Shu-Kai S. Fan

32 papers Journal 28Unranked 4
YearRankTypeTitle / Venue / Authors
2026 J jnl
A New Deep Reinforcement Learning Run-to-Run Control Algorithm for Mixed-Product Production Mode in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, Tzu-Jung Chen
2026 J jnl
A novel diffusion model-based deep learning approach for anomaly detection in computer connector image analysis.
Eng. Appl. Artif. Intell.
Shu-Kai S. Fan, Li-Chin Lai
2026 J jnl
Integrating large language models into manufacturing execution systems: A systematic framework for photoresist manufacturing processes.
Comput. Ind. Eng.
Shu-Kai S. Fan, Jiun-Tze Wang, Chih-Hung Jen
2025 J jnl
A Novel Rolling-Window and Production-Maintenance-Based Machine Learning Approach to Virtual Metrology in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, An-Ting Zheng
2025 J jnl
A generative-adversarial-network-based temporal raw trace data augmentation framework for fault detection in semiconductor manufacturing.
Eng. Appl. Artif. Intell.
Shu-Kai S. Fan, Wei-Yu Chen
2024 J jnl
Sustainable multi-biofuel production with stochastic lead time and optimum energy utilization under flexible manufacturing.
Comput. Ind. Eng.
Biswajit Sarkar, Shu-Kai S. Fan, Sarla Pareek, Bablu Mridha
2023 — conf
Using the Concept of Generative Adversarial Network (GAN) to Strengthen the Classification Performance for X-ray Images of Small Samples.
ICMHI
Chih-Hung Jen, Shu-Kai S. Fan, Kun-Mu Lu, Ching-Wen Huang, Ju-Ling Hsiao, Yu-Zhi Zheng, Yi-Jun Cai
2022 J jnl
Data-Driven Virtual Metrology and Retraining Systems for Color Filter Processes of TFT-LCD Manufacturing.
IEEE Trans. Instrum. Meas.
Chih-Hung Jen, Shu-Kai S. Fan, Yu-Yu Lin
2022 J jnl
Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, Chun-Wei Cheng, Du-Ming Tsai
2022 J jnl
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Mabel C. Chou, Chih-Hung Jen, Jen-Hsuan Tsou
2022 J jnl
Product-to-Product Virtual Metrology of Color Filter Processes in Panel Industry.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, Xiao-Wen Chang, Yu-Yu Lin
2021 J jnl
A New Double Exponentially Weighted Moving Average Run-to-Run Control Using a Disturbance-Accumulating Strategy for Mixed-Product Mode.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, Chih-Hung Jen, Chia-Yu Hsu, Yu-Ling Liao
2021 J jnl
Auto-Annotated Deep Segmentation for Surface Defect Detection.
IEEE Trans. Instrum. Meas.
Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou
2020 J jnl
Corrigendum to "Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes" [Adv. Eng. Informat. 46 (2020) 101166].
Adv. Eng. Informatics
Shu-Kai S. Fan, Chia-Yu Hsu, Chih-Hung Jen, Kuan-Lung Chen, Li-Ting Juan
2020 J jnl
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng.
Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fei He, Chun-Chung Cheng
2020 J jnl
Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes.
Adv. Eng. Informatics
Shu-Kai S. Fan, Chia-Yu Hsu, Chih-Hung Jen, Kuan-Lung Chen, Li-Ting Juan
2018 J jnl
Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection.
Soft Comput.
Shu-Kai S. Fan, Chuan-Jun Su, Han-Tang Nien, Pei-Fang Tsai, Chen-Yang Cheng
2014 J jnl
Applying HBMO-based SOM in Predicting the Taiwan Steel Price Fluctuation.
Int. J. Electron. Bus. Manag.
Chui-Yu Chiu, Shu-Kai S. Fan, Po-Chou Shih, Yi-Hsin Weng
2013 — conf
An Entropy-based Method for Color Image Registration.
VISAPP (1)
Shu-Kai S. Fan, Yu-Chiang Chuang
2013 J jnl
Nonlinear Profile Monitoring of Reflow Process Data Based on the Sum of Sine Functions.
Qual. Reliab. Eng. Int.
Shu-Kai S. Fan, Yuan-Jung Chang, Nafy Aidara
2013 J jnl
Robust Multivariate Control Chart for Outlier Detection Using Hierarchical Cluster Tree in SW2.
Qual. Reliab. Eng. Int.
Shu-Kai S. Fan, Hui-Kuo Huang, Yuan-Jung Chang
2012 J jnl
An entropy-based image registration method using image intensity difference on overlapped region.
Mach. Vis. Appl.
Shu-Kai S. Fan, Yu-Chiang Chuang
2010 — conf
A New Image Registration Method Using Intensity Difference Data on Overlapped Image.
UIC/ATC Workshops
Shu-Kai S. Fan, Yu-Chiang Chuang
2010 J jnl
Automatic detection of Mura defect in TFT-LCD based on regression diagnostics.
Pattern Recognit. Lett.
Shu-Kai S. Fan, Yu-Chiang Chuang
2009 J jnl
A fast estimation method for the generalized Gaussian mixture distribution on complex images.
Comput. Vis. Image Underst.
Shu-Kai S. Fan, Yen Lin
2008 J jnl
Image thresholding using a novel estimation method in generalized Gaussian distribution mixture modeling.
Neurocomputing
Shu-Kai S. Fan, Yen Lin, Chia-Chan Wu
2007 — conf
A Modified Particle Swarm Optimizer Using an Adaptive Dynamic Weight Scheme.
HCI (12)
Shu-Kai S. Fan, Ju-Ming Chang
2007 J jnl
A hybrid simplex search and particle swarm optimization for unconstrained optimization.
Eur. J. Oper. Res.
Shu-Kai S. Fan, Erwie Zahara
2007 J jnl
A multi-level thresholding approach using a hybrid optimal estimation algorithm.
Pattern Recognit. Lett.
Shu-Kai S. Fan, Yen Lin
2007 J jnl
Multiple-input dual-output adjustment scheme for semiconductor manufacturing processes using a dynamic dual-response approach.
Eur. J. Oper. Res.
Shu-Kai S. Fan, Yen Lin
2006 J jnl
A genetic algorithm and a particle swarm optimizer hybridized with Nelder-Mead simplex search.
Comput. Ind. Eng.
Shu-Kai S. Fan, Yun-Chia Liang, Erwie Zahara
2005 J jnl
Optimal multi-thresholding using a hybrid optimization approach.
Pattern Recognit. Lett.
Erwie Zahara, Shu-Kai S. Fan, Du-Ming Tsai