. Anal.
|
| 2017 | — | conf |
ISIE
|
| 2017 | J | jnl |
J. Frankl. Inst.
|
| 2017 | J | jnl |
IEEE Trans. Cybern.
|
| 2017 | J | jnl |
Int. J. Syst. Sci.
|
| 2016 | J | jnl |
Expert Syst. Appl.
|
| 2015 | J | jnl |
J. Frankl. Inst.
|
| 2015 | B | conf |
CEC
|
| 2015 | J | jnl |
Expert Syst. Appl.
|
| 2015 | J | jnl |
IEEE Trans. Evol. Comput.
|
| 2015 | J | jnl |
IET Image Process.
|
| 2015 | J | jnl |
IEEE Trans. Evol. Comput.
|
| 2014 | J | jnl |
Signal Process.
|
| 2014 | J | jnl |
J. Frankl. Inst.
|
| 2014 | J | jnl |
Int. J. Bifurc. Chaos
|
| 2014 | — | conf |
IEA/AIE (2)
|
| 2013 | J | jnl |
IMA J. Math. Control. Inf.
|
| 2013 | J | jnl |
J. Electronic Imaging
|
| 2011 | J | jnl |
J. Electronic Imaging
|
| 2011 | J | jnl |
J. Electronic Imaging
|
| 2011 | J | jnl |
J. Electronic Imaging
|
| 2010 | J | jnl |
Int. J. Syst. Sci.
|
| 2010 | J | jnl |
Comput. Math. Appl.
|
| 2010 | — | conf |
PCM (2)
|
| 2009 | C | conf |
IEA/AIE
|
| 2009 | J | jnl |
Pattern Recognit.
|
| 2008 | J | jnl |
Comput. Math. Appl.
|
| 2008 | J | jnl |
Comput. Math. Appl.
|
| 2008 | J | jnl |
J. Frankl. Inst.
|
| 2008 | J | jnl |
J. Electronic Imaging
|
| 2008 | J | jnl |
Signal Process.
|
| 2008 | J | jnl |
IMA J. Math. Control. Inf.
|
| 2007 | J | jnl |
Int. J. Gen. Syst.
|
| 2007 | J | jnl |
J. Electronic Imaging
|
| 2007 | J | jnl |
J. Electronic Imaging
|
| 2007 | J | jnl |
Int. J. Gen. Syst.
|
| 2007 | J | jnl |
IMA J. Math. Control. Inf.
|
| 2007 | J | jnl |
Appl. Math. Comput.
|
| 2007 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2006 | — | conf |
ICICIC (3)
|
| 2006 | J | jnl |
IMA J. Math. Control. Inf.
|
| 2006 | C | conf |
MMSP
|
| 2005 | J | jnl |
Expert Syst. Appl.
|
| 2005 | J | jnl |
IMA J. Math. Control. Inf.
|
| 2005 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part B
|
| 2005 | J | jnl |
Int. J. Bifurc. Chaos
|
| 2004 | — | conf |
ISNN (2)
|
| 2004 | J | jnl |
Int. J. Syst. Sci.
|
| 2004 | J | jnl |
IMA J. Math. Control. Inf.
|
| 2004 | B | conf |
FUZZ-IEEE
|
| 2001 | — | conf |
HICSS
|
| 2001 | J | jnl |
Int. J. Bifurc. Chaos
|
| 2000 | J | jnl |
Int. J. Syst. Sci.
|
| 2000 | J | jnl |
Int. J. Bifurc. Chaos
|